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    • 8. 发明授权
    • Fast accessible non-volatile semiconductor memory device
    • 快速访问的非易失性半导体存储器件
    • US5646885A
    • 1997-07-08
    • US395249
    • 1995-02-27
    • Ryuichi MatsuoMakoto Yamamoto
    • Ryuichi MatsuoMakoto Yamamoto
    • G11C17/00G11C11/412G11C14/00G11C16/04G11C11/24
    • G11C11/412G11C14/00G11C16/0441
    • A non-volatile SRAM cell (MC) includes floating gate type transistors (1a, 1b) arranged between power supply nodes (4a, 4b) and storage nodes (A, B), and flip-flops (2a, 2b) holding signal potentials of the storage nodes. The floating gate type transistor has a drain connected to the power supply node, and a control gate connected to a control electrode node (5). Voltages are applied independently to the drains and the control gate of the floating gate type transistor, whereby a large amount of hot electrons are efficiently generated by avalanche breakdown and are accelerated to be injected into the floating gate. Removal of electrons is achieved by the voltages applied to the control gate and the drain. In the non-volatile SRAM cell utilizing the floating gate type transistor, injection and removal of electrons with respect to the floating gate are efficiently performed to change a threshold voltage for reliably storing information in a non-volatile manner.
    • 非易失性SRAM单元(MC)包括布置在电源节点(4a,4b)和存储节点(A,B)之间的浮动栅型晶体管(1a,1b)和保持信号电位的触发器(2a,2b) 的存储节点。 浮栅型晶体管具有连接到电源节点的漏极和连接到控制电极节点(5)的控制栅极。 电压独立地施加到浮栅型晶体管的漏极和控制栅极,由此通过雪崩击穿有效地产生大量的热电子,并被加速以注入浮栅。 通过施加到控制栅极和漏极的电压来实现电子的去除。 在利用浮栅型晶体管的非易失性SRAM单元中,有效地执行相对于浮置栅极的电子注入和去除,以便以非易失性方式可靠地存储信息来改变阈值电压。
    • 10. 发明授权
    • Semiconductor memory device capable of refresh operation in burst mode
    • 能够以突发模式刷新操作的半导体存储器件
    • US5659515A
    • 1997-08-19
    • US520190
    • 1995-08-28
    • Ryuichi MatsuoTomohisa Wada
    • Ryuichi MatsuoTomohisa Wada
    • G11C7/10G11C11/401G11C11/405G11C11/406G11C7/00
    • G11C7/103G11C11/406
    • A semiconductor memory device comprising a memory cell array, a row decoder, an input/output register train, a burst counter, an input/output bus, a refresh counter and a multiplexer. The memory cell array includes a plurality of word lines, a plurality of bit line pairs and a plurality of memory cells. The input/output register train has a plurality of registers corresponding to the bit line pairs. Each of the registers is connected to the corresponding bit line pair. The input/output bus inputs and outputs data to and from the register train in response to a signal from the burst counter. The multiplexer supplies the row decoder with an external address signal as an internal address signal. After data is transferred from any bit line pair to the register or before data is transferred from any register to the bit line pair, the multiplexer supplies the row decoder with a refresh address signal from the refresh counter in place of the external address signal. This allows a refresh operation to take place during a burst read/write operation of data.
    • 包括存储单元阵列,行解码器,输入/输出寄存器列,突发计数器,输入/输出总线,刷新计数器和多路复用器的半导体存储器件。 存储单元阵列包括多个字线,多个位线对和多个存储单元。 输入/输出寄存器列具有对应于位线对的多个寄存器。 每个寄存器都连接到相应的位线对。 输入/输出总线响应于来自脉冲串计数器的信号,输入和输出数据到和从寄存器串中输出数据。 多路复用器为行解码器提供外部地址信号作为内部地址信号。 在数据从任何位线对传输到寄存器之后,或者在数据从任何寄存器传送到位线对之前,多路复用器为行解码器提供来自刷新计数器的刷新地址信号来代替外部地址信号。 这允许在数据的突发读/写操作期间进行刷新操作。