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    • 1. 发明授权
    • Non-volatile multilevel memory cells with data read of reference cells
    • 具有参考单元数据读取的非易失性多电平存储单元
    • US07872911B2
    • 2011-01-18
    • US12504292
    • 2009-07-16
    • Vishal SarinJung Sheng HoeiFrankie Roohparvar
    • Vishal SarinJung Sheng HoeiFrankie Roohparvar
    • G11C16/04
    • G11C16/3418G11C11/5628G11C11/5642G11C16/0483G11C16/349G11C2211/5634
    • Embodiments of the present disclosure provide methods, devices, modules, and systems for non-volatile multilevel memory cell data retrieval with data read of reference cells. One method includes programming at least one data cell of a number of data cells coupled to a selected word line to a target data threshold voltage (Vt) level corresponding to a target state; programming at least one reference cell of a number of reference cells coupled to the selected word line to a target reference Vt level, the number of reference cells interleaved with the number of data cells; determining a reference state based on a data read of the at least one reference cell; and changing a state read from the at least one data cell based on a change of the at least one reference cell.
    • 本公开的实施例提供用于参考单元的数据读取的用于非易失性多级存储器单元数据检索的方法,设备,模块和系统。 一种方法包括将耦合到所选字线的多个数据单元的至少一个数据单元编程为对应于目标状态的目标数据阈值电压(Vt)电平; 将耦合到所选字线的多个参考单元的至少一个参考单元编程为目标参考Vt电平,与数据单元数量交织的参考单元的数量; 基于所述至少一个参考单元的数据读取确定参考状态; 以及基于所述至少一个参考单元的改变来改变从所述至少一个数据单元读取的状态。
    • 2. 发明申请
    • METHOD AND APPARATUS FOR READING DATA FROM FLASH MEMORY
    • 从闪存中读取数据的方法和装置
    • US20090129169A1
    • 2009-05-21
    • US11944168
    • 2007-11-21
    • Frankie RoohparvarVishal SarinWilliam Radke
    • Frankie RoohparvarVishal SarinWilliam Radke
    • G11C16/26
    • H03M13/23G06F11/1068G11C16/26G11C29/04
    • Methods and apparatus are disclosed, such as those involving a flash memory device that includes an array of memory cells. One such method includes detecting values of charges stored in selected memory cells in the memory cell array. The method also includes processing the detected values in accordance with a Viterbi algorithm so as to determine data stored in the selected memory cells. In one embodiment, the flash memory cell array includes word lines and bit lines. Detecting the values of charges includes detecting values of charges stored in a selected row of memory cells by selecting one of the word lines. The Viterbi algorithm provides correct data where inter-signal interference between the cells affects the accuracy of read data. For example, the Viterbi algorithm can be used to supplement error correction codes (ECC).
    • 公开了诸如涉及包括存储器单元阵列的闪速存储器件的方法和装置。 一种这样的方法包括检测存储在存储单元阵列中的选定存储单元中的电荷的值。 该方法还包括根据维特比算法处理检测到的值,以便确定存储在所选存储单元中的数据。 在一个实施例中,闪存单元阵列包括字线和位线。 检测费用的值包括通过选择一个字线来检测存储在所选行的存储器单元中的电荷的值。 维特比算法提供正确的数据,其中单元之间的信号间干扰影响读取数据的准确性。 例如,维特比算法可用于补充纠错码(ECC)。
    • 4. 发明授权
    • Method and apparatus for reading data from flash memory
    • 从闪存读取数据的方法和装置
    • US08499229B2
    • 2013-07-30
    • US11944168
    • 2007-11-21
    • Frankie RoohparvarVishal SarinWilliam Radke
    • Frankie RoohparvarVishal SarinWilliam Radke
    • H03M13/03G11C29/00
    • H03M13/23G06F11/1068G11C16/26G11C29/04
    • Methods and apparatus are disclosed related to a memory device, such as a flash memory device that includes an array of memory cells. One such method includes detecting values of charges stored in selected memory cells in the memory cell array. The method also includes processing the detected values in accordance with a Viterbi algorithm so as to determine data stored in the selected memory cells. In one embodiment, the flash memory cell array includes word lines and bit lines. Detecting the values of charges includes detecting values of charges stored in a selected row of memory cells by selecting one of the word lines. The Viterbi algorithm provides correct data where inter-signal interference between the cells affects the accuracy of read data. For example, the Viterbi algorithm can decode error correction codes (ECC).
    • 公开了与诸如包括存储器单元阵列的闪存器件的存储器件有关的方法和装置。 一种这样的方法包括检测存储在存储单元阵列中的选定存储单元中的电荷的值。 该方法还包括根据维特比算法处理检测到的值,以便确定存储在所选存储单元中的数据。 在一个实施例中,闪存单元阵列包括字线和位线。 检测费用的值包括通过选择一个字线来检测存储在所选行的存储器单元中的电荷的值。 维特比算法提供正确的数据,其中单元之间的信号间干扰影响读取数据的准确性。 例如,维特比算法可以解码纠错码(ECC)。
    • 6. 发明申请
    • METHOD AND APPARATUS FOR IMPROVING STORAGE PERFORMANCE USING A BACKGROUND ERASE
    • 用于改善使用背景消除的存储性能的方法和装置
    • US20090257284A1
    • 2009-10-15
    • US12491846
    • 2009-06-25
    • Frankie Roohparvar
    • Frankie Roohparvar
    • G11C16/04G06F12/00G06F12/02
    • G11C16/16G11C16/102
    • Disclosed are an apparatus, method, and computer readable medium configured for performing a background erase in a memory device. Included is the act of receiving at least one erase command and at least one erasable block address for the memory device. Also included is the act of asserting a background-process-busy flag after receiving the at least one erase command and the at least one erasable block address. At least one block in the memory associated with the at least one erasable block address is erased, wherein the erasing occurs at a time delay after receiving the at least one erase command if a background enable flag is asserted. Finally, the background-process-busy flag is negated after the erasing is complete.
