会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Semiconductor buried grating fabrication method
    • 半导体埋光栅制作方法
    • US07981591B2
    • 2011-07-19
    • US12079524
    • 2008-03-27
    • Yabo LiKechang SongNicholas John VisovskyChung-En Zah
    • Yabo LiKechang SongNicholas John VisovskyChung-En Zah
    • G03F7/26
    • G03F7/0005G02B6/124G02B6/136H01S5/12
    • Methods for forming grating profiles in semiconductor laser structures comprise the steps of providing a semiconductor wafer comprising a wafer substrate, an etch stop layer disposed over the wafer substrate, a grating layer disposed over the etch stop layer, an etch mask layer disposed over the grating layer, and a photoresist layer disposed over the etch mask layer, forming a photoresist grating pattern, transferring the photoresist grating pattern into the grating layers via dry etching, and removing the photoresist layer, selectively wet etching the grating layer to form the grating profile in the grating layer. The placement of the grating layer between the etch mask and etch stop layers controls the selective wet etching step. The method also comprises removing the etch mask layer via selective wet etching without altering the grating profile, and regrowing an upper cladding layer to produce the semiconductor laser structure.
    • 在半导体激光器结构中形成光栅轮廓的方法包括以下步骤:提供包括晶片衬底的半导体晶片,设置在晶片衬底上的蚀刻停止层,设置在蚀刻停止层上方的光栅层,设置在光栅上的蚀刻掩模层 层和设置在蚀刻掩模层上的光致抗蚀剂层,形成光致抗蚀剂光栅图案,通过干蚀刻将光致抗蚀剂光栅图案转移到光栅层中,以及去除光致抗蚀剂层,选择性地湿蚀刻光栅层以形成光栅轮廓 光栅层。 在蚀刻掩模和蚀刻停止层之间放置光栅层控制选择性湿蚀刻步骤。 该方法还包括通过选择性湿蚀刻去除蚀刻掩模层而不改变光栅轮廓,并且重新生长上覆层以产生半导体激光器结构。
    • 2. 发明申请
    • Semiconductor buried grating fabrication method
    • 半导体埋光栅制作方法
    • US20090246707A1
    • 2009-10-01
    • US12079524
    • 2008-03-27
    • Yabo LiKechang SongNicholas John VisovskyChung-En Zah
    • Yabo LiKechang SongNicholas John VisovskyChung-En Zah
    • G03F7/00
    • G03F7/0005G02B6/124G02B6/136H01S5/12
    • Methods for forming grating profiles in semiconductor laser structures comprise the steps of providing a semiconductor wafer comprising a wafer substrate, an etch stop layer disposed over the wafer substrate, a grating layer disposed over the etch stop layer, an etch mask layer disposed over the grating layer, and a photoresist layer disposed over the etch mask layer, forming a photoresist grating pattern, transferring the photoresist grating pattern into the grating layers via dry etching, and removing the photoresist layer, selectively wet etching the grating layer to form the grating profile in the grating layer. The placement of the grating layer between the etch mask and etch stop layers controls the selective wet etching step. The method also comprises removing the etch mask layer via selective wet etching without altering the grating profile, and regrowing an upper cladding layer to produce the semiconductor laser structure.
    • 在半导体激光器结构中形成光栅轮廓的方法包括以下步骤:提供包括晶片衬底的半导体晶片,设置在晶片衬底上的蚀刻停止层,设置在蚀刻停止层上方的光栅层,设置在光栅上的蚀刻掩模层 层和设置在蚀刻掩模层上的光致抗蚀剂层,形成光致抗蚀剂光栅图案,通过干蚀刻将光致抗蚀剂光栅图案转移到光栅层中,以及去除光致抗蚀剂层,选择性地湿蚀刻光栅层以形成光栅轮廓 光栅层。 在蚀刻掩模和蚀刻停止层之间放置光栅层控制选择性湿蚀刻步骤。 该方法还包括通过选择性湿蚀刻去除蚀刻掩模层而不改变光栅轮廓,并且重新生长上覆层以产生半导体激光器结构。
    • 3. 发明授权
    • Quantum well intermixing
    • 量子井混合
    • US07723139B2
    • 2010-05-25
    • US11906247
    • 2007-10-01
    • Yabo LiKechang SongChung-En Zah
    • Yabo LiKechang SongChung-En Zah
    • H01L21/00
    • H01S5/34B82Y20/00H01L21/02546H01L21/02664H01L29/205H01S5/3414
    • Embodiments of a method of quantum well intermixing (QWI) comprise providing a wafer comprising upper and lower epitaxial layers, which each include barrier layers, and a quantum well layer disposed between the upper and lower epitaxial layers, applying at least one sacrificial layer over the upper epitaxial layer, and forming a QWI enhanced region and a QWI suppressed region by applying a QWI enhancing layer over a portion of the sacrificial layer, wherein the portion under the QWI enhancing layer is the QWI enhanced region, and the other portion is the QWI suppressed region. The method further comprises the steps of applying a QWI suppressing layer over the QWI enhanced region and the QWI suppressed region, and annealing at a temperature sufficient to cause interdiffusion of atoms between the quantum well layer and the barrier layers of the upper epitaxial layer and the lower epitaxial layer.
