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    • 4. 发明授权
    • Memory card and memory storage device using the same
    • 存储卡和存储设备使用相同
    • US08055844B2
    • 2011-11-08
    • US12314320
    • 2008-12-08
    • Won-Seok LeeJong-Keun Ahn
    • Won-Seok LeeJong-Keun Ahn
    • G06F12/00
    • G06F13/387G06F12/06Y02D10/13Y02D10/14Y02D10/151
    • A memory card and a memory storage device using the memory card may be provided. The memory card may include a host connector, a memory controller connected to the host connector and enabled or disabled in response to a capacity expansion signal, a non-volatile memory connected to the memory controller, a memory connector configured to connect to the memory controller and the non-volatile memory, and a capacity expansion switch configured to generate the capacity expansion signal. Accordingly, when the memory cards are connected to increase storage capacity, only a memory controller of one memory card may operate, thereby reducing power consumption.
    • 可以提供使用存储卡的存储卡和存储器存储装置。 存储卡可以包括主机连接器,连接到主机连接器并且响应于容量扩展信号而被启用或禁用的存储器控​​制器,连接到存储器控制器的非易失性存储器,被配置为连接到存储器控制器的存储器连接器 和非易失性存储器,以及容量扩展开关,其被配置为生成容量扩展信号。 因此,当存储卡被连接以增加存储容量时,只有一个存储卡的存储器控​​制器可以操作,从而降低功耗。
    • 6. 发明授权
    • Semiconductor memory device and data error detection and correction method of the same
    • 半导体存储器件和数据错误检测与校正方法相同
    • US08190968B2
    • 2012-05-29
    • US13099640
    • 2011-05-03
    • Kwang-Jin LeeWon-Seok LeeDu-Eung Kim
    • Kwang-Jin LeeWon-Seok LeeDu-Eung Kim
    • H03M13/00
    • G06F11/1008G06F11/1076G11C8/04G11C8/12
    • A semiconductor memory device includes a memory cell array, a mode setting circuit, a parity data generation unit, and a data error detection and correction unit. The memory cell array has a plurality of first memory banks for storing normal data, and a predetermined number of second memory banks less than the number of the first memory banks for storing parity data according to control of a first flag signal. The mode setting circuit sets the first flag signal and a second flag signal controlling based on whether a separate memory bank is used to store the parity data in the second memory banks. The parity data generation unit receives normal write data during a write operation, generates parity data with respect to the normal write data in response to the second flag signal, and outputs the normal data and the parity data. The data error detection and correction unit receives normal read data and parity read data read from the memory cell array during a read operation, detects errors of the normal read data in response to the second flag signal, corrects the normal read data when the errors are detected, and outputs the corrected read data.
    • 半导体存储器件包括存储单元阵列,模式设置电路,奇偶校验数据生成单元和数据错误检测和校正单元。 存储单元阵列具有用于存储正常数据的多个第一存储体和小于根据第一标志信号的控制存储奇偶校验数据的第一存储体的数量的预定数量的第二存储体。 模式设置电路基于是否使用单独的存储体来存储第二存储体中的奇偶校验数据来设置第一标志信号和第二标志信号。 奇偶校验数据生成单元在写入操作期间接收正常写入数据,响应于第二标志信号生成相对于正常写入数据的奇偶校验数据,并输出正常数据和奇偶校验数据。 数据错误检测和校正单元在读取操作期间接收从存储单元阵列读取的正常读取数据和奇偶校验读取数据,响应于第二标志信号检测正常读取数据的错误,当错误为 检测并输出校正的读取数据。
    • 8. 发明授权
    • Semiconductor memory device and data error detection and correction method of the same
    • 半导体存储器件和数据错误检测与校正方法相同
    • US07949928B2
    • 2011-05-24
    • US11773214
    • 2007-07-03
    • Kwang-Jin LeeWon-Seok LeeDu-Eung Kim
    • Kwang-Jin LeeWon-Seok LeeDu-Eung Kim
    • G11C29/00
    • G06F11/1008G06F11/1076G11C8/04G11C8/12
    • A semiconductor memory device includes a memory cell array, a mode setting circuit, a parity data generation unit, and a data error detection and correction unit. The memory cell array has a plurality of first memory banks for storing normal data, and a predetermined number of second memory banks less than the number of the first memory banks for storing parity data according to control of a first flag signal. The mode setting circuit sets the first flag signal and a second flag signal controlling based on whether a separate memory bank is used to store the parity data in the second memory banks. The parity data generation unit receives normal write data during a write operation, generates parity data with respect to the normal write data in response to the second flag signal, and outputs the normal data and the parity data. The data error detection and correction unit receives normal read data and parity read data read from the memory cell array during a read operation, detects errors of the normal read data in response to the second flag signal, corrects the normal read data when the errors are detected, and outputs the corrected read data.
    • 半导体存储器件包括存储单元阵列,模式设置电路,奇偶校验数据生成单元和数据错误检测和校正单元。 存储单元阵列具有用于存储正常数据的多个第一存储体和小于根据第一标志信号的控制存储奇偶校验数据的第一存储体的数量的预定数量的第二存储体。 模式设置电路基于是否使用单独的存储体来存储第二存储体中的奇偶校验数据来设置第一标志信号和第二标志信号。 奇偶校验数据生成单元在写入操作期间接收正常写入数据,响应于第二标志信号生成相对于正常写入数据的奇偶校验数据,并输出正常数据和奇偶校验数据。 数据错误检测和校正单元在读取操作期间接收从存储单元阵列读取的正常读取数据和奇偶校验读取数据,响应于第二标志信号检测正常读取数据的错误,当错误为 检测并输出校正的读取数据。
    • 9. 发明授权
    • Input circuit of a non-volatile semiconductor memory device
    • 非易失性半导体存储器件的输入电路
    • US07710791B2
    • 2010-05-04
    • US11984145
    • 2007-11-14
    • Kwang-jin LeeWon-Seok LeeQi WangHye-Jin KimJoon Yong Choi
    • Kwang-jin LeeWon-Seok LeeQi WangHye-Jin KimJoon Yong Choi
    • G11C7/10G11C8/06G11C7/22G11C8/18
    • G11C7/1078G11C7/1084G11C7/225G11C16/10
    • A non-volatile semiconductor memory device may include a memory cell array that may include a plurality of memory transistors; a input circuit that may control a voltage level of an internal reference voltage and a delay time of an internal clock signal in response to an MRS trim code or an electric fuse trim code, and that may generate a first buffered input signal; a column gate that may gate the first buffered input signal in response to a decoded column address signal; and a sense amplifier that may amplify an output signal of the memory cell array to output to the column gate, and that may receive an output signal of the column gate to output to the memory cell array. The non-volatile semiconductor memory device may properly buffer an input signal of a small swing range.
    • 非易失性半导体存储器件可以包括可以包括多个存储晶体管的存储单元阵列; 输入电路,其可以响应于MRS修剪代码或电熔丝修剪代码来控制内部参考电压的电压电平和内部时钟信号的延迟时间,并且可以产生第一缓冲输入信号; 列门,其可以响应于解码列地址信号而选通第一缓冲输入信号; 以及读出放大器,其可以放大存储单元阵列的输出信号以输出到列门,并且可以接收列门的输出信号以输出到存储器单元阵列。 非易失性半导体存储器件可以适当地缓冲小摆动范围的输入信号。