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1. 发明授权

US6140642A Imaging energy filter equipped with distortion corrector 有权
标题翻译：成像能量过滤器配有失真校正器
公开(公告)号：US6140642A
公开(公告)日：2000-10-31
申请号：US259082
申请日：1999-02-26
申请人： Toshikatsu Kaneyama , Toshikazu Honda , Michiyoshi Tanaka , Masami Terauchi , Kenji Tsuda
发明人： Toshikatsu Kaneyama , Toshikazu Honda , Michiyoshi Tanaka , Masami Terauchi , Kenji Tsuda
IPC分类号： H01J37/244 , H01J49/46
CPC分类号： H01J49/46
摘要： There is disclosed an imaging energy filter equipped with a distortion corrector. The energy filter is incorporated in an electron microscope and includes a spectrometer having magnets for producing magnetic fields. In this spectrometer, coils for exciting the magnets and potentiometers having variable resistors are connected in parallel. The variable resistors of the potentiometers are shifted to control the ratio of currents flowing into coils of shunting circuits.
摘要翻译：公开了配备有失真校正器的成像能量过滤器。能量过滤器结合在电子显微镜中，并且包括具有用于产生磁场的磁体的光谱仪。在该光谱仪中，用于激励磁体的线圈和具有可变电阻器的电位器并联连接。电位器的可变电阻器被移位以控制流入分流电路线圈的电流比。

2. 发明授权

US5258617A Method and apparatus for correcting axial coma in electron microscopy 失效
标题翻译：电子显微镜矫正轴向彗差的方法和装置
公开(公告)号：US5258617A
公开(公告)日：1993-11-02
申请号：US898440
申请日：1992-06-15
申请人： Toshikatsu Kaneyama , Toshikazu Honda
发明人： Toshikatsu Kaneyama , Toshikazu Honda
IPC分类号： H01J37/04 , H01J37/153 , H01J37/26
CPC分类号： H01J37/265 , H01J37/153
摘要： Method and apparatus for correcting the axial coma in the image created by an electron microscope without requiring skillfulness or any other peripheral device. The microscope is equipped with a beam wobbler and brings the voltage center or current center into the middle of the final image by controlling the deflection coils. The amount of the deviation of the voltage center or current center from the coma-free axis is previously found and stored in an area of a memory. This beam is tilted by the amount of the deviation read from the memory. For this purpose, a deflecting signal corresponding to the amount of the deviation is produced to the deflection coils. Therefore, once the deviation is found, the axial coma can be corrected simply and routinely by correcting the beam tilt by the amount of deviation after the voltage center or current center is brought into the middle of the final image.
摘要翻译：用于校正由电子显微镜产生的图像中的轴向彗差的方法和装置，而不需要熟练程度或任何其它外围设备。显微镜配备有光束摆动器，并通过控制偏转线圈将电压中心或当前中心放入最终图像的中间。预先找到电压中心或当前中心与空白轴的偏差量，并将其存储在存储器的一个区域中。该光束被从存储器读取的偏差量倾斜。为此，对偏转线圈产生对应于偏差量的偏转信号。因此，一旦发现偏差，则可以简单且常规地校正轴向彗差，通过将电压中心或当前中心进入最终图像的中间之后的偏移量校正光束倾斜。

