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    • 9. 发明授权
    • Dynamic semiconductor memory device
    • 动态半导体存储器件
    • US6151244A
    • 2000-11-21
    • US176029
    • 1998-10-21
    • Takeshi FujinoKazutami Arimoto
    • Takeshi FujinoKazutami Arimoto
    • H01L21/8247G11C11/401G11C11/4074H01L27/115H01L29/788H01L29/792G11C11/24
    • G11C11/401G11C11/4074
    • Memory cell minimum units (MCU) formed of multi-bit one transistor/one capacitor type memory cells are repeatedly arranged in a column direction, and bit line contacts (BCT) are shifted in the column direction relative to a row direction. The bit line contacts are repeatedly shifted with a prescribed number of bit lines as a unit. A set of a read bit line onto which memory cell data are read and a reference bit line supplying a reference potential can be obtained by controlling the voltage of cell plate lines and bit lines for each set of bit lines. Accordingly, a memory cell occupation area can be reduced and sensing operation in the folded bit line arrangement is possible. Consequently, a memory cell occupation area per one bit can be dramatically reduced and sensing operation in the folded bit line arrangement can be performed.
    • 由多位一晶体管/一电容型存储单元形成的存储单元最小单元(MCU)沿列方向重复排列,并且位线接触(BCT)相对于行方向在列方向上偏移。 位线接点以规定数量的位线为单位重复移位。 通过控制每组位线的单元板线和位线的电压,可以获得读取存储单元数据的读取位线和提供参考电位的参考位线的集合。 因此,可以减小存储器单元占用面积,并且折叠位线布置中的感测操作是可能的。 因此,可以显着减少每一位的存储单元占用面积,并且可以执行折叠位线布置中的感测操作。