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    • 5. 发明授权
    • System and method for forming a bipolar switching PCMO film
    • 用于形成双极开关PCMO膜的系统和方法
    • US07235407B2
    • 2007-06-26
    • US10855942
    • 2004-05-27
    • Tingkai LiLawrence J. CharneskiWei-Wei ZhuangDavid R. EvansSheng Teng Hsu
    • Tingkai LiLawrence J. CharneskiWei-Wei ZhuangDavid R. EvansSheng Teng Hsu
    • H01L21/00
    • H01L45/04H01L45/1233H01L45/147H01L45/1616
    • A multi-layer PrxCa1-xMnO3 (PCMO) thin film capacitor and associated deposition method are provided for forming a bipolar switching thin film. The method comprises: forming a bottom electrode; depositing a nanocrystalline PCMO layer; depositing a polycrystalline PCMO layer; forming a multi-layer PCMO film with bipolar switching properties; and, forming top electrode overlying the PCMO film. If the polycrystalline layers are deposited overlying the nanocrystalline layers, a high resistance can be written with narrow pulse width, negative voltage pulses. The PCMO film can be reset to a low resistance using a narrow pulse width, positive amplitude pulse. Likewise, if the nanocrystalline layers are deposited overlying the polycrystalline layers, a high resistance can be written with narrow pulse width, positive voltage pulses, and reset to a low resistance using a narrow pulse width, negative amplitude pulse.
    • 提供了多层Pr 1 x 1 x x MnO 3(PCMO)薄膜电容器和相关的沉积方法,用于形成双极开关 薄膜。 该方法包括:形成底部电极; 沉积纳米晶体PCMO层; 沉积多晶的PCMO层; 形成具有双极开关特性的多层PCMO膜; 并且形成覆盖PCMO膜的顶部电极。 如果多晶层沉积在纳米晶层之上,则可以用窄脉冲宽度,负电压脉冲写入高电阻。 PCMO膜可以使用窄脉冲宽度,正幅度脉冲复位为低电阻。 同样,如果纳米晶层沉积在多晶层上,则可以用窄脉冲宽度,正电压脉冲写入高电阻,并使用窄脉冲宽度,负幅度脉冲将其复位为低电阻。
    • 6. 发明授权
    • Copper metal precursor
    • 铜金属前体
    • US06764537B2
    • 2004-07-20
    • US10453829
    • 2003-06-02
    • Wei-Wei ZhuangLawrence J. CharneskiDavid R. EvansSheng Teng Hsu
    • Wei-Wei ZhuangLawrence J. CharneskiDavid R. EvansSheng Teng Hsu
    • C23C1618
    • H01L21/28556C23C16/18
    • A method for chemical vapor deposition of copper metal thin film on a substrate includes heating a substrate onto which the copper metal thin film is to be deposited in a chemical vapor deposition chamber; vaporizing a precursor containing the copper metal, wherein the precursor is a compound of (&agr;-methylstyrene)Cu(I)(hfac), where hfac is hexafluoroacetylacetonate, and (hfac)Cu(I)L, where L is an alkene; introducing the vaporized precursor into the chemical vapor deposition chamber adjacent the heated substrate; and condensing the vaporized precursor onto the substrate thereby depositing copper metal onto the substrate. A copper metal precursor for use in the chemical vapor deposition of a copper metal thin film is a compound of (&agr;-methylstyrene)Cu(I)(hfac), where hfac is hexafluoroacetylacetonate, and (hfac)Cu(I)L, where L is an alkene taken from the group of alkenes consisting of 1-pentene, 1-hexene and trimethylvinylsilane.