3. 发明授权

US5264705A Specimen-driving apparatus for electron microscope which tilts and translates while preventing contact damage 失效
标题翻译：用于电子显微镜的样品驱动装置，其在防止接触损伤的同时倾斜和平移
公开(公告)号：US5264705A
公开(公告)日：1993-11-23
申请号：US862528
申请日：1992-04-02
申请人： Toshikazu Honda , Mikio Naruse , Toshikatsu Kaneyama , Yu Ishibashi , Ikuya Nishimura
发明人： Toshikazu Honda , Mikio Naruse , Toshikatsu Kaneyama , Yu Ishibashi , Ikuya Nishimura
IPC分类号： G01Q30/02 , G01Q30/20 , H01J37/20
CPC分类号： H01J37/20
摘要： A specimen-driving apparatus used with an electron microscope. The apparatus can translate or tilt the specimen holder while preventing it from being damaged if a human operator performs any erroneous operation. The device has X, Y, Z translation directive devices, and a tilt directive device for permitting the operator to enter instructions for translating and tilting the specimen holder. A contact detector senses that the holder is in contact with the upper magnetic pole piece. A tilt condition decision portion determines whether the holder has tilted into the positive or negative domain. A Z domain decision portion determines whether the Z coordinate of the holder lies in the positive or negative domain. When the contact of the holder with the pole piece is detected, reverse movement of the holder along the Z-axis is inhibited. Also, reverse tilting movement of the holder is inhibited. When the holder comes out of contact with the pole piece, these reverse movements are permitted.
摘要翻译：用电子显微镜使用的试样驱动装置。如果操作人员执行任何错误的操作，该装置可以平移或倾斜试样架，同时防止其受损。该装置具有X，Y，Z平移指示装置和倾斜指令装置，用于允许操作者输入用于平移和倾斜试样架的指令。接触检测器感测到保持器与上磁极片接触。倾斜条件决定部分确定保持器是否已经倾斜到正或负域。 Z域决定部分确定持有者的Z坐标是否位于正或负域。当保持器与极片的接触被检测到时，保持器沿Z轴的反向运动被抑制。此外，保持器的反向倾斜运动被抑制。当支架与极片脱离接触时，允许这些反向运动。

4. 发明授权

US06573501B2 Holography transmission electron microscope 失效
标题翻译：全息透射电子显微镜
公开(公告)号：US06573501B2
公开(公告)日：2003-06-03
申请号：US09789484
申请日：2001-02-20
申请人： Toshikatsu Kaneyama , Hiromi Nunome , Masaki Takeguchi
发明人： Toshikatsu Kaneyama , Hiromi Nunome , Masaki Takeguchi
IPC分类号： H01J3700
CPC分类号： H01J37/26 , H01J2237/1514 , H01J2237/2614
摘要： A holography electron microscope permitting electron holography without limitations on the magnification. An electron biprism is mounted between a system of intermediate lenses and a system of projector lenses. The objective lens and the system of intermediate lenses form a crossover at a given position between intermediate lenses and the electron biprism and, at the same time, focus a magnified image at a certain position between the electron biprism and projector lenses. Since the system of intermediate lenses is made up of three or more stages of lenses, it forms a crossover at a given position and focuses a magnified image at a certain position.
摘要翻译：全息电子显微镜，允许电子全息术，但不限于放大倍率。电子双棱镜安装在中间透镜系统和投影仪透镜系统之间。物镜和中间透镜系统在中间透镜和电子双棱镜之间的给定位置处形成交叉，并且同时将放大图像聚焦在电子双棱镜和投影透镜之间的特定位置。由于中间透镜系统由三个或更多个镜头组成，因此在给定位置形成一个交叉，并将放大的图像聚焦在某个位置。

5. 发明申请

US20050242284A1 Electron microscope 有权
标题翻译：电子显微镜
公开(公告)号：US20050242284A1
公开(公告)日：2005-11-03
申请号：US11102483
申请日：2005-04-08
申请人： Toshikatsu Kaneyama
发明人： Toshikatsu Kaneyama
IPC分类号： H01J37/05 , H01J37/153 , H01J37/26 , H01J47/00
CPC分类号： H01J37/26 , H01J2237/05 , H01J2237/2522
摘要： There is disclosed an electron microscope that achieves low-magnification imaging while the objective lens is kept at high excitation in the same way as during high-magnification imaging. An objective minilens located immediately behind the objective lens demagnifies a specimen image magnified by the objective lens. Consequently, a sharply focused electron beam enters the first intermediate lens. This greatly reduces the effects of off-axis aberrations in the intermediate lenses. The first, second, and third intermediate lenses create a crossover image and a microscope image in the entrance window plane and entrance image plane, respectively, of an energy filter. The energy filter focuses the microscope image and crossover image onto the exit image plane and exit window plane, respectively. The output image from the filter is projected onto the final image plane by first and second projector lenses.
摘要翻译：公开了以与高倍率成像时相同的方式在物镜保持高激发的同时实现低倍率成像的电子显微镜。位于物镜后面的物镜微缩镜使由物镜放大的样本图像缩小。因此，尖锐聚焦的电子束进入第一中间透镜。这大大降低了中间透镜中离轴像差的影响。第一，第二和第三中间透镜分别在能量过滤器的入射窗平面和入射图像平面中产生交叉图像和显微镜图像。能量过滤器将显微镜图像和交叉图像分别聚焦到出射图像平面和出射窗口平面。来自滤波器的输出图像由第一和第二投影仪透镜投射到最终的图像平面上。