    • 公开了一种被配置为在存储器件中执行背景擦除的装置,方法和计算机可读介质。 包括为存储器件接收至少一个擦除命令和至少一个可擦除块地址的动作。 还包括在接收到至少一个擦除命令和至少一个可擦除块地址之后断言后台处理 - 忙标志的动作。 与至少一个可擦除块地址相关联的存储器中的至少一个块被擦除,其中如果背景使能标志被断言,则在接收到至少一个擦除命令之后的时间延迟发生擦除。 最后,擦除完成后,后台进程忙标志被否定。
    • 7. 发明授权
    • Method and apparatus for improving storage performance using a background erase
    • 使用背景擦除来提高存储性能的方法和装置
    • US07564721B2
    • 2009-07-21
    • US11442514
    • 2006-05-25
    • Frankie Roohparvar
    • Frankie Roohparvar
    • G11C16/04
    • G11C16/16G11C16/102
    • Disclosed are an apparatus, method, and computer readable medium configured for performing a background erase in a memory device. Included is the act of receiving at least one erase command and at least one erasable block address for the memory device. Also included is the act of asserting a background-process-busy flag after receiving the at least one erase command and the at least one erasable block address. At least one block in the memory associated with the at least one erasable block address is erased, wherein the erasing occurs at a time delay after receiving the at least one erase command if a background enable flag is asserted. Finally, the background-process-busy flag is negated after the erasing is complete.
    • 公开了一种被配置为在存储器件中执行背景擦除的装置,方法和计算机可读介质。 包括为存储器件接收至少一个擦除命令和至少一个可擦除块地址的动作。 还包括在接收到至少一个擦除命令和至少一个可擦除块地址之后断言后台处理 - 忙标志的动作。 与至少一个可擦除块地址相关联的存储器中的至少一个块被擦除,其中如果背景使能标志被断言,则在接收到至少一个擦除命令之后的时间延迟发生擦除。 最后,擦除完成后,后台进程忙标志被否定。
    • 8. 发明授权
    • System and method for initiating a bad block disable process in a non-volatile memory
    • 在非易失性存储器中启动坏块禁止进程的系统和方法
    • US07466600B2
    • 2008-12-16
    • US11499231
    • 2006-08-03
    • Frankie Roohparvar
    • Frankie Roohparvar
    • G11C7/00
    • G11C29/883G11C29/88
    • A system and method for disabling access to individually addressable regions of an array of non-volatile memory. In response to receiving an initial valid command, a process for disabling access to the defective portions of the array of non-volatile memory is initiated in addition to executing the initial valid command. One implementation provides receiving a memory command and determining whether an indicator has been set. In response to the indicator not being set, access to defective regions of the array of non-volatile memory is disabled in addition to executing the memory command. The indicator is also set to prevent the disabling process from being performed in response to receipt of subsequent memory commands.
    • 一种用于禁止访问非易失性存储器阵列的可单独寻址的区域的系统和方法。 响应于接收到初始有效命令,除了执行初始有效命令之外,还启动了禁止访问非易失性存储器阵列的缺陷部分的处理。 一个实现提供接收存储器命令并确定指示符是否已被设置。 响应于未设置指示符,除了执行存储器命令之外,禁止访问非易失性存储器阵列的缺陷区域。 指示符还被设置为防止响应于接收到后续存储器命令而执行禁用处理。
    • 9. 发明申请
    • Method and system for minimizing number of programming pulses used to program rows of non-volatile memory cells
    • 用于最小化用于编程非易失性存储器单元行的编程脉冲数的方法和系统
    • US20080043535A1
    • 2008-02-21
    • US11506375
    • 2006-08-18
    • Frankie Roohparvar
    • Frankie Roohparvar
    • G11C11/34
    • G11C16/10G11C7/16G11C8/10G11C16/3436
    • A flash memory device programs cells in each row in a manner that minimizes the number of programming pulses that must be applied to the cells during programming. The flash memory device includes a pseudo pass circuit that determines the number of data errors in each of a plurality of subsets of data that has been programmed in the row. The size of each subset corresponds to the number of read data bits coupled from the memory device, which are simultaneously applied to error checking and correcting circuitry. During iterative programming of a row of cells, the pseudo pass circuit indicates a pseudo pass condition to terminate further programming of the row if none of the subsets of data have a number of data errors that exceeds the number of data errors that can be corrected by the error checking and correcting circuitry.
    • 闪存器件以每行最小化编程期间必须施加到单元的编程脉冲数量的方式对每行中的单元进行编程。 闪速存储器件包括伪通电路,该伪通电路确定已经在行中编程的多个数据子集中的每一个中的数据错误的数量。 每个子集的大小对应于从存储器件耦合的读取数据位的数量,它们同时应用于错误校验和校正电路。 在一行单元的迭代编程期间,伪通电路指示伪通条件以终止行的进一步编程,如果没有一个数据子集具有超过可以由 错误检查和纠正电路。