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    • 1. 发明申请
    • Methods for Nanostructure Doping
    • 纳米结构掺杂方法
    • US20100167512A1
    • 2010-07-01
    • US12720125
    • 2010-03-09
    • Yaoling PanJian ChenFrancisco LeonShahriar MostarshedLinda T. RomanoVijendra SahiDavid P. Stumbo
    • Yaoling PanJian ChenFrancisco LeonShahriar MostarshedLinda T. RomanoVijendra SahiDavid P. Stumbo
    • H01L21/22
    • H01L29/0665B81C1/00698B81C2201/0173B82Y10/00H01L21/2256H01L21/268H01L29/0673
    • Methods of doping nanostructures, such as nanowires, are disclosed. The methods provide a variety of approaches for improving existing methods of doping nanostructures. The embodiments include the use of a sacrificial layer to promote uniform dopant distribution within a nanostructure during post-nanostructure synthesis doping. In another embodiment, a high temperature environment is used to anneal nanostructure damage when high energy ion implantation is used. In another embodiment rapid thermal annealing is used to drive dopants from a dopant layer on a nanostructure into the nanostructure. In another embodiment a method for doping nanowires on a plastic substrate is provided that includes depositing a dielectric stack on a plastic substrate to protect the plastic substrate from damage during the doping process. An embodiment is also provided that includes selectively using high concentrations of dopant materials at various times in synthesizing nanostructures to realize novel crystallographic structures within the resulting nanostructure.
    • 公开了掺杂纳米结构的方法,例如纳米线。 该方法提供了改进现有掺杂纳米结构方法的各种方法。 这些实施方案包括在后纳米结构合成掺杂期间使用牺牲层来促进纳米结构内的均匀掺杂剂分布。 在另一个实施例中,当使用高能离子注入时,使用高温环境退火纳米结构损伤。 在另一个实施方案中,使用快速热退火来将掺杂剂从纳米结构上的掺杂剂层驱动到纳米结构中。 在另一个实施例中,提供了一种在塑料衬底上掺杂纳米线的方法,其包括在塑料衬底上沉积电介质叠层以保护塑料衬底免于在掺杂过程期间损坏。 还提供了一种实施方案,其包括在合成纳米结构中在不同时间选择性地使用高浓度的掺杂剂材料以在所得纳米结构内实现新的晶体结构。
    • 5. 发明授权
    • Gate configuration for nanowire electronic devices
    • 纳米线电子器件的栅极配置
    • US07473943B2
    • 2009-01-06
    • US11233398
    • 2005-09-22
    • Shahriar MostarshedJian ChenFrancisco LeonYaoling PanLinda T. Romano
    • Shahriar MostarshedJian ChenFrancisco LeonYaoling PanLinda T. Romano
    • H01L29/80
    • H01L29/0665B82Y10/00H01L29/0673H01L29/42384H01L29/42392H01L29/775H01L29/785H01L29/78645H01L29/78681H01L29/7869Y10S977/762Y10S977/932Y10S977/938
    • Methods, systems, and apparatuses for electronic devices having improved gate structures are described. An electronic device includes at least one nanowire. A gate contact is positioned along at least a portion of a length of the at least one nanowire. A dielectric material layer is between the gate contact and the at least one nanowire. A source contact and a drain contact are in contact with the at least one nanowire. At least a portion of the source contact and/or the drain contact overlaps with the gate contact along the nanowire the length. In another aspect, an electronic device includes a nanowire having a semiconductor core surrounded by an insulating shell layer. A ring shaped first gate region surrounds the nanowire along a portion of the length of the nanowire. A second gate region is positioned along the length of the nanowire between the nanowire and the substrate. A source contact and a drain contact are coupled to the semiconductor core of the nanowire at respective exposed portions of the semiconductor core.
    • 描述了具有改进的门结构的电子设备的方法,系统和装置。 电子装置包括至少一个纳米线。 栅极接触沿至少一个纳米线的长度的至少一部分定位。 介电材料层在栅极接触和至少一个纳米线之间。 源极触点和漏极触点与至少一个纳米线接触。 源极触点和/或漏极触点的至少一部分沿着该纳米线的长度与栅极触点重叠。 另一方面,一种电子器件包括具有被绝缘壳层包围的半导体芯的纳米线。 环形第一栅极区域沿着纳米线长度的一部分包围纳米线。 第二栅极区沿着纳米线和衬底之间的纳米线的长度定位。 源极触点和漏极触点在半导体芯的相应的暴露部分处耦合到纳米线的半导体芯。