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    • 1. 发明申请
    • ANALOG/DIGITAL CONVERTER AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
    • 模拟/数字转换器和半导体集成电路器件
    • US20130049999A1
    • 2013-02-28
    • US13338338
    • 2011-12-28
    • TAKASHI OSHIMATaizo YamawakiTomomi Takahashi
    • TAKASHI OSHIMATaizo YamawakiTomomi Takahashi
    • H03M1/10
    • H03M1/1009H03M1/00H03M1/0695H03M1/1028H03M1/12H03M1/1215H03M1/804
    • A reference A/D conversion unit is connected in parallel to an input common to a time-interleaved A/D converter to be a calibration target, and the output of each unitary A/D conversion unit which makes up the time-interleaved A/D converter is calibrated in a digital region by using a low-speed high-resolution A/D conversion result output from the reference A/D conversion unit. Also, fCLK/N (fCLK represents an overall sampling rate of the time-interleaved A/D converter, and N is relatively prime to the number of unitary A/D conversion units connected in parallel M) is set as the operation clock frequency of the reference A/D conversion unit. Samplings of all unitary A/D conversion units can be sequentially synchronized with the sampling of the reference A/D conversion unit, and the operation clock frequency of the reference A/D converter can be made N times slower than the overall sampling rate of the time-interleaved A/D converter.
    • 参考A / D转换单元并联连接到时间交织的A / D转换器的公共端作为校准对象,并且构成时间交织的A / D转换单元的每个单位A / D转换单元的输出, D转换器通过使用从参考A / D转换单元输出的低速高分辨率A / D转换结果在数字区域进行校准。 另外,fCLK / N(fCLK表示时间交织的A / D转换器的总体采样率,N是并行连接的单位A / D转换单元的数量的N相对于M)被设定为操作时钟频率 参考A / D转换单元。 所有单位A / D转换单元的采样可以与参考A / D转换单元的采样顺序同步,并且参考A / D转换器的工作时钟频率可以比总的采样率慢 时间交织的A / D转换器。
    • 2. 发明授权
    • Analog/digital converter and semiconductor integrated circuit device
    • 模拟/数字转换器和半导体集成电路器件
    • US08102289B2
    • 2012-01-24
    • US12676357
    • 2009-02-19
    • Takashi OshimaTaizo YamawakiTomomi Takahashi
    • Takashi OshimaTaizo YamawakiTomomi Takahashi
    • H03M1/10
    • H03M1/1009H03M1/00H03M1/0695H03M1/1028H03M1/12H03M1/1215H03M1/804
    • In the digital calibration technique of the conventional time-interleaved analog/digital converter, it is impossible to perform highly-accurate calibration that supports a high-speed sampling rate of the next-generation application and achieves a high resolution. For its solution, a reference A/D conversion unit is connected in parallel to an input common to a time-interleaved A/D converter to be a calibration target, and the output of each unitary A/D conversion unit which makes up the time-interleaved A/D converter is calibrated in a digital region by using a low-speed high-resolution A/D conversion result output from the reference A/D conversion unit. Also, fCLK/N (fCLK represents an overall sampling rate of the time-interleaved A/D converter, and N is relatively prime to the number of unitary A/D conversion units connected in parallel M) is set as the operation clock frequency of the reference A/D conversion unit. In this configuration, samplings of all unitary A/D conversion units can be sequentially synchronized with the sampling of the reference A/D conversion unit, and the operation clock frequency of the reference A/D converter can be made N times slower than the overall sampling rate of the time-interleaved A/D converter.
