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    • 1. 发明申请
    • MANUFACTURING METHOD OF DISPLAY DEVICE
    • 显示装置的制造方法
    • US20080176351A1
    • 2008-07-24
    • US11843693
    • 2007-08-23
    • Hideaki ShimmotoTakahiro KamoTakeshi NodaTakuo KaitohEiji Oue
    • Hideaki ShimmotoTakahiro KamoTakeshi NodaTakuo KaitohEiji Oue
    • H01L21/00
    • H01L21/02678H01L21/02683H01L21/02686H01L21/02691H01L27/1285H01L29/04
    • The present invention provides a manufacturing method of a display device which can prevent the reduction of a size of a pseudo single-crystalline region having strip-like crystals in forming such a pseudo single-crystalline silicon region on a substrate. A step for forming pseudo single crystals having strip-like crystals on a preset region of a semiconductor film formed on a substrate includes a step for forming the pseudo single crystal by radiating an energy beam to a first region of the semiconductor film while moving a radiation position of the energy beam in a first direction, and a step for forming the pseudo single crystal by radiating the energy beam to a second region of the semiconductor film while moving a radiation position of the energy beam in a second direction opposite to the first direction. The first region and the second region set sizes thereof at a position where the radiation of the energy beam is finished smaller than sizes thereof at a position where the radiation of the energy beam is started. The second region includes a portion where the second region overlaps the first region and a portion where the second region does not overlap the first region.
    • 本发明提供一种显示装置的制造方法,其可以防止在基板上形成这样的假单晶硅区域时具有带状晶体的伪单晶区域的尺寸的减小。 在形成在衬底上的半导体膜的预设区域上形成具有带状晶体的伪单晶的步骤包括:通过在移动辐射的同时将能量束照射到半导体膜的第一区域来形成伪单晶的步骤 能量束在第一方向的位置,以及通过在与第一方向相反的第二方向移动能量束的辐射位置的同时将能量束照射到半导体膜的第二区域来形成伪单晶的步骤 。 第一区域和第二区域在能量束的辐射被完成的位置处的尺寸设定为小于能量束的辐射开始的位置处的尺寸。 第二区域包括第二区域与第一区域重叠的部分和第二区域与第一区域不重叠的部分。
    • 2. 发明申请
    • Display Device and Manufacturing Method of Display Device
    • 显示设备的显示设备和制造方法
    • US20080173871A1
    • 2008-07-24
    • US11939073
    • 2007-11-13
    • Takeshi NodaTakahiro KamoHideaki Shimmoto
    • Takeshi NodaTakahiro KamoHideaki Shimmoto
    • H01L33/00H01L21/00
    • H01L27/1259H01L27/1214H01L29/04H01L29/42384H01L29/4908
    • In a display device which includes MIS transistors having semiconductor layers thereof formed of an amorphous semiconductor and MIS transistors having semiconductor layers thereof including a polycrystalline semiconductor, the present invention can enhance crystallinity of the semiconductor layers formed of the polycrystalline semiconductor when the respective MIS transistors adopt the bottom gate structure. In the display device, first MIS transistors formed in a first region of a substrate and second MIS transistors formed in a second region different from the first region respectively have a gate electrode thereof between the substrate and the semiconductor layer, the first MIS transistor has the semiconductor layer thereof formed of only the amorphous semiconductor, the second MIS transistor has the semiconductor layer thereof including the polycrystalline semiconductor, and a gate electrode of the second MIS transistor has a thickness smaller than a thickness of a gate electrode of the first MIS transistor.
    • 在包括由非晶半导体形成的半导体层的MIS晶体管的显示装置和具有包含多晶半导体的半导体层的MIS晶体管的本发明中,当各个MIS晶体管采用时,本发明可提高由多晶半导体形成的半导体层的结晶度 底栅结构。 在显示装置中,形成在基板的第一区域的第一MIS晶体管和形成在与第一区域不同的第二区域的第二MIS晶体管分别在基板和半导体层之间具有栅电极,第一MIS晶体管具有 半导体层仅由非晶半导体形成,第二MIS晶体管的半导体层包括多晶半导体,第二MIS晶体管的栅电极的厚度小于第一MIS晶体管的栅电极的厚度。
    • 3. 发明授权
    • Manufacturing method of display device
    • 显示装置的制造方法
    • US07732268B2
    • 2010-06-08
    • US11882828
    • 2007-08-06
    • Hideaki ShimmotoMikio HongoAkio YazakiTakeshi NodaTakuo Kaitoh
    • Hideaki ShimmotoMikio HongoAkio YazakiTakeshi NodaTakuo Kaitoh
    • H01L21/00
    • H01L21/02532H01L21/02683H01L21/02691H01L27/1285
    • A method of manufacturing a display device to improve the quality of a polycrystal silicon upon dehydrogenating and polycrystallizing an amorphous silicon at the outside of a display region of a substrate, by forming a plurality of pixels having TFT devices using an amorphous silicon in the display region of the substrate, and forming a plurality of driving circuits having semiconductor devices using a polycrystal silicon at the outside of the display region, the method including irradiation of a first continuous oscillation laser only to the amorphous silicon in the region for forming the driving circuit and the peripheral region thereof to conduct dehydrogenation and then irradiation of a second continuous oscillation region only to the dehydrogenated region to polycrystallize the amorphous silicon, wherein the region to which the first continuous oscillation laser is irradiated is wider than the region to which the second continuous oscillation laser is irradiated.
