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    • 6. 发明申请
    • POINTING DEVICE
    • 指点设备
    • US20080204761A1
    • 2008-08-28
    • US12036098
    • 2008-02-22
    • Nobutaka Itagaki
    • Nobutaka Itagaki
    • G01B9/02
    • G06F3/0317G02B27/48
    • There is provided a pointing device including a light source that provides incident light for illuminating a front surface of a substrate at a predetermined angle of incidence, the substrate having a rear surface as well as the front surface and being transparent to the wavelength of the incident light, a detector that detects the intensity of speckle light from the front and rear surfaces, the speckle light generated from the incident light, and legs that are in contact with the substrate and charge the front surface of the substrate through friction between the legs and the substrate.
    • 提供了一种指示装置,包括:光源,其以预定入射角提供用于照射基板的前表面的入射光,所述基板具有后表面以及前表面,并且对于事件的波长是透明的 光,检测器,其检测来自前表面和后表面的斑点光的强度,从入射光产生的散斑光,以及与基底接触的腿,并通过腿和腿之间的摩擦对基底的前表面充电 底物。
    • 7. 发明申请
    • POINTING DEVICE
    • 指点设备
    • US20070291272A1
    • 2007-12-20
    • US11765626
    • 2007-06-20
    • Nobutaka Itagaki
    • Nobutaka Itagaki
    • G01B9/02
    • G06F3/0317
    • A pointing device includes a light source, an aperture member, and a detector. The light source provides incident light for illuminating an obverse surface of a plate at a predetermined incident angle. The plate has the obverse surface and a reverse surface and is transparent to the wavelength of the incident light. The aperture member has an opening through which speckle light from the obverse surface and speckle light from the reverse surface pass. The speckle light results from the incident light. The detector detects the intensity of the speckle light passing through the opening. In order that the speckle light from the obverse surface and the speckle light from the reverse surface overlap each other at the detector, the opening has a longitudinal dimension in a direction in which the incident angle is formed.
    • 指示装置包括光源,孔径构件和检测器。 光源提供用于以预定入射角照射板的正面的入射光。 该板具有正面和反面,对入射光的波长透明。 孔径构件具有开口,通过该开口,来自正面的斑点光和来自反面的斑点光通过。 斑点光源自入射光。 检测器检测通过开口的斑点光的强度。 为了使来自正面的斑点光和来自反面的散斑光在检测器处彼此重叠,开口在形成入射角的方向上具有纵向尺寸。
    • 8. 发明授权
    • Particle detection apparatus and particle detection method used therefor
    • 用于其的粒子检测装置和粒子检测方法
    • US07292338B2
    • 2007-11-06
    • US11509168
    • 2006-08-24
    • Nobutaka Itagaki
    • Nobutaka Itagaki
    • G01N21/00
    • G01N15/1463A47L9/2815A47L9/2842G01N1/2202G01N1/24G01N15/1459G01N2015/1075G01N2015/1497
    • A particle detection apparatus and a detection method used therefor, which can detect dust, pollen and smoke particles at a high sensitivity with a sufficiently simple configuration. A particle detection apparatus has a light source and a detection device for detecting light from the light source, and detects particles floating in the air at a position through which the light passes. The apparatus further has an airflow generation/control device capable of controlling an airflow of the air present in the light passing position so as to keep the airflow constant or nearly zero, and an image sensor is used as a photodetector of the detection device. Predefined particles are identified from image information including a moving speed, a size and a shape of a moving object detected by the image sensor.
    • 一种粒子检测装置及其检测方法,其以足够简单的结构以高灵敏度检测灰尘,花粉和烟雾颗粒。 粒子检测装置具有用于检测来自光源的光的光源和检测装置,并且检测在光通过的位置上漂浮在空气中的粒子。 该装置还具有气流发生/控制装置,其能够控制存在于光通过位置中的空气的气流,以保持气流恒定或接近零,并且使用图像传感器作为检测装置的光电检测器。 从包括图像传感器检测到的移动物体的移动速度,大小和形状的图像信息中识别预定粒子。
    • 9. 发明申请
    • Method and apparatus for inspecting array substrate
    • 用于检查阵列基板的方法和装置
    • US20060125512A1
    • 2006-06-15
    • US11296956
    • 2005-12-08
    • Nobutaka ItagakiHideyuki Norimatsu
    • Nobutaka ItagakiHideyuki Norimatsu
    • G01R31/00
    • G09G3/006G09G2300/08
    • A method for inspecting an active-matrix-display-panel array substrate includes: a first step of applying a voltage V1 to the data terminal of a transistor while the transistor conducts, bringing the transistor into a non-conductive state, applying a voltage V1+ΔV to the data terminal, bringing the transistor into a conductive state, and measuring charge ΔQ; a second step of applying a voltage V0 to the data terminal when the transistor does not conduct and the data terminal voltage is V3, and measuring a voltage Q1 flowing through the transistor when the transistor conducts; a third step of applying a voltage V0′ to the data terminal when the transistor does not conduct and the data terminal voltage is V4, and measuring charge Q2 flowing when the transistor conducts; and a fourth step of determining a capacitance of the capacitor based on ΔV, ΔQ, V0, V0′, V3, V4, Q1, and Q2.
    • 一种用于检查有源矩阵显示面板阵列基板的方法包括:第一步骤,当晶体管导通时,向晶体管的数据端施加电压V 1,使晶体管成为非晶体管, 导通状态,向数据端子施加电压V 1 +ΔVV,使晶体管进入导通状态,测量电荷DeltaQ; 当晶体管不导通并且数据端子电压为V 3时,向数据端子施加电压V 0 <0>的第二步骤,并且测量电压Q < 1晶体管在晶体管导通时流过晶体管; 当晶体管不导通并且数据端子电压为V 4时,向数据端子施加电压V 0 <0>的第三步骤,并且测量电荷Q < 2 在晶体管导通时流动; 以及第四步骤,基于DeltaV,DeltaQ,V 0,V 0,V 3,V 3,V 3, SUB> 4 ,Q 1和Q 2。
    • 10. 发明授权
    • Method for testing a TFT array
    • TFT阵列测试方法
    • US07012445B2
    • 2006-03-14
    • US11003166
    • 2004-12-03
    • Nobutaka Itagaki
    • Nobutaka Itagaki
    • G01R31/00
    • G09G3/006G09G3/20G09G2300/0809
    • A method for testing a TFT array that comprises one or a plurality of first pixels including capacitors connected to one terminal of pixel selection switches, one or a plurality of second pixels including capacitors connected to one terminal of pixel selection switches, and data lines connected to the other terminals of the pixel selection switches of the first pixels and the other terminals of the pixel selection switches of the second pixels, wherein the method for testing comprises a step for charging the capacitors of the first pixels to a first voltage, a step for charging the capacitors of the second pixels to a second voltage, a step for turning on both the pixel selection switches of the first pixels and the pixel selection switches of the second pixels, and a step for measuring either one or both of the voltage of a data line or the charge flowing through the data line.
    • 一种用于测试TFT阵列的方法,所述TFT阵列包括一个或多个第一像素,包括连接到像素选择开关的一个端子的电容器,包括连接到像素选择开关的一个端子的电容器的一个或多个第二像素,以及连接到 第二像素的像素选择开关的第一像素和其他端子的像素选择开关的其他端子,其中测试方法包括将第一像素的电容器充电到第一电压的步骤,步骤 将第二像素的电容器充电到第二电压,用于接通第一像素的像素选择开关和第二像素的像素选择开关的步骤,以及用于测量第二像素的电压中的任一个或两者的步骤 数据线或流经数据线的电荷。