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    • 2. 发明申请
    • NITRIDE SEMICONDUCTOR LASER ELEMENT
    • 氮化物半导体激光元件
    • US20100158066A1
    • 2010-06-24
    • US12716962
    • 2010-03-03
    • Tomonori MORIZUMIAtsuo MICHIUEHiroaki TAKAHASHI
    • Tomonori MORIZUMIAtsuo MICHIUEHiroaki TAKAHASHI
    • H01S5/028
    • H01S5/0281
    • A nitride semiconductor laser element includes a nitride semiconductor layer of a first conduction type, an active layer, and a nitride semiconductor layer of a second conduction type that is different from the first conduction type are laminated in that order, a cavity end face formed by the nitride semiconductor layers, and a protective film formed on the cavity end face. The nitride semiconductor layers of the first and second conduction types have layers containing Al, and the active layer has layer containing In. The protective film has a region in which an axial orientation of crystals is the same as that of the cavity end face on the nitride semiconductor layers of the first and second conduction types, and has another region in which an axial orientation of crystals is different from that of the cavity end face on the active layer.
    • 氮化物半导体激光元件包括依次层叠具有第一导电类型,有源层和与第一导电类型不同的第二导电类型的氮化物半导体层的氮化物半导体层,空腔端面由 氮化物半导体层和形成在腔体端面上的保护膜。 第一和第二导电类型的氮化物半导体层具有包含Al的层,并且活性层具有包含In的层。 保护膜具有其中晶体的轴向取向与第一和第二导电类型的氮化物半导体层上的空腔端面相同的区域,并且具有另一区域,其中晶体的轴向取向不同于 活性层上的腔端面。
    • 4. 发明申请
    • NITRIDE SEMICONDUCTOR LASER ELEMENT
    • 氮化物半导体激光元件
    • US20080304530A1
    • 2008-12-11
    • US12132880
    • 2008-06-04
    • Tomonori MORIZUMI
    • Tomonori MORIZUMI
    • H01S5/323
    • H01S5/34333B82Y20/00H01S5/028H01S5/0282H01S5/166H01S5/22
    • A nitride semiconductor laser element comprises; a nitride semiconductor layer that includes a first nitride semiconductor layer, an active layer, and a second nitride semiconductor layer, and that has a cavity with end faces, and a first protective film that is in contact with at least one end face of the cavity, wherein the first protective film has a film structure in which bright and dark parts comprising a region in contact with the active layer and a region in contact with the first and second nitride semiconductor layers are observed under scanning transmission electron microscopy, or the first protective film has a film structure in which the crystallinity at a portion adjacent to the active layer is different from that at portions adjacent to the first and second nitride semiconductor layers.
    • 氮化物半导体激光元件包括: 包括第一氮化物半导体层,有源层和第二氮化物半导体层的氮化物半导体层,并且具有端面的空腔,以及与所述空腔的至少一个端面接触的第一保护膜 其中,所述第一保护膜具有膜结构,其中在扫描透射电子显微镜下观察到包括与所述有源层接触的区域的明暗部分和与所述第一和第二氮化物半导体层接触的区域,或所述第一保护膜 膜具有膜结构,其中与有源层相邻的部分的结晶度不同于与第一和第二氮化物半导体层相邻的部分处的结晶度。