    • 铜基金属薄膜在基板上进行化学气相沉积的方法包括在化学气相沉积室中加热要沉积铜金属薄膜的基板; 蒸发含有铜金属的前体,其中前体是(α-甲基苯乙烯)Cu(I)(hfac)的化合物,其中hfac是六氟乙酰丙酮化物,和(hfac)Cu(I)L,其中L是烯烃; 将蒸发的前体引入与加热的基底相邻的化学气相沉积室; 并将蒸发的前体冷凝到基底上,从而将铜金属沉积到基底上。 用于铜金属薄膜的化学气相沉积的铜金属前体是(α-甲基苯乙烯)Cu(I)(hfac)的化合物,其中hfac是六氟乙酰丙酮化物,和(hfac)Cu(I)L,其中 L是从由1-戊烯,1-己烯和三甲基乙烯基硅烷组成的烯烃族中获得的烯烃。
    • 7. 发明授权
    • Bipolar switching PCMO capacitor
    • 双极开关PCMO电容
    • US07696550B2
    • 2010-04-13
    • US11805177
    • 2007-05-22
    • Tingkai LiLawrence J. CharneskiWei-Wei ZhuangDavid R. EvansSheng Teng Hsu
    • Tingkai LiLawrence J. CharneskiWei-Wei ZhuangDavid R. EvansSheng Teng Hsu
    • H01L29/76
    • H01L45/04H01L45/1233H01L45/147H01L45/1616
    • A multi-layer PrxCa1-xMnO3 (PCMO) thin film capacitor and associated deposition method are provided for forming a bipolar switching thin film. The method comprises: forming a bottom electrode; depositing a nanocrystalline PCMO layer; depositing a polycrystalline PCMO layer; forming a multi-layer PCMO film with bipolar switching properties; and, forming top electrode overlying the PCMO film. If the polycrystalline layers are deposited overlying the nanocrystalline layers, a high resistance can be written with narrow pulse width, negative voltage pulses. The PCMO film can be reset to a low resistance using a narrow pulse width, positive amplitude pulse. Likewise, if the nanocrystalline layers are deposited overlying the polycrystalline layers, a high resistance can be written with narrow pulse width, positive voltage pulses, and reset to a low resistance using a narrow pulse width, negative amplitude pulse.
    • 提供多层PrxCa1-xMnO3(PCMO)薄膜电容器和相关的沉积方法用于形成双极开关薄膜。 该方法包括:形成底部电极; 沉积纳米晶体PCMO层; 沉积多晶PCMO层; 形成具有双极开关特性的多层PCMO膜; 并且形成覆盖PCMO膜的顶部电极。 如果多晶层沉积在纳米晶层之上,则可以用窄脉冲宽度,负电压脉冲写入高电阻。 PCMO膜可以使用窄脉冲宽度,正幅度脉冲复位为低电阻。 同样,如果纳米晶层沉积在多晶层上,则可以用窄脉冲宽度,正电压脉冲写入高电阻,并使用窄脉冲宽度,负幅度脉冲将其复位为低电阻。
    • 10. 发明授权
    • System of selectively cleaning copper substrate surfaces, in-situ, to remove copper oxides
    • 选择性地清洗铜基板表面的系统,原位去除铜氧化物
    • US06281589B1
    • 2001-08-28
    • US09270901
    • 1999-03-15
    • Tue NguyenLawrence J. CharneskiDavid R. EvansSheng Teng Hsu
    • Tue NguyenLawrence J. CharneskiDavid R. EvansSheng Teng Hsu
    • H01L21302
    • C23G5/00H01L21/02063H01L21/02068H01L21/31111H01L21/31138H01L21/32134H01L21/76838
    • A system and method of selectively etching copper surfaces free of copper oxides in preparation for the deposition of an interconnecting metallic material is provided. The method removes metal oxides with &bgr;-diketones, such as Hhfac. The Hhfac is delivered into the system in vapor form, and reacts almost exclusively to copper oxides. The by-products of the cleaning process are likewise volatile for removal from the system with a vacuum pressure. Since the process is easily adaptable to most IC process systems, it can be conducted in an oxygen-free environment, without the removal of the IC from the process chamber. The in-situ cleaning process permits a minimum amount of copper oxide to reform before the deposition of the overlying interconnection metal. In this manner, a highly conductive electrical interconnection between the copper surface and the interconnecting metal material is formed. An IC having a metal interconnection, in which the underlying copper layer is cleaned of copper oxides, in-situ with Hhfac vapor, is also provided.
    • 提供了一种选择性地蚀刻不含铜氧化物的铜表面以准备沉积互连金属材料的系统和方法。 该方法用β-二酮除去金属氧化物,如Hhfac。 Hhfac以蒸气形式输送到系统中,几乎完全与铜氧化物反应。 清洁过程的副产物同样是挥发性的,用于在真空压力下从系统中除去。 由于该方法很容易适用于大多数IC工艺系统,所以它可以在无氧环境中进行,而不会从处理室中移除IC。 在沉积互连金属之前,原位清洁工艺允许最小量的氧化铜重整。 以这种方式,形成铜表面和互连金属材料之间的高导电性电互连。 还提供了具有金属互连的IC,其中下面的铜层用Hhfac蒸气原位清除了铜氧化物。