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    • 2. 发明授权
    • Distance measuring apparatus and method using a pulsed electromagnetic wave
    • 使用脉冲电磁波的距离测量装置和方法
    • US06829042B1
    • 2004-12-07
    • US10446779
    • 2003-05-29
    • Tatsuya HondaKazunari YoshimuraKuninori Nakamura
    • Tatsuya HondaKazunari YoshimuraKuninori Nakamura
    • G01C308
    • G01S17/105G01S7/4818
    • Distance measuring apparatus and method using a pulsed electromagnetic wave for making a high speed precise distance measurement between the apparatus and an object over a small distance. The electromagnetic wave is projected to an object from a single projector to provide a reflected electromagnetic wave from the object that is received by a single receiver also receiving a reference electromagnetic wave branched from the projected electromagnetic wave. The reference-wave reception time at the receiver is delayed by a delay time, so that a first time period between the electromagnetic wave projection time and the reference-wave reception time is longer than a second time period between the projection time and a reflection-wave reception time at the receiver. The distance is determined according to the delay time and the time difference between the reference-wave reception time and the reflection-wave reception time.
    • 使用脉冲电磁波的距离测量装置和方法,用于在远距离的设备和物体之间进行高速精确的距离测量。 电磁波被投射到来自单个投影仪的物体,以提供来自被接收的物体的反射电磁波,该单个接收器也接收从投射的电磁波分支的参考电磁波。 接收机的基准波接收时间延迟延迟时间,使得电磁波投影时间与基准波接收时间之间的第一时间段比投影时间和反射时间之间的第二时间长, 在接收机的波接收时间。 该距离根据延迟时间和参考波接收时间与反射波接收时间之间的时间差来确定。
    • 3. 发明授权
    • Method and device for detecting a shape of object with high resolution
measurement of displacement of an object surface from a reference plane
    • 用于通过高分辨率测量物体表面从参考平面的位移来检测物体的形状的方法和装置
    • US5606174A
    • 1997-02-25
    • US434345
    • 1995-05-02
    • Kazunari YoshimuraKuninori NakamuraKatsuji Komaki
    • Kazunari YoshimuraKuninori NakamuraKatsuji Komaki
    • G01B9/02G01B11/24G01B11/245G01C3/06G01N21/86
    • G01B11/24
    • An arrangement for detecting a shape of object to measure any displacement of its surface from a reference plane with a high resolution, and to improve to precision of the measurement. This is attained by irradiating a projected light beam from a light source on a subject the light beam being deflected by a vibration mirror and passed through a light projecting lens for scanning projected light spots, by providing a light receiving lens with its optical axis within a scanning plane of the projected light beam while arranging first photosensors on an image plane of the light receiving lens for detection of the position of the projected light beam with the first photosensors, and obtaining with a distance operator a time difference between a first time when an image of a spot with respect to the subject to detect passes through any one of the first photosensors and a second time when the projected light beam passes through one of second photosensors provided to set a reference plane and corresponding to one of the first photosensors upon irradiation of the projected light beam upon the reference plane, for conversion of this time difference into a displacement of the surface of the subject to detect with respect to the reference plane.
    • 用于检测物体的形状的装置,以测量其表面与基准平面之间的高分辨率的位移,并提高测量精度。 这是通过将来自光源的投射光束照射在被摄体上,通过将振动镜偏转的光束照射到通过用于扫描投影光斑的光投射透镜的光投射透镜上,通过将光轴接收到其内的光轴 同时在光接收透镜的图像平面上布置第一光电传感器,用于检测投影光束与第一光传感器的位置,并且以距离算子获得第一时间之间的时间差, 相对于被检体的斑点的图像通过第一光敏传感器中的任何一个,并且当投影光束通过设置成设置参考平面并且在照射时对应于第一光电传感器中的一个的第二光电传感器中的一个的第二次 的投影光束在参考平面上,用于将该时间差转换成s的位移 主体的表面相对于参考平面检测。
    • 4. 发明授权
    • Optical measurement system determination of an object profile
    • 光学测量系统确定对象轮廓
    • US5111056A
    • 1992-05-05
    • US684121
    • 1991-04-12
    • Kazunari YoshimuraKuninori Nakamura
    • Kazunari YoshimuraKuninori Nakamura
    • G01B11/24
    • G01B11/24
    • An optical measurement system for determination of an object profile includes a light source for emitting a light beam, light directing means for directing the light beam to scan a surface of the object surface and for directing a reflected light beam from the object surface in a direction angled from that of the light beam incident to the surface. The reflected light beam is received at position detecting means to provide position data with respect to the individual scanned points on the object surface. The position data is analyzed to measure a series of distances to the individual scanned points on the object surface to obtain from the measured distances height data of the individual scanned points and to determine an object profile along the scanned point on the object surface. The light directing means comprises a single deflector which deflects the light beam onto the object for scanning the object surface thereby, a first projecting lens interposed between the deflector and the object to project the light beam on the object surface, and a second receiving lens offset from the first projecting lens and interposed between the object surface and the common deflector to converge the reflected beam from the object surface on the light receiving elements. The deflector is in the form of a planar vibration mirror upon which the light beam from the light source and the reflected light beam from the object surface are incident.