6. 发明授权

US06720558B2 Transmission electron microscope equipped with energy filter 有权
标题翻译：透射电子显微镜配有能量过滤器
公开(公告)号：US06720558B2
公开(公告)日：2004-04-13
申请号：US10056218
申请日：2002-01-24
申请人： Toshikatsu Kaneyama
发明人： Toshikatsu Kaneyama
IPC分类号： H01J4944
CPC分类号： H01J37/26 , H01J37/05
摘要： A transmission electron microscope (TEM) equipped with an energy filter, the microscope being characterized in that rotation of the created image or diffraction pattern is prevented. The microscope has 6 lens systems, i.e., an objective lens system, four intermediate lens systems, and a projector lens system. If the mode of operation is varied, the total sum of the products of the numbers of turns of wire on the coils of the lenses of the various lens systems including the objective lens system, the four intermediate lens systems, and the projector lens system, and their respective excitation currents is kept constant.
摘要翻译：配备有能量过滤器的透射电子显微镜（TEM），显微镜的特征在于防止了所产生的图像或衍射图案的旋转。显微镜具有6个透镜系统，即物镜系统，四个中间透镜系统和投影透镜系统。如果操作模式改变，则包括物镜系统，四个中间透镜系统和投影透镜系统的各种透镜系统的透镜的线圈的线圈数的乘积的总和，并且它们各自的激励电流保持恒定。

7. 发明授权

US5952656A Energy filter 失效
标题翻译：能量过滤器
公开(公告)号：US5952656A
公开(公告)日：1999-09-14
申请号：US982718
申请日：1997-12-02
申请人： Toshikatsu Kaneyama
发明人： Toshikatsu Kaneyama
IPC分类号： H01J37/248 , G01Q10/06 , G01Q30/00 , G21K1/087 , G21K1/10 , H01J37/05 , H01J37/244 , H01J49/44 , G21K3/00 , G21K1/08
CPC分类号： H01J37/05 , H01J37/26 , H01J37/265 , H01J2237/055 , H01J2237/057
摘要： There is disclosed an .OMEGA.-filter for use with an electron microscope. This filter has only one parameter that controls the exciting currents supplied to four magnets M.sub.1 -M.sub.4. Only those electrons of incident electrons that have a given energy pass through the successive magnets and emerge from the filter. The coils of the magnets M.sub.1 and M.sub.4 are identical in number of turns and connected in series. Similarly, the coils of the magnets M.sub.2 and M.sub.3 are identical in number of turns and connected in series. When a human operator specifies an exciting current i.sub.1 through an entry device, a controller causes a power supply P.sub.1 to produce this exciting current i.sub.1, thus exciting the magnets M.sub.1 and M.sub.4. The controller calculates an exciting current i.sub.2 from the exciting current i.sub.1, and causes a power supply P.sub.2 to produce this exciting current i.sub.2, thus exciting the magnets M.sub.2 and M.sub.3.
摘要翻译：公开了一种用于电子显微镜的OMEGA过滤器。该滤波器只有一个参数可以控制提供给四个磁体M1-M4的励磁电流。只有具有给定能量的入射电子的那些电子通过连续的磁体并从滤光器出射。磁铁M1和M4的线圈匝数相同并串联连接。类似地，磁体M2和M3的线圈的匝数相同并串联连接。当操作人员通过进入装置指定激励电流i1时，控制器使电源P1产生该励磁电流i1，从而激励磁体M1和M4。控制器从励磁电流i1计算励磁电流i2，并使电源P2产生该励磁电流i2，从而激励磁体M2和M3。