    • 量子阱混合(QWI)的方法的实施例包括提供包括上和下外延层的晶片,每个外延层各自包括势垒层,以及设置在上外延层和下外延层之间的量子阱层,在该外延层上施加至少一个牺牲层 并且通过在牺牲层的一部分上施加QWI增强层来形成QWI增强区域和QWI抑制区域,其中QWI增强层下面的部分是QWI增强区域,而另一部分是QWI增强区域 抑制区域。 该方法还包括以下步骤:在QWI增强区域和QWI抑制区域上施加QWI抑制层,并且在足以引起量子阱层与上部外延层的势垒层之间的原子相互扩散的温度下退火, 较低的外延层。
    • 4. 发明申请
    • Quantum well intermixing
    • 量子井混合
    • US20090086784A1
    • 2009-04-02
    • US11906247
    • 2007-10-01
    • Yabo LiKechang SongChung-En Zah
    • Yabo LiKechang SongChung-En Zah
    • H01S5/125H01L21/225
    • H01S5/34B82Y20/00H01L21/02546H01L21/02664H01L29/205H01S5/3414
    • Embodiments of a method of quantum well intermixing (QWI) comprise providing a wafer comprising upper and lower epitaxial layers, which each include barrier layers, and a quantum well layer disposed between the upper and lower epitaxial layers, applying at least one sacrificial layer over the upper epitaxial layer, and forming a QWI enhanced region and a QWI suppressed region by applying a QWI enhancing layer over a portion of the sacrificial layer, wherein the portion under the QWI enhancing layer is the QWI enhanced region, and the other portion is the QWI suppressed region. The method further comprises the steps of applying a QWI suppressing layer over the QWI enhanced region and the QWI suppressed region, and annealing at a temperature sufficient to cause interdiffusion of atoms between the quantum well layer and the barrier layers of the upper epitaxial layer and the lower epitaxial layer.
    • 量子阱混合(QWI)的方法的实施例包括提供包括上和下外延层的晶片,每个外延层各自包括势垒层,以及设置在上外延层和下外延层之间的量子阱层,在该外延层上施加至少一个牺牲层 并且通过在牺牲层的一部分上施加QWI增强层来形成QWI增强区域和QWI抑制区域,其中QWI增强层下面的部分是QWI增强区域,而另一部分是QWI增强区域 抑制区域。 该方法还包括以下步骤:在QWI增强区域和QWI抑制区域上施加QWI抑制层,并且在足以引起量子阱层与上部外延层的势垒层之间的原子相互扩散的温度下退火, 较低的外延层。
    • 6. 发明授权
    • Laser diodes comprising QWI output window and waveguide areas and methods of manufacture
    • 包括QWI输出窗口和波导区域的激光二极管以及制造方法
    • US08198112B2
    • 2012-06-12
    • US12760092
    • 2010-04-14
    • Chwan-Yang ChangChien-Chih ChenMartin Hai HuHong Ky NguyenChung-En Zah
    • Chwan-Yang ChangChien-Chih ChenMartin Hai HuHong Ky NguyenChung-En Zah
    • H01L21/00H01L31/0256
    • B82Y20/00H01S5/0092H01S5/06256H01S5/162H01S2302/00
    • In accordance with one embodiment of the present disclosure, a process of manufacturing a semiconductor laser diode comprising a gain section, a QWI output window, and QWI waveguide areas is provided. The QWI waveguide areas are fabricated using quantum well intermixing and define a QWI waveguide portion in the QWI output window of the laser diode. The QWI output window is transparent to the lasing wavelength λL. The QWI waveguide portion in the QWI output window is characterized by an energy bandgap that is larger than an energy bandgap of the gain section such that the band gap wavelength λQWI in the QWI waveguide portion and the QWI output window is shorter than the lasing wavelength λL. The QWI output window is characterized by a photoluminescent wavelength λPL. The manufacturing process comprises a λPL screening protocol that determines laser diode reliability based on a comparison of the lasing wavelength λL and the photoluminescent wavelength λPL of the QWI output window. Additional embodiments are disclosed and claimed.