    • 用于确定物体轮廓的光学测量系统包括用于发射光束的光源,用于引导光束扫描物体表面的光引导装置,以及用于将来自物体表面的反射光束沿着方向 与入射到表面的光束的角成角度。 在位置检测装置处接收反射光束,以提供关于物体表面上的各个扫描点的位置数据。 分析位置数据以测量到物体表面上的各个扫描点的一系列距离,以从测量的距离获得各个扫描点的高度数据,并且沿物体表面上的扫描点确定物体轮廓。 光引导装置包括单个偏转器,其将光束偏转到物体上用于扫描物体表面,从而插入在偏转器和物体之间的第一投影透镜,以将光束投射在物体表面上,以及第二接收透镜偏移 从第一投影透镜放置在物体表面和公共偏转器之间,以将来自物体表面的反射光束会聚在光接收元件上。 偏转器是平面振镜的形式,来自光源的光束和来自物体表面的反射光束入射。
    • 5. 发明授权
    • Image processing process
    • 图像处理过程
    • US5946029A
    • 1999-08-31
    • US867101
    • 1997-06-02
    • Kazunari YoshimuraRyosuke MitakaKuninori NakamuraYasuyuki Yuki
    • Kazunari YoshimuraRyosuke MitakaKuninori NakamuraYasuyuki Yuki
    • G01B11/26G01B11/30G01N21/88H04N7/18
    • G01B11/303G01N21/8806H04N7/18
    • An image processing process disposes a television (TV) camera for observing a direct reflection of an incident light in a direction substantially coinciding with rolling direction of such detection object as a laminating substrate or the like, and observes a direct reflection component of the light with mutual positional relationship between the TV camera, object and a light source varied. Measuring thus sequentially the brightness with the angle of incident light varied, a lighting angle at which the brightness of reflection is the largest, that is, an incident angle of direct reflection light is obtained with respect to respective measuring points on the object, and an image representing a distribution of incident angles of the direction reflection light can be obtained by obtaining the incident angles of the direct reflection light with respect to the whole points on the detection object.
    • 图像处理处理方法将用于观察入射光的直接反射的方式配置在与检测对象的滚动方向大致一致的方向上作为层叠基板等的电视(TV)照相机,并且观察光的直接反射分量 电视摄像机,物体和光源之间的相互位置关系各不相同。 以入射光的角度依次测量亮度随着物体的各个测量点的变化而得到反射亮度最大的照明角度,即直接反射光的入射角, 可以通过获得相对于检测对象上的整个点的直接反射光的入射角度来获得表示方向反射光的入射角的分布的图像。
    • 6. 发明授权
    • Method of determination of a three-dimensional profile of an object
    • 确定物体的三维轮廓的方法
    • US5416591A
    • 1995-05-16
    • US079595
    • 1993-06-22
    • Kazunari YoshimuraKuninori Nakamura
    • Kazunari YoshimuraKuninori Nakamura
    • G01B11/24G01B11/00G01B11/25G01C3/06G06T1/00G06T7/00G01B11/02G01B11/28
    • G01B11/2518
    • A light beam is emitted to a target point on a target, so that the reflected light beam from the target point forms an illumination spot on a array sensor. The array sensor comprises a plurality of light receiving elements. The receiving elements are divided into a plurality of repeating units consisting of the same number of the receiving elements. The receiving elements in each of the repeating units are assigned respectively to different indexes. The receiving elements having the same index are commonly coupled so as to provide a single output indicative of the same index when the reflected light beam hits any one of the receiving elements. A method for determination of a three-dimensional profile of an object includes a first step of detecting a series of reference spots on the array sensor with respect to individual points obtained by scanning the light beam on a reference surface, and defining detection ranges respectively with respect to the individual reference spots, and a second step of detecting within the detection ranges a series of object spots obtained by scanning the light beam on an object surface and analyzing a positional deviation between the object spot and the corresponding reference spot within each of the detection range to determine the three-dimensional profile of the object in accordance with thus obtained positional deviations.
