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2. 发明授权

US06827902B1 Biochemical analyzer 失效
标题翻译：生化分析仪
公开(公告)号：US06827902B1
公开(公告)日：2004-12-07
申请号：US09284862
申请日：1999-04-22
申请人： Hiroyuki Kuriyama , Atsushi Katayama , Hiroshi Mitsumaki , Peter Hohmann
发明人： Hiroyuki Kuriyama , Atsushi Katayama , Hiroshi Mitsumaki , Peter Hohmann
IPC分类号： G01N2100
CPC分类号： G01N35/04 , G01N35/025 , G01N35/026 , G01N2035/00306 , G01N2035/00326 , Y10T436/112499 , Y10T436/113332 , Y10T436/114165
摘要： A biochemical analyzer for automatically analyzing components of a specimen, in which a specimen rack conveying part, a specimen introducing part, and a specimen storage part are arranged, independent from one another. The specimen introducing part, the analyzing part and the specimen storage part are coupled to one another along the longitudinal direction of the specimen conveying part. The heights of these three parts measured from the floor are from 850 to 950 mm, their depths are from 750 to 800 mm and their widths are multiples of the dimension of the specimen rack. A uniform appearance is achieved by having standardized dimensions. Also a low height provides better viewing and a lighter environment.
摘要翻译：用于自动分析其中样本架传送部分，样本引入部分和样本存储部分彼此独立地布置的样本的部件的生化分析器。试样导入部，分析部和试样收容部沿试样输送部的长度方向彼此连结。从地板测量的这三个部件的高度为850至950毫米，其深度为750至800毫米，宽度为样品架尺寸的倍数。通过具有标准尺寸实现均匀的外观。低的高度也提供了更好的观察和更轻的环境。

3. 外观设计

USD399964S Biochemical analysis machine 失效
公开(公告)号：USD399964S
公开(公告)日：1998-10-20
申请号：US78482
申请日：1997-10-14
申请人： Atsushi Katayama , Hiroyuki Kuriyama , Hiroshi Mitsumaki , Peter Hohmann
设计人： Atsushi Katayama , Hiroyuki Kuriyama , Hiroshi Mitsumaki , Peter Hohmann

4. 外观设计

USD407826S Reagent bottle 失效
公开(公告)号：USD407826S
公开(公告)日：1999-04-06
申请号：US78173
申请日：1997-10-20
申请人： Hajime Yamazaki , Hiroshi Mitsumaki , Tadashi Ohishi , Atsushi Katayama , Hiroyuki Kuriyama , Albert Wohland , Alfred Resch
设计人： Hajime Yamazaki , Hiroshi Mitsumaki , Tadashi Ohishi , Atsushi Katayama , Hiroyuki Kuriyama , Albert Wohland , Alfred Resch

5. 外观设计

USD406351S Reagent bottle 失效
公开(公告)号：USD406351S
公开(公告)日：1999-03-02
申请号：US78127
申请日：1997-10-20
申请人： Hajime Yamazaki , Hiroshi Mitsumaki , Tadashi Ohishi , Atsushi Katayama , Hiroyuki Kuriyama , Albert Wohland , Alfred Resch
设计人： Hajime Yamazaki , Hiroshi Mitsumaki , Tadashi Ohishi , Atsushi Katayama , Hiroyuki Kuriyama , Albert Wohland , Alfred Resch

6. 外观设计

USD404831S Reagent bottle holder for a reagent disc 失效
公开(公告)号：USD404831S
公开(公告)日：1999-01-26
申请号：US78179
申请日：1997-10-20
申请人： Hajime Yamazaki , Hiroshi Mitsumaki , Tadashi Ohishi , Atsushi Katayama , Hiroyuki Kuriyama , Albert Wohland , Alfred Resch
设计人： Hajime Yamazaki , Hiroshi Mitsumaki , Tadashi Ohishi , Atsushi Katayama , Hiroyuki Kuriyama , Albert Wohland , Alfred Resch

