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    • 6. 发明申请
    • METHOD AND APPARATUS FOR ANALYZING A TARGET MATERIAL
    • 用于分析目标材料的方法和装置
    • US20160187290A1
    • 2016-06-30
    • US15063095
    • 2016-03-07
    • THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
    • Jean-Pierre Leburton
    • G01N27/414G01N33/487G01N27/447
    • G01N33/48721G01N27/447G01N27/4473G01N2030/8827
    • Aspects of the subject disclosure may include, for example, an apparatus having a material having a through-hole, a gate coupled to the material for controlling a charge concentration of the material, a sensor, and a controller coupled to the material, the gate and the sensor. The controller can perform operations including applying a first voltage potential to the material to induce a flow of current in the material, applying a second voltage potential to the gate to adjust the charge concentration of the material, and receiving sensing data from the sensor responsive to a change in electrical properties of the material caused by a target traversing the first through-hole of the material. The through-hole causes a plurality of structural portions of the target to be misaligned with a direction of the flow current in the material. Additional embodiments are disclosed.
    • 本公开的方面可以包括例如具有通孔的材料的装置,与材料相连的栅极,用于控制材料的电荷浓度,传感器和耦合到该材料的控制器,栅极 和传感器。 控制器可以执行操作,包括向材料施加第一电压电位以引起材料中的电流流动,向栅极施加第二电压电位以调整材料的电荷浓度,以及响应于来自传感器的传感器数据接收 由穿过材料的第一通孔的目标引起的材料的电性能的变化。 通孔使靶的多个结构部分与材料中的流动流的方向不对准。 公开了另外的实施例。