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    • 1. 发明授权
    • CMOS output driver for semiconductor device and related method for improving latch-up immunity in a CMOS output driver
    • 用于半导体器件的CMOS输出驱动器和用于提高CMOS输出驱动器中的闭锁抑制的相关方法
    • US06624660B2
    • 2003-09-23
    • US10010820
    • 2001-12-06
    • Wen LiMichael D. ChaineManny Kin Ma
    • Wen LiMichael D. ChaineManny Kin Ma
    • H03K19094
    • H03K19/00315
    • An output driver circuit for a semiconductor device. In one embodiment, the output driver is coupled to an output terminal of the semiconductor device and consists of an N-channel pull-down transistor and a P-channel pull-up transistor formed in an N-well in a P-type substrate. A tie-down region formed in the N-well is selectively coupled to a supply potential by means of a decoupling transistor, and during normal operation of the driver maintains the supply voltage bias of the N-well. An overdrive detection circuit is coupled to the output terminal. Upon detection of an overdrive condition on the output terminal, such as a voltage exceeding a predetermined maximum, or excessive current injected into the output terminal (or both), the overdrive detection circuit deasserts a control signal applied to the gate of the decoupling transistor, thereby decoupling the N-well from the supply potential. In one embodiment, the decoupling transistor is not coupled to the output terminal.
    • 一种用于半导体器件的输出驱动器电路。 在一个实施例中,输出驱动器耦合到半导体器件的输出端子,并且由形成在P型衬底中的N阱中的N沟道下拉晶体管和P沟道上拉晶体管组成。 形成在N阱中的结合区域通过去耦晶体管选择性地耦合到电源电位,并且在驱动器的正常操作期间维持N阱的电源电压偏置。 过驱动检测电路耦合到输出端子。 在检测出输出端子上的过驱动条件(例如超过预定最大值的电压)或注入输出端子(或两者)的过电流时,过驱动检测电路解除施加到去耦晶体管的栅极的控制信号, 从而将N阱与电源电位分离。 在一个实施例中,去耦晶体管不耦合到输出端。
    • 9. 发明授权
    • Method and apparatus for inspecting defects of semiconductor device
    • 用于检查半导体器件缺陷的方法和装置
    • US08385627B2
    • 2013-02-26
    • US11500979
    • 2006-08-09
    • Tadanobu TobaShuji KikuchiYuichi SakuraiWen Li
    • Tadanobu TobaShuji KikuchiYuichi SakuraiWen Li
    • G06K9/00G06K7/10G01B5/28G06F11/30H04N3/14G01N21/00
    • G06T7/0004G06T2207/30148
    • When an inspection apparatus of a semiconductor device repeatedly executes computation of prescribed area data, such as image processing for detecting defects, procedures for commanding, data load, computation, and data store need to be repeated the number of times of the computation. This may impose a limitation on the speeding up of the operation. In addition, when performing parallel computation by a high-capacity image processing system for handling minute images, a lot of processors are needed, resulting in an increase in cost. In order to solve the above-mentioned problems, in the invention, an inspection apparatus of a semiconductor device includes a data memory including an access section which is capable of reading and writing simultaneously, a plurality of numerical computation units, a connector for connecting the data memory and the numerical computation units, a controller for collectively controlling the contents of processing by the plurality of numerical computation units, another connector for connecting the numerical computation units and the controller, and a data transfer controller for controlling data transfer between the numerical computation units.
    • 当半导体装置的检查装置重复执行规定区域数据的计算时,例如用于检测缺陷的图像处理,命令,数据加载,计算和数据存储的过程需要重复计算次数。 这可能对操作的加速施加限制。 此外,当通过大容量图像处理系统执行并行计算以处理微小图像时,需要许多处理器,导致成本增加。 为了解决上述问题,在本发明中,半导体装置的检查装置包括数据存储器,该数据存储器包括能够同时读写的访问部分,多个数值计算单元,连接器 数据存储器和数值计算单元,用于共同控制多个数值计算单元的处理内容的控制器,用于连接数值计算单元和控制器的另一连接器,以及用于控制数值计算之间的数据传送的数据传输控制器 单位。