    • 光束被发射到目标上的目标点,使得来自目标点的反射光束在阵列传感器上形成照明点。 阵列传感器包括多个光接收元件。 接收元件被分成由相同数量的接收元件组成的多个重复单元。 每个重复单元中的接收元件分别被分配给不同的索引。 具有相同索引的接收元件通常耦合,以便当反射光束击中任何一个接收元件时提供指示相同索引的单个输出。 用于确定物体的三维轮廓的方法包括:第一步骤,相对于通过在参考表面上扫描光束获得的各个点检测阵列传感器上的一系列参考点,并且分别定义检测范围 并且在检测范围内检测通过在物体表面上扫描光束而获得的一系列物体点,并且分析每个对象点内的对象点和对应参考点之间的位置偏差的第二步骤 检测范围,以根据由此获得的位置偏差来确定物体的三维轮廓。
    • 8. 发明授权
    • Method for shape detection and apparatus therefor
    • 形状检测方法及其设备
    • US5444537A
    • 1995-08-22
    • US138191
    • 1993-10-20
    • Kazunari YoshimuraKuninori Nakamura
    • Kazunari YoshimuraKuninori Nakamura
    • G01B11/24G01B11/245G01C3/06
    • G01B11/24
    • A shape detecting arrangement allows a shape of an object to be very precisely detected at a high resolution, by projecting a plurality of light beams in mutually different ways onto an identical spot of the object substantially in an identical direction, forming on a position detector images of beams of the projected beams reflected back from the object, obtaining a ratio of intensity of the reflected beams by virtue of outputs from the position detector, obtaining positions of the respective reflected beams by virtue of variation component of the ratio of intensity with respect to a reference plane for detecting the position of the object, and finally obtaining height displacement of the respective positions obtained with respect to the reference plane on the basis of the positions and angles of incidence of the reflected beams into the position detector.
    • 形状检测装置允许以高分辨率非常精确地检测物体的形状,通过以相互不同的方式将多个光束投影到基本上沿相同方向的物体的相同点上,形成在位置检测器图像 从物体反射的投影光束的光束,借助于来自位置检测器的输出获得反射光束的强度比,通过强度比相对于 用于检测物体的位置的基准平面,并且基于将反射光束入射到位置检测器中的位置和入射角度,最终获得相对于参考平面获得的各个位置的高度位移。
    • 10. 发明申请
    • ALTERNATING CURRENT DETECTION COIL
    • 交流电流检测线圈
    • US20070152651A1
    • 2007-07-05
    • US11562005
    • 2006-11-21
    • Akimi ShiokawaEiji IwamiYasuo IchimuraAkihiro IshibashiKazunari Yoshimura
    • Akimi ShiokawaEiji IwamiYasuo IchimuraAkihiro IshibashiKazunari Yoshimura
    • G01R19/00
    • H01F5/003G01R15/181
    • The alternating current detection coil is a toroidal coil, and comprises plural radial-line conductors which are formed on a front face and a rear face of a substrate, conductive connection parts and conductive through-holes which connect electrically each end of radial-line conductors, wherein plural winding turns are consecutively formed by a connection of each radial-line conductor on the front face and the rear face respectively, the winding turns comprise a forward coil and a backward coil, and each shape on the front face and the rear face of the radial-line conductors and the conductive connection parts are identical with each other. Consequently, when seen from a thickness direction of the substrate, areas of the forward coil and the backward coil are equal to each other, and an external magnetic field, which does not need to be detected, can be canceled each other by the forward coil and the backward coil, then a current detection accuracy can be improved.
    • 交流检测线圈是环形线圈,并且包括形成在基板的正面和背面上的多个径向线导体,导电连接部分和导电通孔,其将径向线导体 其中,多个绕组匝分别通过前面和后表面上的每个径向线导体的连接而形成,匝数包括前线圈和后线圈,并且每个形状在前表面和后表面 的径向线导体和导电连接部分彼此相同。 因此,当从基板的厚度方向观察时,正向线圈和后向线圈的面积彼此相等,并且不需要检测的外部磁场可以通过正向线圈相互抵消 和后退线圈,则可以提高电流检测精度。