7. 发明授权

US5864138A Electron Microscope 失效
标题翻译：电子显微镜
公开(公告)号：US5864138A
公开(公告)日：1999-01-26
申请号：US715378
申请日：1996-09-12
申请人： Tomoyuki Miyata , Peter Hohmann , Atsushi Katayama , Daiji Tsuboi , Hiroyuki Kobayashi , Hisashi Sato , Hiroyuki Kuriyama
发明人： Tomoyuki Miyata , Peter Hohmann , Atsushi Katayama , Daiji Tsuboi , Hiroyuki Kobayashi , Hisashi Sato , Hiroyuki Kuriyama
IPC分类号： G01Q30/02 , G01N23/00 , H01J37/02 , H01J37/26
CPC分类号： H01J37/02 , H01J37/26 , H01J2237/0216
摘要： The electron microscope provides sufficient leg space for an observer sitting in a chair in a working posture and allows concentrated observation and swift operation of the electron microscope without burdening the observer. An electron gun column is supported on a support structure formed in a rectangular parallelepiped. The electron gun column, a column evacuation device and a viewing chamber are mounted on the dampers on the support structure through a vibration plate. The table is mounted on the support structure through table supports provided on the top surface of the support structure. Further, the table has an opening at a location corresponding to the viewing chamber so that the table and the viewing chamber, both mounted on the support structure, are not in contact with each other. The layout of the operation panel divides the operation devices of the electron microscope into a group of devices that are frequently reached by touch and operated during observation and a group of devices that are not frequently used during observation. The former group is arranged in arc areas within reach of the operator's arms when pivoted about the elbows as the operator rests his arms naturally on the operation table. The latter group is classified according to the functions performed and is arranged in positions that are behind the arc areas of pivoting arms and are easily recognized visually.
摘要翻译：电子显微镜为坐在椅子上的观察者以工作姿态提供足够的腿部空间，并且允许电子显微镜的集中观察和快速操作而不会使观察者负担。电子枪柱支撑在形成为长方体的支撑结构上。电子枪柱，柱抽空装置和观察室通过振动板安装在支撑结构上的阻尼器上。桌子通过设置在支撑结构的顶部表面上的桌子支撑件安装在支撑结构上。此外，桌子在与观察室对应的位置处具有开口，使得安装在支撑结构上的桌子和观察室彼此不接触。操作面板的布局将电子显微镜的操作装置分为在观察期间通过触摸和操作而频繁达到的一组装置以及在观察期间不经常使用的一组装置。当操作者将手臂自然地放在手术台上时，前组被布置在围绕肘部枢转的操作者手臂的距离范围内的弧形区域中。后者根据所执行的功能进行分类，并且布置在枢转臂的弧形区域的后面的位置，并且可以容易地被目视识别。

8. 发明授权

US6084239A Electron microscope 失效
标题翻译：电子显微镜
公开(公告)号：US6084239A
公开(公告)日：2000-07-04
申请号：US097708
申请日：1998-06-16
申请人： Tomoyuki Miyata , Atsushi Katayama , Daiji Tsuboi , Hiroyuki Kobayashi , Hisashi Sato , Hiroyuki Kuriyama , Peter Hohmann
发明人： Tomoyuki Miyata , Atsushi Katayama , Daiji Tsuboi , Hiroyuki Kobayashi , Hisashi Sato , Hiroyuki Kuriyama , Peter Hohmann
IPC分类号： G01Q30/02 , G01N23/00 , H01J37/02 , H01J37/26
CPC分类号： H01J37/02 , H01J37/26 , H01J2237/0216
摘要： The electron microscope provides sufficient leg space for an observer sitting in a chair in a working posture and allows concentrated observation and swift operation of the electron microscope without burdening the observer. An electron gun column is supported on a support structure formed in a rectangular parallelepiped. The electron gun column, a column evacuation device and a viewing chamber are mounted on the dampers on the support structure through a vibration plate. The table is mounted on the support structure through table supports provided on the top surface of the support structure. Further, the table has an opening at a location corresponding to the viewing chamber so that the table and the viewing chamber, both mounted on the support structure, are not in contact with each other. The layout of the operation panel divides the operation devices of the electron microscope into a group of devices that are frequently reached by touch and operated during observation and a group of devices that are not frequently used during observation. The former group is arranged in arc areas within reach of the operator's arms when pivoted about the elbows as the operator rests his arms naturally on the operation table. The latter group is classified according to the functions performed and is arranged in positions that are behind the arc areas of pivoting arms and are easily recognized visually.
摘要翻译：电子显微镜为坐在椅子上的观察者以工作姿态提供足够的腿部空间，并且允许电子显微镜的集中观察和快速操作而不会使观察者负担。电子枪柱支撑在形成为长方体的支撑结构上。电子枪柱，柱抽空装置和观察室通过振动板安装在支撑结构上的阻尼器上。桌子通过设置在支撑结构的顶部表面上的桌子支撑件安装在支撑结构上。此外，桌子在与观察室对应的位置处具有开口，使得安装在支撑结构上的桌子和观察室彼此不接触。操作面板的布局将电子显微镜的操作装置分为在观察期间通过触摸和操作而频繁达到的一组装置以及在观察期间不经常使用的一组装置。当操作者将手臂自然地放在手术台上时，前组被布置在围绕肘部枢转的操作者手臂的距离范围内的弧形区域中。后者根据所执行的功能进行分类，并且布置在枢转臂的弧形区域的后面的位置，并且可以容易地被目视识别。