    • 在传统的时间交错模拟/数字转换器的数字校准技术中,不可能执行支持下一代应用的高速采样率的高精度校准,并实现高分辨率。 对于其解决方案,参考A / D转换单元并联连接到时间交织的A / D转换器的公共端作为校准目标,并且构成时间的每个单位A / D转换单元的输出 通过使用从参考A / D转换单元输出的低速高分辨率A / D转换结果,在数字区域校准交错A / D转换器。 另外,fCLK / N(fCLK表示时间交织的A / D转换器的总体采样率,N是并行连接的单位A / D转换单元的数量的N相对于M)被设定为操作时钟频率 参考A / D转换单元。 在这种配置中,所有单位A / D转换单元的采样可以与参考A / D转换单元的采样顺序同步,并且参考A / D转换器的操作时钟频率可以比总体的N倍慢 时间交织A / D转换器的采样率。
    • 3. 发明申请
    • ANALOG/DIGITAL CONVERTER AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
    • 模拟/数字转换器和半导体集成电路器件
    • US20110128171A1
    • 2011-06-02
    • US12676357
    • 2009-02-19
    • Takashi OshimaTaizo YamawakiTomomi Takahashi
    • Takashi OshimaTaizo YamawakiTomomi Takahashi
    • H03M1/10
    • H03M1/1009H03M1/00H03M1/0695H03M1/1028H03M1/12H03M1/1215H03M1/804
    • In the digital calibration technique of the conventional time-interleaved analog/digital converter, it is impossible to perform highly-accurate calibration that supports a high-speed sampling rate of the next-generation application and achieves a high resolution. For its solution, a reference A/D conversion unit is connected in parallel to an input common to a time-interleaved A/D converter to be a calibration target, and the output of each unitary A/D conversion unit which makes up the time-interleaved A/D converter is calibrated in a digital region by using a low-speed high-resolution A/D conversion result output from the reference A/D conversion unit. Also, fCLK/N (fCLK represents an overall sampling rate of the time-interleaved A/D converter, and N is relatively prime to the number of unitary A/D conversion units connected in parallel M) is set as the operation clock frequency of the reference A/D conversion unit. In this configuration, samplings of all unitary A/D conversion units can be sequentially synchronized with the sampling of the reference A/D conversion unit, and the operation clock frequency of the reference A/D converter can be made N times slower than the overall sampling rate of the time-interleaved A/D converter.
    • 在传统的时间交错模拟/数字转换器的数字校准技术中,不可能执行支持下一代应用的高速采样率的高精度校准,并实现高分辨率。 对于其解决方案,参考A / D转换单元并联连接到时间交织的A / D转换器的公共端作为校准目标,并且构成时间的每个单位A / D转换单元的输出 通过使用从参考A / D转换单元输出的低速高分辨率A / D转换结果,在数字区域校准交错A / D转换器。 另外,fCLK / N(fCLK表示时间交织的A / D转换器的总体采样率,N是并行连接的单位A / D转换单元的数量的N相对于M)被设定为操作时钟频率 参考A / D转换单元。 在这种配置中,所有单一A / D转换单元的采样可以与参考A / D转换单元的采样顺序同步,并且参考A / D转换器的操作时钟频率可以比总体的N倍慢 时间交织A / D转换器的采样率。
    • 8. 发明授权
    • Analog-digital converter chip and RF-IC chip using the same
    • 模拟数字转换芯片和RF-IC芯片使用相同
    • US08169350B2
    • 2012-05-01
    • US12273240
    • 2008-11-18
    • Takashi OshimaTaizo Yamawaki
    • Takashi OshimaTaizo Yamawaki
    • H03M1/10H04B1/12H04B1/18
    • H03M1/122H03M1/1033H03M1/167
    • A wireless receiving circuit having an analog-digital converter of digital calibration type constituted by plural analog-digital converter units, shares portions about digital calibration, and applies the result of calibration of one analog-digital converter unit to other analog-digital converter units to appropriately perform each digital calibration of the plural analog-digital converter units. For example, in a wireless receiving circuit having an analog-digital converter of digital calibration type constituted of an analog-digital converter unit of I side and an analog-digital converter unit of Q side, portions about digital calibration are shared, and a calibration result of I side is applied to Q side.
