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    • 3. 发明授权
    • Cooling apparatus of electronic devices
    • 电子设备冷却装置
    • US5515912A
    • 1996-05-14
    • US664605
    • 1991-03-04
    • Takahiro DaikokuNoriyuki AshiwakeNobuo KawasakiShizuo Zushi
    • Takahiro DaikokuNoriyuki AshiwakeNobuo KawasakiShizuo Zushi
    • H01L23/36H01L23/433H01L23/34
    • H01L23/4338H01L2224/16225
    • A cooling apparatus of electronic devices including thermal conductive members each of which is positioned with one side thereof being in contact with a surface of each electronic device, the other side thereof being fitted to a housing with a small clearance provided therebetween, so as to diffuse and remove heat generated in the electronic devices. In order to press each thermal conductive member onto the associated electronic device, a resilient member is provided between the housing and the thermal conductive member, and is arranged to have a width larger than a width of grooves between fins formed on the housing and also larger than a width of grooves between fins formed on the thermal conductive member. A setting space to receive each resilient member therein is formed in a region where the fins are fitted to each other, so that the resilient member and the thermal conductive member can be fitted and positioned with respect to the housing when the resilient member is provided in this setting space.
    • 一种电子设备的冷却装置,包括导热构件,每个导热构件的一侧与每个电子装置的表面接触,其另一侧装配到具有设置在其间的小间隙的壳体,以便扩散 并去除电子设备中产生的热量。 为了将每个导热构件按压到相关联的电子装置上,弹性构件设置在壳体和导热构件之间,并且布置成具有比形成在壳体上的翅片之间的沟槽宽度更大的宽度,并且还更大 比形成在导热构件上的翅片之间的槽宽度大。 在翅片彼此装配的区域中形成有用于接收其中的每个弹性构件的设置空间,使得当弹性构件设置在弹性构件中时,可以将弹性构件和导热构件相对于壳体配合和定位 这个设置空间。
    • 4. 发明授权
    • Cooling apparatus of electronic devices
    • 电子设备冷却装置
    • US5595240A
    • 1997-01-21
    • US464581
    • 1995-06-05
    • Takahiro DaikokuNoriyuki AshiwakeNobuo KawasakiShizuo Zushi
    • Takahiro DaikokuNoriyuki AshiwakeNobuo KawasakiShizuo Zushi
    • H01L23/36H01L23/433H01L23/34
    • H01L23/4338H01L2224/16225
    • A cooling apparatus of electronic devices including thermal conductive members each of which is positioned with one side thereof being in contact with a surface of each electronic device, the other side thereof being fitted to a housing with a small clearance provided therebetween, so as to diffuse and remove heat generated in the electronic devices. In order to press each thermal conductive member onto the associated electronic device, a resilient member is provided between the housing and the thermal conductive member, and is arranged to have a width larger than a width of grooves between fins formed on the housing and also larger than a width of grooves between fins formed on the thermal conductive member. A setting space to receive each resilient member therein is formed in a region where the fins are fitted to each other, so that the resilient member and the thermal conductive member can be fitted and positioned with respect to the housing when the resilient member is provided in this setting space.
    • 一种电子设备的冷却装置,包括导热构件,每个导热构件的一侧与每个电子装置的表面接触,其另一侧装配到具有设置在其间的小间隙的壳体,以便扩散 并去除电子设备中产生的热量。 为了将每个导热构件按压到相关联的电子装置上,弹性构件设置在壳体和导热构件之间,并且布置成具有比形成在壳体上的翅片之间的凹槽的宽度更大的宽度,并且还更大 比形成在导热构件上的翅片之间的槽宽度大。 在翅片彼此装配的区域中形成有用于接收其中的每个弹性构件的设置空间,使得当弹性构件设置在弹性构件中时,可以将弹性构件和导热构件相对于壳体配合和定位 这个设置空间。
    • 6. 发明授权
    • Coefficient of linear expansion measuring apparatus and coefficient of linear expansion measuring method
    • 线性膨胀测量装置的系数和线膨胀系数的测量方法
    • US07164481B2
    • 2007-01-16
    • US10927057
    • 2004-08-27
    • Nobuo KawasakiToshihide NakajimaMasahiko DaimonOsamu Okajima
    • Nobuo KawasakiToshihide NakajimaMasahiko DaimonOsamu Okajima
    • G01B9/02G01B11/02G01B11/28G01B11/06G01L1/24G02B6/00G02B6/12
    • G01N25/16
    • A coefficient of linear expansion measuring apparatus includes: two reflection plates between which a sample is put, a container to house them, which is filled with a gas having known rate of a refractive index variation, a temperature regulating member to set a temperature in the container variably, a light source to irradiate an irradiating light to reflecting surfaces of the reflection plates, a light receiving element to receive reflected lights in which the lights interferes each other and detecting a light intensity thereof, and a calculating member to calculate a coefficient of linear expansion of the sample, wherein: the calculating member calculates an optical path length variation between the reflecting surfaces from an output variation of the light receiving element, and calculates a length variation of the sample by correcting a part of the optical path length variation derived from the refractive index variation of the gas caused by the temperature variation.