    • 一种制造显示装置的方法,通过在显示区域中形成具有使用非晶硅的TFT器件的多个像素,从而在衬底的显示区域的外侧使非晶硅脱氢和多晶化时提高多晶硅的质量 并且在显示区域的外部形成具有使用多晶硅的半导体器件的多个驱动电路,该方法包括仅在用于形成驱动电路的区域中的非晶硅上照射第一连续振荡激光,以及 其周边区域进行脱氢,然后仅将第二连续振荡区域照射到脱氢区域以将非晶硅多晶化,其中第一连续振荡激光器照射的区域比第二连续振荡区域 激光被照射。
    • 4. 发明申请
    • Manufacturing method of display device
    • 显示装置的制造方法
    • US20080050893A1
    • 2008-02-28
    • US11882828
    • 2007-08-06
    • Hideaki ShimmotoMikio HongoAkio YazakiTakeshi NodaTakuo Kaitoh
    • Hideaki ShimmotoMikio HongoAkio YazakiTakeshi NodaTakuo Kaitoh
    • H01L21/479
    • H01L21/02532H01L21/02683H01L21/02691H01L27/1285
    • A method of manufacturing a display device to improve the quality of a polycrystal silicon upon dehydrogenating and polycrystallizing an amorphous silicon at the outside of a display region of a substrate, by forming a plurality of pixels having TFT devices using an amorphous silicon in the display region of the substrate, and forming a plurality of driving circuits having semiconductor devices using a polycrystal silicon at the outside of the display region, the method including irradiation of a first continuous oscillation laser only to the amorphous silicon in the region for forming the driving circuit and the peripheral region thereof to conduct dehydrogenation and then irradiation of a second continuous oscillation region only to the dehydrogenated region to polycrystallize the amorphous silicon, wherein the region to which the first continuous oscillation laser is irradiated is wider than the region to which the second continuous oscillation laser is irradiated.
    • 一种制造显示装置的方法,通过在显示区域中形成具有使用非晶硅的TFT器件的多个像素,从而在衬底的显示区域的外侧使非晶硅脱氢和多晶化时提高多晶硅的质量 并且在显示区域的外部形成具有使用多晶硅的半导体器件的多个驱动电路,该方法包括仅在用于形成驱动电路的区域中的非晶硅上照射第一连续振荡激光,以及 其周边区域进行脱氢,然后仅将第二连续振荡区域照射到脱氢区域以将非晶硅多晶化,其中第一连续振荡激光器照射的区域比第二连续振荡区域 激光被照射。
    • 5. 发明授权
    • Display device and manufacturing method thereof
    • 显示装置及其制造方法
    • US08421940B2
    • 2013-04-16
    • US12405396
    • 2009-03-17
    • Takeshi NodaTakuo KaitohHidekazu MiyakeTakahiro Kamo
    • Takeshi NodaTakuo KaitohHidekazu MiyakeTakahiro Kamo
    • G02F1/136
    • H01L27/1251H01L27/1229H01L27/1285
    • A display device includes a TFT substrate in which a plurality of first TFT elements each having an active layer of an amorphous semiconductor and a plurality of second TFT elements each having an active layer of a polycrystalline semiconductor are disposed on a surface of an insulating substrate, wherein the first TFT element and the second TFT element each have a structure with a gate electrode, a gate insulating film, and the active layer stacked in this order on the surface of the insulating substrate and a source electrode and a drain electrode both connected to the active layer via a contact layer above the active layer, and the active layer of the second TFT element has a thickness of more than 60 nm in a position where the contact layer is stacked.
