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    • 1. 发明授权
    • Optical waveform measuring device
    • 光学波形测量装置
    • US5168164A
    • 1992-12-01
    • US858861
    • 1992-03-27
    • Tsuneyuki UrakamiMotohiro Suyama
    • Tsuneyuki UrakamiMotohiro Suyama
    • G01J11/00
    • G01J11/00
    • When sampling light and light to be measured each having a wavelength longer than an upper wavelength limit of the sensitivity of a photocathode are incident on the photocathode of a multiphoton absorption-type electron tube, light-light sampling is enabled by two-photon absorption and one-photoelectron emission. A delaying unit adjusts an incident timing of the sampling light from an optical pulse generating unit on the elctron tube in synchronism with an incident timing of the light to be measured on the electron tube. A half mirror causes the sampling light and the light to be measured to coincide on the photocathode of the electron tube. A controlling unit controls the delaying unit to sequentially shift the incident timing of the sampling light on the electron tube. Thus, the operation of a display unit can be controlled in synchronism with the incident timing of the sampling light so that a series of sampling outputs from the electron tube can be converted to the optical waveform of the light to be measured and displayed on the display unit.
    • 2. 发明授权
    • Voltage detection apparatus
    • 电压检测装置
    • US5583444A
    • 1996-12-10
    • US618406
    • 1996-03-19
    • Takuya NakamuraIsuke HiranoShinichiro AoshimaHironori TakahashiTsuneyuki Urakami
    • Takuya NakamuraIsuke HiranoShinichiro AoshimaHironori TakahashiTsuneyuki Urakami
    • G01R19/00G01R1/07G01R15/16G01R15/22G01R31/28G01R31/312G01R31/302
    • G01R1/071G01R31/312G01R15/22G01R15/241
    • This invention has as its object to provide a voltage measurement apparatus which has a compact probe unit, and which can perform a measurement in a non-contact manner. The voltage measurement apparatus includes detection means for detecting an electric field generated in a space by a voltage applied to the surface of a device to be measured, light-emitting means for modulating output light by superposing a detected signal obtained from the detection means on a bias current which is supplied to inductively radiate the output light, a constant current source for supplying the bias current to the light-emitting means, extraction means for extracting a signal component of the output light from the light-emitting means, and light-transmission means for guiding the output light from the light-emitting means to the extraction means, and measures the applied voltage to the surface of the device to be measured by bringing the detection means close to the device to be measured in a non-contact manner.
    • 本发明的目的是提供一种电压测量装置,其具有紧凑的探针单元,并且可以以非接触方式进行测量。 电压测量装置包括检测装置,用于通过施加到被测量装置的表面的电压来检测在空间中产生的电场;发光装置,用于通过将从检测装置获得的检测信号叠加在一个 提供用于感应放射输出光的偏置电流,用于向发光装置提供偏置电流的恒流源,用于从发光装置提取输出光的信号分量的提取装置,以及光传输 用于将来自发光装置的输出光引导到提取装置的装置,并且通过以非接触的方式使检测装置靠近被测量装置来测量施加到要测量装置的表面的电压。
    • 4. 发明授权
    • Optical apparatus
    • 光学仪器
    • US5307199A
    • 1994-04-26
    • US735792
    • 1991-07-25
    • Tsuneyuki UrakamiShinichiro AoshimaYutaka Tsuchiya
    • Tsuneyuki UrakamiShinichiro AoshimaYutaka Tsuchiya
    • G02F1/29G02F1/01G02F1/03
    • G02F1/293
    • The optical apparatus includes first and second deflection members, a mask, a pumping light source, and a controller. The first and second deflection members are formed of nonlinear optical material whose refractive index is changed upon light radiation. The mask is arranged on an optical path extending from a front side of the first deflection member to a rear side of a second deflection member. The mask has a predetermined transmission pattern. The pumping light source radiates first and second beams on predetermined regions of the first and second deflection members. This changes the refractive indices of the predetermined regions to bend the optical path. The controller variably controls the intensity of the first and second beams.
