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1. 发明授权

US06795185B2 Film thickness measuring apparatus 失效
标题翻译：薄膜厚度测量仪
公开(公告)号：US06795185B2
公开(公告)日：2004-09-21
申请号：US10094383
申请日：2002-03-08
申请人： Tomoya Yoshizawa , Kunio Otsuki
发明人： Tomoya Yoshizawa , Kunio Otsuki
IPC分类号： G01J400
CPC分类号： G01B11/0641
摘要： A film thickness measuring apparatus capable of restricting a measurement area on the surface of a sample is provided. An incident optical system provides an irradiating polarized light to the surface of the sample. A detecting optical system receives the reflected light having an elliptical polarization and provides a reduced aperture that can restrict the light provided through a fiber optic conduit to a spectrometer and thereby eliminate aberrations and noise problems.
摘要翻译：提供了能够限制样品表面上的测量区域的膜厚度测量装置。入射光学系统向样品的表面提供照射偏振光。检测光学系统接收具有椭圆偏振的反射光，并提供减小的光圈，其可以将通过光纤导管提供的光限制在光谱仪上，从而消除像差和噪声问题。

2. 发明授权

US06714301B2 Spectral ellipsometer without chromatic aberrations 失效
标题翻译：光谱椭偏仪无色差
公开(公告)号：US06714301B2
公开(公告)日：2004-03-30
申请号：US10004250
申请日：2001-10-23
申请人： Kunio Otsuki , Yutaka Saijo
发明人： Kunio Otsuki , Yutaka Saijo
IPC分类号： G01J400
CPC分类号： G02B5/04 , G01N21/211 , G02B27/283
摘要： A spectral ellipsometer includes a light incident optical system for focusing a incidence spot of polarized light of multi-wavelengths onto a sample surface. A detecting optical system receives the reflected light influenced by the sample surface so that the amount of change in an elliptical polarization will be characteristic of the sample surface. A spherical prism polarizer is employed in the light incident optical system having complimentary curved light incident and light exit surfaces to enable the focusing of the incident light so that each of the ray traces of the range of wavelengths are focused at the same position on the sample surface.
摘要翻译：光谱椭偏仪包括用于将多波长的偏振光的入射点聚焦到样品表面上的光入射光学系统。检测光学系统接收由样品表面影响的反射光，使得椭圆偏振的变化量将是样品表面的特征。在具有互补的弯曲光入射和光出射表面的光入射光学系统中采用球面棱镜偏振器，以便能够聚焦入射光，使得波长范围内的每个光线迹线聚焦在样品上的相同位置表面。

3. 发明授权

US5381212A Photoreceptor for electrophotography 失效
标题翻译：电子照相感光体
公开(公告)号：US5381212A
公开(公告)日：1995-01-10
申请号：US88874
申请日：1993-07-08
申请人： Teruhiko Noguchi , Hiroshi Kinashi , Jitsuo Masuda , Katsushi Inoue , Tatsuo Tanaka , Kunio Otsuki , Kazuya Adachi
发明人： Teruhiko Noguchi , Hiroshi Kinashi , Jitsuo Masuda , Katsushi Inoue , Tatsuo Tanaka , Kunio Otsuki , Kazuya Adachi
IPC分类号： G03G5/10 , G03G15/00 , G03G21/00 , G03G21/14
CPC分类号： G03G15/5041 , G03G15/751 , G03G5/10 , G03G2215/00042
摘要： A photoreceptor having a marking area whose optical reflection property differs from that of a non-marking area is formed in a portion of a surface of an electrically conductive substrate. The average line of a vertical section of the non-marking area cut across the border line with the marking area is M.sub.0 and the average line of a vertical section of the marking area cut across the border line is N.sub.0 and that straight lines touching the average lines M.sub.0 and N.sub.0 at the intersection of M.sub.0 and N.sub.0 are tangent lines M.sub.1 and N.sub.1, respectively, the acute angle .theta. between M.sub.1 and N.sub.1 is within the range of 0.degree..ltoreq..theta..ltoreq.30.degree.. Setting the angle .theta. within this range enables a photoconductive layer of a uniform characteristic to be laminated on the electrically conductive substrate even when the marking area is formed on the surface of the substrate. With this arrangement, since information for optimizing the image quality of copies is obtained from the same location of a photoreceptor drum with reference to the marking area, a photoreceptor for electrophotography always produces copies of stable image quality.
摘要翻译：在导电性基板的表面的一部分形成有具有与非标记区域的光学反射特性不同的标记区域的感光体。跨越与标记区域的边界线切割的非标记区域的垂直部分的平均线为M0，并且跨越边界线切割的标记区域的垂直截面的平均线为N0，并且直线接触平均值 M0和N0交点处的线M0和N0分别是切线M1和N1，M1和N1之间的锐角θ在0°<30°的范围内。将角度θ设定在该范围内，即使在基板的表面上形成标记区域，也能够将均匀特性的光电导层层叠在导电性基板上。利用这种布置，由于从相对于标记区域的感光鼓的相同位置获得用于优化拷贝的图像质量的信息，所以用于电子照相的感光体总是产生稳定图像质量的副本。