    • 根据本公开的一个实施例,提供了制造包括增益部分,QWI输出窗口和QWI波导区域的半导体激光二极管的工艺。 使用量子阱混合制造QWI波导区域,并在激光二极管的QWI输出窗口中定义QWI波导部分。 QWI输出窗口对于激光波长λL是透明的。 QWI输出窗口中的QWI波导部分的特征在于能量带隙大于增益部分的能带隙,使得QWI波导部分和QWI输出窗口中的带隙波长λQWI比激光波长λL短 。 QWI输出窗口的特征在于光致发光波长λPL。 该制造工艺包括λPL筛选方案,其基于激光波长λL和QWI输出窗口的光致发光波长λPL的比较来确定激光二极管的可靠性。 公开并要求保护附加实施例。
    • 7. 发明申请
    • Laser Diodes Comprising QWI Output Window and Waveguide Areas and Methods of Manufacture
    • 包括QWI输出窗口和波导区域的激光二极管和制造方法
    • US20110255567A1
    • 2011-10-20
    • US12760092
    • 2010-04-14
    • Chwan-Yang ChangChien-Chih ChenMartin Hai HuHong Ky NguyenChung-En Zah
    • Chwan-Yang ChangChien-Chih ChenMartin Hai HuHong Ky NguyenChung-En Zah
    • H01S5/34H01L21/66H01L21/02
    • B82Y20/00H01S5/0092H01S5/06256H01S5/162H01S2302/00
    • In accordance with one embodiment of the present disclosure, a process of manufacturing a semiconductor laser diode comprising a gain section, a QWI output window, and QWI waveguide areas is provided. The QWI waveguide areas are fabricated using quantum well intermixing and define a QWI waveguide portion in the QWI output window of the laser diode. The QWI output window is transparent to the lasing wavelength λL. The QWI waveguide portion in the QWI output window is characterized by an energy bandgap that is larger than an energy bandgap of the gain section such that the band gap wavelength λQWI in the QWI waveguide portion and the QWI output window is shorter than the lasing wavelength λL. The QWI output window is characterized by a photoluminescent wavelength λPL. The manufacturing process comprises a λPL screening protocol that determines laser diode reliability based on a comparison of the lasing wavelength λL and the photoluminescent wavelength λPL of the QWI output window. Additional embodiments are disclosed and claimed.
    • 根据本公开的一个实施例,提供了制造包括增益部分,QWI输出窗口和QWI波导区域的半导体激光二极管的工艺。 使用量子阱混合制造QWI波导区域,并在激光二极管的QWI输出窗口中定义QWI波导部分。 QWI输出窗口对于激光波长λL是透明的。 QWI输出窗口中的QWI波导部分的特征在于能量带隙大于增益部分的能带隙,使得QWI波导部分和QWI输出窗口中的带隙波长λQWI比激光波长λL短 。 QWI输出窗口的特征在于光致发光波长λPL。 该制造工艺包括λPL筛选方案,其基于激光波长λL和QWI输出窗口的光致发光波长λPL的比较来确定激光二极管的可靠性。 公开并要求保护附加实施例。
    • 10. 发明授权
    • Thermal compensation in semiconductor lasers
    • 半导体激光器的热补偿
    • US07480317B2
    • 2009-01-20
    • US11526988
    • 2006-09-26
    • Martin Hai HuDaniel Ohen RickettsChung-En Zah
    • Martin Hai HuDaniel Ohen RickettsChung-En Zah
    • H01S3/10H01S3/04
    • H01S5/06804H01S5/0612H01S5/06256
    • The present invention relates to relates generally to semiconductor lasers and, more particularly, to schemes for measuring and controlling the temperature of semiconductor lasers and schemes for wavelength stabilization of semiconductor lasers. According to one embodiment of the present invention, a method of driving a temperature control mechanism in a semiconductor laser is provided. According to the method, signals representing an operating temperature of the semiconductor laser and ambient temperature are generated and a target laser operating temperature that is a function of the ambient temperature signal is established. A temperature control mechanism of the semiconductor laser is then driven to increase a degree of correlation between the operating temperature signal and the target laser operating temperature. Additional embodiments are disclosed and claimed.
    • 本发明一般涉及半导体激光器,更具体地,涉及用于测量和控制半导体激光器的温度和半导体激光器的波长稳定化方案的方案。 根据本发明的一个实施例,提供了一种驱动半导体激光器中的温度控制机构的方法。 根据该方法,产生表示半导体激光器的工作温度和环境温度的信号,建立作为环境温度信号的函数的目标激光器工作温度。 然后驱动半导体激光器的温度控制机构以增加工作温度信号和目标激光器工作温度之间的相关程度。 公开并要求保护附加实施例。