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    • 2. 发明授权
    • Apparatus for controlling swivel angles of on-vehicle headlights
    • 用于控制车载前灯的旋转角度的装置
    • US07792621B2
    • 2010-09-07
    • US11980272
    • 2007-10-30
    • Toshio SugimotoKoji Ishiguro
    • Toshio SugimotoKoji Ishiguro
    • G05D1/00
    • B60Q1/122B60Q2300/112B60Q2300/122B60Q2300/322
    • An apparatus controls a swivel angle of on-vehicle headlights, the swivel angle of the lights being changeable in a lateral direction of the vehicle. A target swivel angle of the headlights is determined based on, for example, load map data of the road ahead the vehicle, and a control start point is determined based on the current position information and the road map data. The swivel angle is controlled to the target swivel angle in response to a state where the current position of the vehicle has reached the control start point. Running road shape-related information and a curvature direction of the road ahead are acquired. A control of the swivel angle toward the target swivel angle is prohibited when a direction of the target swivel angle determined is inconsistent with the curvature direction of the road, even in a case where the vehicle has reached the control start point.
    • 一种装置控制车载前灯的旋转角度,灯的旋转角度可在车辆的横向方向上变化。 基于例如车辆前方的路面的载荷图数据来确定头灯的目标旋转角度,并且基于当前位置信息和路线图数据来确定控制开始点。 响应于车辆的当前位置已经到达控制起始点的状态,将旋转角度控制到目标旋转角度。 获取道路形状相关信息和前方道路的曲率方向。 即使在车辆到达控制开始点的情况下,当所确定的目标旋转角度的方向与道路的曲率方向不一致时,禁止对目标旋转角度的旋转角度的控制。
    • 3. 发明申请
    • Apparatus for controlling swivel angles of on-vehicle headlights
    • 用于控制车载前灯的旋转角度的装置
    • US20080103661A1
    • 2008-05-01
    • US11980272
    • 2007-10-30
    • Toshio SugimotoKoji Ishiguro
    • Toshio SugimotoKoji Ishiguro
    • B60Q1/08G02B26/08
    • B60Q1/122B60Q2300/112B60Q2300/122B60Q2300/322
    • An apparatus controls a swivel angle of on-vehicle headlights, the swivel angle of the lights being changeable in a lateral direction of the vehicle. A target swivel angle of the headlights is determined based on, for example, load map data of the road ahead the vehicle, and a control start point is determined based on the current position information and the road map data. The swivel angle is controlled to the target swivel angle in response to a state where the current position of the vehicle has reached the control start point. Running road shape-related information and a curvature direction of the road ahead are acquired. A control of the swivel angle toward the target swivel angle is prohibited when a direction of the target swivel angle determined is inconsistent with the curvature direction of the road, even in a case where the vehicle has reached the control start point.
    • 一种装置控制车载前灯的旋转角度,灯的旋转角度可在车辆的横向方向上变化。 基于例如车辆前方的路面的载荷图数据来确定头灯的目标旋转角度,并且基于当前位置信息和路线图数据来确定控制开始点。 响应于车辆的当前位置已经到达控制起始点的状态,将旋转角度控制到目标旋转角度。 获取道路形状相关信息和前方道路的曲率方向。 即使在车辆到达控制开始点的情况下,当所确定的目标旋转角度的方向与道路的曲率方向不一致时,禁止对目标旋转角度的旋转角度的控制。
    • 9. 发明授权
    • Manufacturing equipment using ION beam or electron beam
    • 使用ION光束或电子束的制造设备
    • US07592606B2
    • 2009-09-22
    • US11779686
    • 2007-07-18
    • Koji IshiguroKaoru UmemuraNoriyuki Kaneoka
    • Koji IshiguroKaoru UmemuraNoriyuki Kaneoka
    • G08B21/00
    • H01J37/3056H01J37/3005H01J37/304H01J2237/0225H01J2237/05H01J2237/24514H01J2237/248H01J2237/30455H01J2237/31744H01J2237/31745
    • Provided is a charged particle beam processing apparatus capable of improving yields by suppressing the spread of metal pollution to a semiconductor manufacturing process to a minimum. The charged particle beam processing apparatus includes an ion beam column 1 that is connected to a vacuum vessel 10 and irradiates a sample 35 with an ion beam 11 of nonmetal ion species, a microsampling unit 3 having a probe 16 that extracts a microsample 43 cut out from a sample 35 by the ion beam 11, a gas gun 2 that discharges a gas for bonding the microsample 43 and the probe 16, a pollution measuring beam column 6A that is connected to the same vacuum vessel 10 to which the ion beam column 1 is connected and irradiates an ion beam irradiation traces by the ion beam column 1 with a pollution measuring beam 13, and a detector 7 that detects characteristic X-rays emitted from the ion beam irradiation traces by the ion beam column 1 upon irradiation with the pollution measuring beam 13.
    • 提供一种能够通过将半导体制造工序的金属污染的扩散抑制到最小来提高产率的带电粒子束处理装置。 带电粒子束处理装置包括离子束柱1,其连接到真空容器10并用非金属离子种类的离子束11照射样品35,微量取样单元3具有探针16,其提取切出的微量样品43 从样品35通过离子束11,放出用于接合微量样品43和探针16的气体的气枪2,污染测量束柱6A,连接到相同的真空容器10,离子束柱1 用离子束柱1连接并用污染测量光束13照射离子束照射迹线;以及检测器7,其在照射污染物时检测由离子束柱1从离子束照射迹线发射的特征X射线 测量光束13。