    • 一种无线接收电路,具有由多个模拟数字转换器单元构成的具有数字校准类型的模拟数字转换器,共享关于数字校准的部分,并将一个模拟数字转换器单元的校准结果应用于其它模数转换器单元, 适当地执行多个模拟数字转换器单元的每个数字校准。 例如,在具有由I侧的模拟数字转换器单元和Q侧的模拟数字转换器单元构成的数字校准类型的模拟数字转换器的无线接收电路中,共享关于数字校准的部分,并且校准 我方的结果适用于Q方。
    • 9. 发明授权
    • Digital calibration type analog-to-digital converter and wireless receiver circuit and wireless transceiver circuit using the same
    • 数字校准型模数转换器和无线接收器电路和无线收发电路使用相同
    • US08004445B2
    • 2011-08-23
    • US12720669
    • 2010-03-10
    • Takashi OshimaTaizo Yamawaki
    • Takashi OshimaTaizo Yamawaki
    • H03M1/34
    • H03M1/1004H03M1/002H03M1/005H03M1/1009H03M1/126H03M1/44
    • In a wireless chip receiving the multi-rate data according to the related art, power consumption and a circuit area of an analog-to-digital converter become large. In a digital calibration type analog-to-digital converter including both a reference analog-to-digital conversion unit and a main analog-to-digital conversion unit, when processing the high-sample rate wireless receive signal, both the reference analog-to-digital conversion unit and the main analog-to-digital conversion unit are operated to configure a general digital calibration type analog-to-digital converter, and when processing a low-sample rate wireless receive signal, analog-to-digital conversion is performed by using the reference analog-to-digital conversion unit and operations of the main analog-to-digital conversion unit or the like are stopped to remarkably reduce power consumption.
    • 在接收根据现有技术的多速率数据的无线芯片中,功率消耗和模数转换器的电路面积变大。 在包括参考模数转换单元和主模数转换单元的数字校准类型模数转换器中,当处理高抽样率无线接收信号时,参考模拟到数字转换单元 操作数字转换单元和主模拟 - 数字转换单元来配置通用数字校准类型模数转换器,并且当处理低采样率无线接收信号时,执行模拟 - 数字转换 通过使用参考模数转换单元,并且停止主模数转换单元等的操作以显着地降低功耗。
    • 10. 发明申请
    • DCDC converter unit, power amplifier, and base station using the same
    • DCDC转换器单元,功率放大器以及使用其的基站
    • US20090011728A1
    • 2009-01-08
    • US12216092
    • 2008-06-30
    • Takashi KawamotoTakashi OshimaTaizo YamawakiManabu Nakamura
    • Takashi KawamotoTakashi OshimaTaizo YamawakiManabu Nakamura
    • H03F1/02H04B1/04
    • H03F1/0227H03F1/0205H03F1/32H03F3/24H03F2200/102H03F2200/99
    • A DCDC converter includes a signal splitting unit that splits an input signal into N signal components; N DCDC converter elements that process individually the N split signals; and an adder that adds outputs from the plural DCDC converter elements to generate output signals. Each of the DCDC converter elements has an operation band narrower than an applicable frequency band of the input signal, and selects a design parameter that allows a conversion efficiency of the DCDC converter elements to be optimized for any band of the applicable frequency bands. For example, the parameter of a PMOS transistor and a NMOS transistor, which configure an inverter is designed to optimize the efficiency at any of frequency bands. The frequency band of the input signal is split, and each of the split outputs is input to a DCDC converter element that has a corresponding frequency and high efficiency characteristic.
    • DCDC转换器包括将输入信号分解为N个信号分量的信号分离单元; N个DCDC转换器元件,分别处理N个分离信号; 以及加法器,其添加来自多个DCDC转换器元件的输出以产生输出信号。 每个DCDC转换器元件具有比输入信号的适用频带窄的操作频带,并且选择允许DCDC转换器元件的转换效率针对适用频带的任何频带进行优化的设计参数。 例如,配置反相器的PMOS晶体管和NMOS晶体管的参数被设计为优化任何频带处的效率。 输入信号的频带被分离,并且每个分离输出被输入到具有对应的频率和高效率特性的DCDC转换器元件。