    • 光学装置包括第一和第二偏转构件,掩模,泵浦光源和控制器。 第一偏转构件和第二偏转构件由折射率在光辐射下变化的非线性光学材料形成。 掩模布置在从第一偏转构件的前侧延伸到第二偏转构件的后侧的光路上。 掩模具有预定的传输图案。 泵浦光源在第一和第二偏转构件的预定区域上辐射第一和第二光束。 这改变了预定区域的折射率以弯曲光路。 控制器可变地控制第一和第二光束的强度。
    • 6. 发明授权
    • Photodetecting apparatus having intensity tuneable light irradiating unit
    • 具有强度可调光照射单元的光检测装置
    • US5491329A
    • 1996-02-13
    • US353358
    • 1994-12-02
    • Tsuneyuki UrakamiYutaka Tsuchiya
    • Tsuneyuki UrakamiYutaka Tsuchiya
    • G01J1/00A61B5/00G01J1/42G01J1/44G01J11/00G01N21/17G01N21/49G01J1/32
    • G01N21/49A61B5/0059
    • Light the intensity of which is modulated to the initial intensity by a modulating signal having an ac component with a predetermined frequency and which is from the intensity tuneable light irradiating unit irradiates the scattering and absorption medium which is an object to be measured. The modulated light incident on the scattering and absorption medium propagates in the scattering and absorption medium, emerges therefrom and is incident to the photodetecting unit, and the photodetecting unit converts the incident light into an electric signal corresponding to the intensity of the incident light, and thereafter, outputs the electric signal as an optically detected signal. The feedback unit extracts the ac component from the input optically detected signal, and the intensity of the ac electric signal and the adjusting value are compared and the variation of the quantity of generating light is sent to the intensity tuneable light irradiating unit. Then, the phase difference detection is performed as the gain of the photodetecting means is fixed and the intensity of the ac component having a modulation frequency emitted from the photodetecting means is maintained so as to substantially match with the preset adjusting value.
    • 通过具有预定频率的交流分量并且来自强度可调光照射单元的调制信号将其强度调制到初始强度的光照射作为待测对象的散射和吸收介质。 入射在散射和吸收介质上的调制光在散射和吸收介质中传播,从中出射并入射到光电检测单元,光电检测单元将入射光转换成与入射光强度对应的电信号, 此后,作为光检测信号输出电信号。 反馈单元从输入的光检测信号中提取ac分量,并且比较ac电信号和调整值的强度,并将发光量的变化发送到强度可调光照射单元。 然后,随着光检测装置的增益被固定,并且保持从光检测装置发射的调制频率的交流分量的强度,使其与预设的调整值基本一致,进行相位差检测。
    • 10. 发明授权
    • Charged particle guide apparatus and image viewing apparatus for charged
particle microscope using the same
    • 带电粒子引导装置和使用其的带电粒子显微镜的图像观察装置
    • US5811805A
    • 1998-09-22
    • US702183
    • 1996-08-23
    • Nobuyuki OsakabeJunji EndoTetsuji KodamaTsuneyuki UrakamiHiroshi TsuchiyaShinji Ohsuka
    • Nobuyuki OsakabeJunji EndoTetsuji KodamaTsuneyuki UrakamiHiroshi TsuchiyaShinji Ohsuka
    • H01J37/22H01J37/244H01J37/26
    • H01J37/22H01J37/244
    • An electron-microscope image viewing apparatus capable of measuring of a moving speed or a vibration frequency of an atomic structure, a magnetic structure, an electric structure or the like of a specimen even when the structure changes at a high rate. The apparatus includes a charged particle source for emitting charged particles, an illuminating electron lens system for illuminating a specimen with a beam of the charged particles, an image magnifying/projecting lens system for magnifying an image of the specimen formed by charged particles scattered upon transmission through the specimen and projecting the magnified image onto an image forming plane, at least one charged particle extracting means provided on the image forming plane of the image magnifying/projecting lens system for taking out the charged particles from a predetermined portion of the charged particle beam projected onto the image forming plane, at least one charged particle detector for detecting the charged particles taken out through the charged particle extracting means, and a signal processing means for processing a signal outputted from the charged particle detector.
    • 即使当结构以高速率变化时,也可以测量试样的原子结构,磁性结构,电结构等的移动速度或振动频率的电子显微镜图像观察装置。 该装置包括用于发射带电粒子的带电粒子源,用于用带电粒子束照射样本的照明电子透镜系统,用于放大由透射时散射的带电粒子形成的样本的图像的图像放大/投影透镜系统 通过样本并将放大图像投影到图像形成平面上,至少一个带电粒子提取装置,设置在图像放大/投影透镜系统的图像形成平面上,用于从带电粒子束的预定部分中取出带电粒子 投影到图像形成平面上的至少一个带电粒子检测器,用于检测通过带电粒子提取装置取出的带电粒子;以及信号处理装置,用于处理从带电粒子检测器输出的信号。