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    • 9. 发明申请
    • METHOD OF FORMING METAL FILM
    • 形成金属膜的方法
    • US20090022891A1
    • 2009-01-22
    • US12278445
    • 2006-07-27
    • Tatsuya SakaiYasuo MatsukiKazuo Kawaguchi
    • Tatsuya SakaiYasuo MatsukiKazuo Kawaguchi
    • C23C16/06
    • C23C16/16C23C16/4485H01L21/28556H01L21/76843H01L21/76846H01L21/76873
    • A method of forming a metal film, comprising the steps of: sublimating at least one metal compound selected from the group consisting of a cobalt compound, a ruthenium compound and a tungsten compound from a substrate having the above metal compound film formed thereon; and supplying the sublimated gas to a substrate for forming a metal film to decompose the gas, thereby forming a metal film on the surface of the first substrate. A method of forming a metal film which serves as a seed layer when a metal, especially copper is to be filled into the trenches of a substrate as an insulator by plating and as a barrier layer for preventing the migration of metal atoms to an insulating film when the substrate has no barrier layer and has excellent adhesion to the insulator.
    • 一种形成金属膜的方法,包括以下步骤:从其上形成有上述金属化合物膜的基材升华至少一种选自钴化合物,钌化合物和钨化合物的金属化合物; 并将升华的气体供给到用于形成金属膜的基板以分解气体,从而在第一基板的表面上形成金属膜。 当金属,特别是铜通过电镀填充到作为绝缘体的基板的沟槽中时,形成用作种子层的金属膜的方法以及用于防止金属原子迁移到绝缘膜的阻挡层 当基板没有阻挡层并且对绝缘体具有优异的粘合性时。