9. 发明申请

US20100243153A1 COMPONENT MOUNTING APPARATUS AND METHOD 有权
标题翻译：组件安装设备和方法
公开(公告)号：US20100243153A1
公开(公告)日：2010-09-30
申请号：US12745954
申请日：2008-12-03
申请人： Yasuto Onitsuka , Atsushi Katayama
发明人： Yasuto Onitsuka , Atsushi Katayama
IPC分类号： B32B37/10
CPC分类号： H01L24/86 , H01L24/79 , H01L2924/01004 , H01L2924/01005 , H01L2924/01006 , H01L2924/01033 , H01L2924/01043 , H01L2924/01047 , H01L2924/0106 , H01L2924/01074 , H01L2924/01082 , H01L2924/14 , Y10T156/1092 , Y10T156/1759
摘要： A component mounting apparatus includes: a plurality of pressure-bonding units which are arrayed in line and each of which includes a pressure-bonding head for pressure-bonding a component to a component pressure-bonding area of the substrate, and an edge-portion support member for supporting an edge portion of the substrate during the pressure bonding; a guide support member for supporting the pressure-bonding units so that their movement along the edge portion for execution of substrate pressure-bonding can be guided; a common head up/down unit for integrally moving up and down the individual pressure-bonding heads; and a plurality of unit-moving devices which are provided for the plurality of pressure-bonding units, individually and respectively, to move the pressure-bonding units along the edge portion so that placement of the pressure-bonding units is changed.
摘要翻译：一种部件安装装置包括：多个压接单元，其排列成一列，每个压接单元包括用于将部件压接到所述基板的部件压接区域的压接头，以及边缘部分支撑构件，用于在压力接合期间支撑衬底的边缘部分; 引导支撑构件，用于支撑压接单元，使得它们沿着用于执行基板压接的边缘部分的移动可以被引导; 用于一体地上下移动单个压接头的公共头部上/下单元; 以及多个单元移动装置，其分别设置用于多个压接单元，分别沿着边缘部分移动压接单元，从而改变压接单元的放置。

10. 发明申请

US20100220918A1 INSPECTION APPARATUS AND INSPECTION METHOD 失效
标题翻译：检查装置和检查方法
公开(公告)号：US20100220918A1
公开(公告)日：2010-09-02
申请号：US12679363
申请日：2008-09-24
申请人： Takashi Iwahashi , Toshihiko Tsujikawa , Atsushi Katayama
发明人： Takashi Iwahashi , Toshihiko Tsujikawa , Atsushi Katayama
IPC分类号： G06K9/00
CPC分类号： G01B11/002 , G01N21/8806 , G01N21/956 , G01N2021/9513 , G06T7/0006 , G06T7/73 , G06T2207/10048 , G06T2207/20164 , G06T2207/30141 , G06T2207/30204
摘要： Aims to provide an inspection apparatus which precisely detects an amount of misalignment of a component mounted on a panel through an adhesive which contains conductive particles. The inspection apparatus includes: an infrared-light illuminator (305) which is provided on a bottom-surface side of the panel and illuminates with light a panel recognition mark formed on the panel and a component recognition mark formed on the component; an IR camera (307) which is provided opposite to the illuminator (305) and captures images of the light-illuminated recognition marks; and an amount-of-misalignment calculation unit (446) which calculates, using the images captured by the camera (307), an amount of misalignment of the recognition marks as an amount of misalignment in mounting position, wherein the illuminator (305) emits light in an amount which causes halation, the light having a wavelength that allows the light to pass through the panel and the component but does not allow or does not easily allow the light to pass through the conductive particles.
摘要翻译：旨在提供一种检查装置，其通过包含导电颗粒的粘合剂精确地检测安装在面板上的部件的未对准量。检查装置包括：红外光照射器（305），其设置在面板的底面侧，并且用光照亮面板上形成的面板识别标记和形成在所述部件上的部件识别标记; IR照相机（307），其与照明器（305）相对设置并且捕获光照识别标记的图像; 以及未对准计算单元（446），其使用由所述照相机（307）拍摄的图像计算所述识别标记的未对准量作为安装位置的未对准量，其中，所述照明器（305）发射导致晕光的光，具有允许光穿过面板和部件但不允许或不容易使光通过导电颗粒的波长的光。

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