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    • 6. 发明授权
    • Embedded testing capability for integrated serializer/deserializers
    • 集成串行器/解串器的嵌入式测试功能
    • US07343535B2
    • 2008-03-11
    • US10068326
    • 2002-02-06
    • Benny W. H. Lai
    • Benny W. H. Lai
    • G01R31/28H04B3/46
    • G11C29/56G01R31/317G01R31/31715G01R31/31723G01R31/31724G01R31/31813G11C29/48
    • Testing capability for an integrated circuit having more than one serializer/deserializer (SERDES) block includes embedding a tester within each block, so that the blocks can be tested independently and concurrently. In one embodiment, a tester includes a functional test controller (FTC) for mode setting and a functional test interface (FTI) for implementing the test procedures. The FTI of each tester is inserted between the SERDES of the same block and core processing logic that is also embedded within the integrated circuit. The FTCs are all interconnected via a test bus that is connected to an input/output controller (IOC) for communication between the testers and an external source, such as a personal computer. Optionally, a built-in-self-tester (BIST) state machine is connected to the test bus.
    • 具有多个串行器/解串器(SERDES)块的集成电路的测试功能包括在每个块内嵌入一个测试仪,以便可以独立且同时测试这些模块。 在一个实施例中,测试器包括用于模式设置的功能测试控制器(FTC)和用于实现测试过程的功能测试接口(FTI)。 每个测试仪的FTI插入同一块的SERDES和嵌入在集成电路中的核心处理逻辑之间。 FTC都通过连接到输入/输出控制器(IOC)的测试总线相互连接,用于测试仪和外部源(如个人计算机)之间的通信。 可选地,内置自测试器(BIST)状态机连接到测试总线。
    • 8. 发明授权
    • Parallel automatic synchronization system (PASS)
    • 并行自动同步系统(PASS)
    • US06700942B1
    • 2004-03-02
    • US09343312
    • 1999-06-30
    • Benny W. H. Lai
    • Benny W. H. Lai
    • H04L700
    • H04L25/14H04L7/0008H04L7/0041
    • A parallel automatic synchronization system includes a variable delay devices for receiving and variably delaying N parallel transmitted channel data words over repetitive clock cycles in response to a synchronization latch clock and for synchronously clocking out the parallel data words by a local reference clock (FREF); sync logic devices for receiving repetitive control clocks corresponding to the transmitted channel data words, including a remote recovered clock (FFRM) and the local reference clock (FREF) and for generating the synchronization latch clock which determines the delay position of the variable delay of the delay devices; and output latch devices for clocking out the parallel data words from the variable delay devices with the local reference clock (FREF).
    • 并行自动同步系统包括可变延迟装置,用于响应于同步锁存时钟在重复时钟周期上接收和可变地延迟N个并行发送的信道数据字,并用于通过本地参考时钟(FREF)同步计时并行数据字; 同步逻辑设备,用于接收对应于所发送的信道数据字的重复控制时钟,包括远程恢复时钟(FFRM)和本地参考时钟(FREF),并用于产生同步锁存时钟,其确定可变延迟的延迟位置 延迟装置; 并输出锁存器件,用于使用本地参考时钟(FREF)从可变延迟器件中计时并行数据字。
    • 9. 发明授权
    • System for clock and data recovery for multi-channel parallel data streams
    • 用于多通道并行数据流的时钟和数据恢复系统
    • US06526112B1
    • 2003-02-25
    • US09342297
    • 1999-06-29
    • Benny W. H. Lai
    • Benny W. H. Lai
    • H03D2300
    • H03L7/0805H03L7/07H03L2207/06H04L7/033H04L25/14
    • The present invention provides independent CDR (clock and data recovery) functions on N number of high speed parallel channels, yet only requiring one capacitor. This enables multiple independent CDR channels to be integrated onto one IC with a minimum overhead component of one capacitor. In one embodiment, the present invention provides a multiple channel clock and data recovery system which includes N phase lock loop circuits for receiving in parallel N data channels, each of the N phase lock loop circuits including a digital phase detector and a dual-input VCO in which one VCO input is an analog input for setting the center frequency of the VCO and the other VCO input is a digital input from the respective phase detector for toggling the center frequency and wherein each phase detector compares the phase of the respective incoming data channel with that of the respective VCO output. The system further includes a first phase lock loop circuit of the N phase lock loop circuits further including an integrator having a single capacitor, the integrator connected between the output of the first phase detector and the analog input of the respective first VCO wherein the output of the first phase detector is input to the integrator, the output of the integrator is also input to the remaining analog inputs of the other VCOs such that the remaining phase lock loop circuits are slaved to the first phase lock loop circuit.
    • 本发明在N个高速并行信道上提供独立的CDR(时钟和数据恢复)功能,但仅需要一个电容器。 这使得多个独立CDR信道可以集成到一个IC上,同时具有一个电容器的最小开销成分。 在一个实施例中,本发明提供一种多通道时钟和数据恢复系统,其包括用于并行接收N个数据通道的N个锁相环电路,N个锁相环电路中的每一个包括数字相位检测器和双输入VCO 其中一个VCO输入是用于设置VCO的中心频率的模拟输入,另一个VCO输入是来自各个相位检测器的用于切换中心频率的数字输入,并且其中每个相位检测器比较各个输入数据信道的相位 与相应的VCO输出。 该系统还包括N个锁相环电路的第一锁相环电路,还包括具有单个电容器的积分器,该积分器连接在第一相位检测器的输出端和相应第一VCO的模拟输入端之间, 第一相位检测器被输入到积分器,积分器的输出也被输入到其它VCO的剩余模拟输入,使得剩余的锁相环电路从动到第一锁相环电路。