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    • 3. 发明申请
    • SPECTROMETER
    • 光谱仪
    • US20120133948A1
    • 2012-05-31
    • US13227758
    • 2011-09-08
    • Tatsuaki FUNAMOTO
    • Tatsuaki FUNAMOTO
    • G01J3/45
    • G01J3/0229G01J3/0205G01J3/0208G01J3/021G01J3/027G01J3/0291G01J3/10G01J3/26G01J3/32
    • A spectrometer includes: a tungsten lamp which emits light with no peak wavelength within a wavelength range of visible light and having a light amount increasing as the wavelength becomes longer; a violet LED which emits light having a peak wavelength within the wavelength range of visible light; a light mixer which mixes light emitted from the tungsten lamp and the violet LED; an etalon which receives light mixed by the light mixer and transmits light contained in the received mixed light and having a particular wavelength; a light receiving unit which receives light transmitted by the etalon; and a measurement control unit which changes the wavelength of light that can pass through the etalon and measures spectral characteristics of the light having passed through the etalon based on the light received by the light receiving unit.
    • 光谱仪包括:在可见光的波长范围内发射没有峰值波长的光并随着波长变长而光量增加的钨灯; 发出在可见光的波长范围内具有峰值波长的光的紫色LED; 将来自钨灯发出的光与紫色LED混合的光混合器; 接收由所述光混合器混合并发射包含在所述混合光中并具有特定波长的光的标准准则; 接收由标准具传输的光的光接收单元; 以及测量控制单元,其改变可以通过标准具的光的波长,并且基于由光接收单元接收的光来测量已经通过标准具的光的光谱特性。
    • 5. 发明申请
    • SPECTROSCOPIC MEASUREMENT DEVICE, AND SPECTROSCOPIC MEASUREMENT METHOD
    • 光谱测量装置和光谱测量方法
    • US20130070247A1
    • 2013-03-21
    • US13606813
    • 2012-09-07
    • Tatsuaki FUNAMOTO
    • Tatsuaki FUNAMOTO
    • G01J3/51
    • G01J3/26G01J3/027G02B26/001
    • A spectroscopic measurement device includes a variable wavelength interference filter having a stationary reflecting film, a movable reflecting film, and an electrostatic actuator adapted to vary the gap amount of the inter-reflecting film gap in accordance with a voltage applied thereto, a detector adapted to detect the light intensity of the light, and a control circuit section adapted to measure the dispersion spectrum of the measurement object light, the control circuit section includes a peak detection section adapted to detect a peak-corresponding gap amount, a filter drive section that varies the gap amount to the constant interval gap amounts and the peak-corresponding gap amount in a stepwise manner, and a spectroscopic measurement section that obtains the light intensities corresponding respectively to the constant interval gap amounts and the peak-corresponding gap amount.
    • 光谱测量装置包括具有静止反射膜的可变波长干涉滤光器,可移动反射膜和适于根据施加到其上的电压改变反射膜间隙的间隙量的静电致动器,适于 检测光的光强度,以及适于测量被测物体光的色散谱的控制电路部分,所述控制电路部分包括适于检测峰值对应间隙量的峰值检测部分,变化的过滤器驱动部分 以恒定间隔间隙量和峰值对应间隙量为间隔的间隔量,以及获得分别对应于恒定间隔间隙量和峰值对应间隙量的光强度的光谱测量部。
    • 6. 发明申请
    • OPTICAL DEVICE
    • 光学装置
    • US20120120403A1
    • 2012-05-17
    • US13238312
    • 2011-09-21
    • Tatsuaki FUNAMOTO
    • Tatsuaki FUNAMOTO
    • G01J3/45
    • G02B5/28G01J3/26G02B13/22G02B26/001
    • An optical device includes a telecentric optical system, a variable wavelength interference filter, and a detection section, the variable wavelength interference filter includes a first reflecting film, a second reflecting film provided to a movable section, and an electrostatic actuator adapted to displace the movable section, an effective measurement area capable of transmitting a light with a wavelength, which is within a predetermined allowable range centered on a measurement center wavelength when an amount of the displacement of the movable section takes a maximum displacement value, is set in the first reflecting film and the second reflecting film, and the telecentric optical system guides the incident light to the variable wavelength interference filter so that a principal ray of the incident light is parallel thereto and perpendicular to the first reflecting film, and at the same time, collects the incident light in the effective measurement area.
    • 光学装置包括远心光学系统,可变波长干涉滤光器和检测部分,所述可变波长干涉滤光器包括第一反射膜,设置于可动部的第二反射膜,以及静电致动器, 部分是当可移动部分的位移量达到最大位移值时,能够发送波长为光的中心在测量中心波长的预定允许范围内的有效测量区域,在第一反射 膜和第二反射膜,并且远心光学系统将入射光引导到可变波长干涉滤光器,使得入射光的主射线平行于其并垂直于第一反射膜,并且同时收集 入射光在有效测量区域。