    • 线性膨胀测量装置的系数包括:两个反射板,其上放置样品,容纳它们的容器,填充有已知的折射率变化率的气体,温度调节构件,用于将温度设定在 容器可变的是将照射光照射到反射板的反射面的光源,用于接收光彼此干涉并检测其光强度的反射光的光接收元件,以及计算部件, 其中:所述计算部件根据所述受光元件的输出变化来计算所述反射面之间的光路长度变化,并且通过校正所述光路长度变化的一部分来计算样本的长度变化 从气体的折射率变化引起的温度变化。
    • 7. 发明申请
    • Coefficient of linear expansion measuring apparatus and coefficient of linear expansion measuring method
    • 线性膨胀测量装置的系数和线膨胀系数的测量方法
    • US20050046869A1
    • 2005-03-03
    • US10927057
    • 2004-08-27
    • Nobuo KawasakiToshihide NakajimaMasahiko DaimonOsamu Okajima
    • Nobuo KawasakiToshihide NakajimaMasahiko DaimonOsamu Okajima
    • G01J9/02G01N25/16G01J4/00
    • G01N25/16
    • A coefficient of linear expansion measuring apparatus includes: two reflection plates between which a sample is put, a container to house them, which is filled with a gas having known rate of a refractive index variation, a temperature regulating member to set a temperature in the container variably, a light source to irradiate an irradiating light to reflecting surfaces of the reflection plates, a light receiving element to receive reflected lights in which the lights interferes each other and detecting a light intensity thereof, and a calculating member to calculate a coefficient of linear expansion of the sample, wherein: the calculating member calculates an optical path length variation between the reflecting surfaces from an output variation of the light receiving element, and calculates a length variation of the sample by correcting a part of the optical path length variation derived from the refractive index variation of the gas caused by the temperature variation.
    • 线性膨胀测量装置的系数包括:两个反射板,其上放置样品,容纳它们的容器,填充有已知的折射率变化率的气体,温度调节构件,用于将温度设定在 容器可变的是将照射光照射到反射板的反射面的光源,用于接收光彼此干涉并检测其光强度的反射光的光接收元件,以及计算部件, 其中:所述计算部件根据所述受光元件的输出变化来计算所述反射面之间的光路长度变化,并且通过校正所述光路长度变化的一部分来计算样本的长度变化 从气体的折射率变化引起的温度变化。
    • 9. 发明申请
    • Surface defect detection method and surface defect inspection apparatus
    • 表面缺陷检测方法和表面缺陷检查装置
    • US20080068587A1
    • 2008-03-20
    • US11898760
    • 2007-09-14
    • Nobuo Kawasaki
    • Nobuo Kawasaki
    • G01N1/00G01N21/47
    • G01N21/958G01N21/552
    • A surface defect detection method and a surface defect inspection apparatus are provided having a function of inspecting only the defects and foreign particles on the surface regardless of whether or not there are internal defects, internal foreign particles, or internal light scattering particles, even if the inspection target material is a transparent or translucent material, or a material containing internal crystals such as crystallized glass. A medium layer having a higher refractive index than that of the inspection target material is provided to be in contact with the inspection target surface of the inspection target material. Inspection light is input from the medium layer side with an incident angle that achieves total reflection on the interface between the medium layer and the inspection target surface, and the reflected light of the inspection light, which is reflected by the inspection target surface, is detected, thereby inspecting for surface defects and foreign particles on the inspection target surface.
    • 提供了表面缺陷检测方法和表面缺陷检查装置,其具有仅检查表面上的缺陷和异物的功能,而不管是否存在内部缺陷,内部杂质颗粒或内部光散射颗粒,即使 检查对象材料是透明或半透明的材料,或含有诸如结晶玻璃的内部晶体的材料。 提供具有比检查对象材料更高的折射率的介质层与检查对象材料的检查对象表面接触。 检测光从介质层侧以入射角输入,该入射角在介质层和检查对象面之间的界面上实现全反射,检测出被检查对象面反射的检查光的反射光 从而检查检查对象表面上的表面缺陷和异物。