8. 发明授权

US07977630B2 Electron microscope 有权
标题翻译：电子显微镜
公开(公告)号：US07977630B2
公开(公告)日：2011-07-12
申请号：US11102483
申请日：2005-04-08
申请人： Toshikatsu Kaneyama
发明人： Toshikatsu Kaneyama
IPC分类号： H01J44/00
CPC分类号： H01J37/26 , H01J2237/05 , H01J2237/2522
摘要： There is disclosed an electron microscope that achieves low-magnification imaging while the objective lens is kept at high excitation in the same way as during high-magnification imaging. An objective minilens located immediately behind the objective lens demagnifies a specimen image magnified by the objective lens. Consequently, a sharply focused electron beam enters the first intermediate lens. This greatly reduces the effects of off-axis aberrations in the intermediate lenses. The first, second, and third intermediate lenses create a crossover image and a microscope image in the entrance window plane and entrance image plane, respectively, of an energy filter. The energy filter focuses the microscope image and crossover image onto the exit image plane and exit window plane, respectively. The output image from the filter is projected onto the final image plane by first and second projector lenses.
摘要翻译：公开了以与高倍率成像时相同的方式在物镜保持高激发的同时实现低倍率成像的电子显微镜。位于物镜后面的物镜微缩镜使由物镜放大的样本图像缩小。因此，尖锐聚焦的电子束进入第一中间透镜。这大大降低了中间透镜中离轴像差的影响。第一，第二和第三中间透镜分别在能量过滤器的入射窗平面和入射图像平面中产生交叉图像和显微镜图像。能量过滤器将显微镜图像和交叉图像分别聚焦到出射图像平面和出射窗口平面。来自滤波器的输出图像由第一和第二投影仪透镜投射到最终的图像平面上。

9. 发明授权

US07459680B2 Method of analysis using energy loss spectrometer and transmission electron microscope equipped therewith 有权
标题翻译：使用能量损失光谱仪和透射电子显微镜进行分析的方法
公开(公告)号：US07459680B2
公开(公告)日：2008-12-02
申请号：US11393367
申请日：2006-03-30
申请人： Toshikatsu Kaneyama
发明人： Toshikatsu Kaneyama
IPC分类号： H01J40/00 , H01J47/00
CPC分类号： H01J37/05 , H01J37/265 , H01J40/02 , H01J2237/057 , H01J2237/221 , H01J2237/2446 , H01J2237/24585
摘要： A method of analysis using an energy loss spectrometer and a transmission electron microscope equipped with the energy loss spectrometer. The spectrometer has a CCD camera for recording plural spectra as one photoelectric device image and a controller for batch reading in images from the camera, converting the positions of the pixels forming the images, and splitting each image into plural spectra. This permits improvement of the processing speed of the spectrometer.
摘要翻译：使用能量损失光谱仪和配备有能量损失光谱仪的透射电子显微镜进行分析的方法。光谱仪具有用于将多个光谱作为一个光电装置图像记录的CCD照相机，以及用于从照相机批量读取图像的控制器，转换形成图像的像素的位置，并将每个图像分割成多个光谱。这样可以提高光谱仪的处理速度。

10. 发明申请

US20060255271A1 Method of analysis using energy loss spectrometer and transmission electron microscope equipped therewith 有权
标题翻译：使用能量损失光谱仪和透射电子显微镜进行分析的方法
公开(公告)号：US20060255271A1
公开(公告)日：2006-11-16
申请号：US11393367
申请日：2006-03-30
申请人： Toshikatsu Kaneyama
发明人： Toshikatsu Kaneyama
IPC分类号： H01J40/00
CPC分类号： H01J37/05 , H01J37/265 , H01J40/02 , H01J2237/057 , H01J2237/221 , H01J2237/2446 , H01J2237/24585
摘要： A method of analysis using an energy loss spectrometer and a transmission electron microscope equipped with the energy loss spectrometer. The spectrometer has a CCD camera for recording plural spectra as one photoelectric device image and a controller for batch reading in images from the camera, converting the positions of the pixels forming the images, and splitting each image into plural spectra. This permits improvement of the processing speed of the spectrometer.
摘要翻译：使用能量损失光谱仪和配备有能量损失光谱仪的透射电子显微镜进行分析的方法。光谱仪具有用于将多个光谱作为一个光电装置图像记录的CCD照相机，以及用于从照相机批量读取图像的控制器，转换形成图像的像素的位置，并将每个图像分割成多个光谱。这样可以提高光谱仪的处理速度。

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