    • 显示装置包括TFT基板,其中在绝缘基板的表面上设置有多个具有非晶半导体的有源层的第一TFT元件和多个具有多晶半导体的有源层的第二TFT元件, 其中所述第一TFT元件和所述第二TFT元件各自具有在所述绝缘基板的表面上依次堆叠的栅电极,栅极绝缘膜和所述有源层的结构,以及源电极和漏电极都连接到 通过有源层上方的接触层的有源层和第二TFT元件的有源层在接触层堆叠的位置具有大于60nm的厚度。
    • 6. 发明授权
    • Display device and manufacturing method thereof
    • 显示装置及其制造方法
    • US08319225B2
    • 2012-11-27
    • US12611951
    • 2009-11-04
    • Takahiro KamoTakeshi Noda
    • Takahiro KamoTakeshi Noda
    • H01L33/00
    • H01L27/1214H01L29/66765H01L29/78621H01L29/78627H01L29/78678H01L29/78696
    • A display device includes: a conductive layer on which gate electrodes are formed; a first insulation layer which is formed on the conductive layer; a semiconductor layer which is formed on the first insulation layer and is provided for forming semiconductor films which contain poly-crystalline silicon above the gate electrodes; and a second insulation layer which is formed on the semiconductor layer. Here, the semiconductor film includes a channel region which overlaps with the gate electrode as viewed in a plan view. In the channel region, a portion of the semiconductor film which is in contact with the second insulation layer exhibits higher impurity concentration than a portion of the semiconductor film which is in contact with the first insulation layer.
    • 显示装置包括:形成栅电极的导电层; 形成在导电层上的第一绝缘层; 半导体层,形成在第一绝缘层上,用于形成在栅电极上方含有多晶硅的半导体膜; 以及形成在所述半导体层上的第二绝缘层。 这里,半导体膜包括与平面图中的栅电极重叠的沟道区域。 在沟道区域中,与第二绝缘层接触的半导体膜的一部分比与第一绝缘层接触的半导体膜的部分显示更高的杂质浓度。
    • 8. 发明申请
    • Semiconductor device and method for manufacturing the same
    • 半导体装置及其制造方法
    • US20060270130A1
    • 2006-11-30
    • US11440180
    • 2006-05-25
    • Takeshi SatoTakahiro KamoTakeshi Noda
    • Takeshi SatoTakahiro KamoTakeshi Noda
    • H01L21/84H01L29/76
    • H01L21/02667H01L21/02422H01L21/02532H01L21/02683H01L21/2026H01L27/1285H01L29/78603
    • Regions serving as semiconductor devices on a substrate GLS are separated by a substrate cutting position CUT. Each region is provided with a pixel region PXD, a gate line driving circuit region GCR and a signal line driving circuit region DCR for driving pixels, and a terminal region ELD where connection terminals will be formed. TFTs using a polycrystalline Si film not irradiated with a CW laser beam is formed in the pixel region PXD and the gate line driving circuit region GCR. A region CWD irradiated with the CW laser beam is formed in a part of the signal line driving circuit region DCR, and TFTs using a polycrystalline Si film made of crystals grown laterally are formed. A region UCW not irradiated with the CW laser beam is provided in the substrate cutting position CUT. The substrate GLS excluding the vicinities of the substrate cutting position CUT is irradiated with the CW laser beam. Tensile stress of the substrate surface near the substrate cutting position CUT is lower than tensile stress of the substrate surface in the region CWD so that cracks caused by substrate cutting is suppressed. Thus, it is possible to prevent cracks from occurring at the time of cutting a glass substrate having a semiconductor film crystallized by a CW laser beam.
    • 在衬底GLS上用作半导体器件的区域被衬底切割位置CUT隔开。 每个区域设置有像素区域PXD,栅极线驱动电路区域GCR和用于驱动像素的信号线驱动电路区域DCR以及将形成连接端子的端子区域ELD。 在像素区域PXD和栅极线驱动电路区域GCR中形成使用未被CW激光束照射的多晶Si膜的TFT。 在信号线驱动电路区域DCR的一部分中形成用CW激光束照射的区域CWD,并且形成使用由横向生长的晶体制成的多晶Si膜的TFT。 在基板切断位置CUT中设置没有用CW激光束照射的区域UCW。 用CW激光束照射除基板切断位置CUT附近的基板GLS。 衬底切割位置CUT附近的衬底表面的拉伸应力低于区域CWD中的衬底表面的拉伸应力,从而抑制由衬底切割引起的裂纹。 因此,可以防止在切割具有通过CW激光束结晶的半导体膜的玻璃基板时发生裂纹。