4. 发明授权

US4969177A X-ray irradiation apparatus provided with irradiation range monitor 失效
标题翻译：配备有照射范围监视器的X射线照射装置
公开(公告)号：US4969177A
公开(公告)日：1990-11-06
申请号：US297759
申请日：1989-01-17
申请人： Kunio Otsuki , Yoshihiko Usui
发明人： Kunio Otsuki , Yoshihiko Usui
IPC分类号： G01N23/00 , G01N23/223 , G21K1/06
CPC分类号： G01N23/223 , G01N23/00 , G21K1/06 , G01N2223/076 , G01N2223/1016 , G01N2223/323
摘要： According to the present invention, a laser and X-rays are adapted to be coaxial to each other by the combination of a mirror and a focusing lens, whereby an X-ray irradiation position and a range thereof on an object to be subjected to the application of X-rays can be surely monitored even though the X-ray irradiation range is small.

5. 发明授权

US4594004A Continuous particulate-measuring apparatus using an optoacoustic effect 失效
标题翻译：使用光声效应的连续粒度测量仪器
公开(公告)号：US4594004A
公开(公告)日：1986-06-10
申请号：US509229
申请日：1983-06-28
申请人： Kozo Ishida , Junji Okayama , Kunio Otsuki
发明人： Kozo Ishida , Junji Okayama , Kunio Otsuki
IPC分类号： G01N21/00 , G01N21/17 , G01N29/00 , G01N21/61
CPC分类号： G01N21/1702
摘要： An apparatus for continuously measuring the concentration of particulates in a sample gas by using an optoacoustic effect. Identical laser rays are directed along two optical paths, and a chopper and an optoacoustic cell are position in the recited order in each of the optical paths. Sample gas containing particulates is introduced into one optoacoustic cell and sample gas from which the particulates have been removed is introduced into the other optoacoustic cell. The respective choppers are driven for producing a chopping action on the respective laser rays at a frequency corresponding to the resonant frequency of the corresponding optoacoustic cells, and the outputs from the cells can be compared for providing an indication of the concentration of the particulates in the sample gas.
摘要翻译：一种用于通过使用光声效应连续测量样品气体中的微粒浓度的装置。相同的激光射线沿着两个光学路径被引导，并且斩波器和光声单元在每个光路中以所述的顺序位置。将含有微粒的样品气体引入一个光声池中，将已除去微粒的样品气体引入另一个光声池中。驱动相应的斩波器，以对应于相应的光声单元的谐振频率的频率对各激光线产生斩波作用，并且可以比较来自该单元的输出，以便提供微粒的浓度的指示样气

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