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1. 发明申请

US20080018338A1 Contact type single side probe device and apparatus and method for testing open or short circuits of conductive lines using the same 有权
标题翻译：接触式单面探针装置及使用其的导电线的开路或短路测试的装置和方法
公开(公告)号：US20080018338A1
公开(公告)日：2008-01-24
申请号：US11826145
申请日：2007-07-12
申请人： Tak Eun , Seong Jin Kim , Hee Dok Choi , Dong Jun Lee , Dae Woong Song
发明人： Tak Eun , Seong Jin Kim , Hee Dok Choi , Dong Jun Lee , Dae Woong Song
IPC分类号： G01R31/14 , G01R27/26
CPC分类号： G01R31/024 , G01R1/06788
摘要： Disclosed herein are an apparatus and method for testing open and short circuits of conductive lines. A probe is brought into contact with one end of each of the conductive lines, AC power is applied, and the conductive lines are tested using electrical variations measured in the probe. By using a single-side probe device, it is possible to remarkably reduce the number of probes when the open or short circuit of a PCB pattern, a data transmission line or an electrical cable is tested and to remarkably reduce time or labor necessary for testing the open or short circuit. Since the measurement is performed only at one end of the conductive line to test the open or short circuit of the conductive line, it is possible to self-diagnose the open or short circuit when a single-side probe device is mounted in an input/output port of an electrical device.
摘要翻译：本文公开了一种用于测试导线的开路和短路的装置和方法。使探针与每个导线的一端接触，施加AC电力，并且使用在探针中测量的电变化来测试导线。通过使用单面探针装置，可以显着减少PCB图案，数据传输线或电缆的开路或短路测试时的探头数量，并显着减少测试所需的时间或劳动开路或短路。由于仅在导线的一端进行测量以测试导线的开路或短路，所以当单侧探针装置安装在输入/输出端口中时，可以自我诊断开路或短路，电气设备的输出端口。

2. 发明授权

US07629796B2 Contact type single side probe device and apparatus and method for testing open or short circuits of conductive lines using the same 有权
标题翻译：接触式单面探针装置及使用其的导电线的开路或短路测试的装置和方法
公开(公告)号：US07629796B2
公开(公告)日：2009-12-08
申请号：US11826145
申请日：2007-07-12
申请人： Tak Eun , Seong Jin Kim , Hee Dok Choi , Dong Jun Lee , Dae Woong Song
发明人： Tak Eun , Seong Jin Kim , Hee Dok Choi , Dong Jun Lee , Dae Woong Song
IPC分类号： G01R15/12
CPC分类号： G01R31/024 , G01R1/06788
摘要： Disclosed herein are an apparatus and method for testing open and short circuits of conductive lines. A probe is brought into contact with one end of each of the conductive lines, AC power is applied, and the conductive lines are tested using electrical variations measured in the probe. By using a single-side probe device, it is possible to remarkably reduce the number of probes when the open or short circuit of a PCB pattern, a data transmission line or an electrical cable is tested and to remarkably reduce time or labor necessary for testing the open or short circuit. Since the measurement is performed only at one end of the conductive line to test the open or short circuit of the conductive line, it is possible to self-diagnose the open or short circuit when a single-side probe device is mounted in an input/output port of an electrical device.
摘要翻译：本文公开了一种用于测试导线的开路和短路的装置和方法。使探针与每个导线的一端接触，施加AC电力，并且使用在探针中测量的电变化来测试导线。通过使用单面探针装置，可以显着减少PCB图案，数据传输线或电缆的开路或短路测试时的探针数量，并显着减少测试所需的时间或劳动开路或短路。由于仅在导线的一端进行测量以测试导线的开路或短路，所以当单侧探针装置安装在输入/输出端口中时，可以自我诊断开路或短路，电气设备的输出端口。

3. 发明授权

US07746086B2 Non-contact type apparatus for testing open and short circuits of a plurality of pattern electrodes formed on a panel 有权
标题翻译：用于测试形成在面板上的多个图案电极的开路和短路的非接触型装置
公开(公告)号：US07746086B2
公开(公告)日：2010-06-29
申请号：US11826147
申请日：2007-07-12
申请人： Tak Eun , Seong Jin Kim , Hee Dok Choi , Dong Jun Lee , Jong In Park , Woo Chul Cho
发明人： Tak Eun , Seong Jin Kim , Hee Dok Choi , Dong Jun Lee , Jong In Park , Woo Chul Cho
IPC分类号： G01R27/08 , G01R31/02
CPC分类号： G01R31/2812 , G01R31/025 , G01R31/312 , G02F2001/136254
摘要： Disclosed herein are a noncontact single side probe and an apparatus and method for testing open and short circuits of pattern electrodes. By feeding power to one end of each of the pattern electrodes and sensing an electrical variation value using a noncontact type single side probe device including an exciter electrode and a sensor electrode as a single module, the open and short circuits of pattern electrodes can be tested by one scanning process. Since the open and short circuits of the pattern electrodes are tested using the noncontact type single side probe device, the pattern electrode can be prevented from being damaged due to a contact failure or pressurized contact and the life span of the probe device can increase compared with a contact type probe device.
摘要翻译：本文公开了一种非接触单侧探针和用于测试图案电极的开路和短路的装置和方法。通过向每个图形电极的一端供电，并使用包括兴奋剂电极和传感器电极的非接触型单侧探针装置作为单个模块感测电变化值，可以测试图案电极的开路和短路通过一个扫描过程。由于使用非接触型单面探针器件对图形电极的开路短路进行了测试，所以可以防止图案电极由于接触不良或加压接触而被损坏，并且探针器件的使用寿命可以比接触型探针装置。

4. 发明申请

US20080018339A1 Noncontact type single side probe device and apparatus and method for testing open or short circuits of pattern electrodes using the same 有权
标题翻译：非接触式单面探针装置及使用其的图案电极的开路或短路测试的装置和方法
公开(公告)号：US20080018339A1
公开(公告)日：2008-01-24
申请号：US11826147
申请日：2007-07-12
申请人： Tak Eun , Seong Jin Kim , Hee Dok Choi , Dong Jun Lee , Jong In Park , Woo Chul Cho
发明人： Tak Eun , Seong Jin Kim , Hee Dok Choi , Dong Jun Lee , Jong In Park , Woo Chul Cho
IPC分类号： G01R31/14 , G01R27/26
CPC分类号： G01R31/2812 , G01R31/025 , G01R31/312 , G02F2001/136254
摘要： Disclosed herein are a noncontact single side probe and an apparatus and method for testing open and short circuits of pattern electrodes. By feeding power to one end of each of the pattern electrodes and sensing an electrical variation value using a noncontact type single side probe device including an exciter electrode and a sensor electrode as a single module, the open and short circuits of pattern electrodes can be tested by one scanning process. Since the open and short circuits of the pattern electrodes are tested using the noncontact type single side probe device, the pattern electrode can be prevented from being damaged due to a contact failure or pressurized contact and the life span of the probe device can increase compared with a contact type probe device.
摘要翻译：本文公开了一种非接触单侧探针和用于测试图案电极的开路和短路的装置和方法。通过向每个图形电极的一端供电，并使用包括兴奋剂电极和传感器电极的非接触型单侧探针装置作为单个模块感测电变化值，可以测试图案电极的开路和短路通过一个扫描过程。由于使用非接触型单面探针器件对图形电极的开路短路进行了测试，所以可以防止图案电极由于接触不良或加压接触而被损坏，并且探针器件的使用寿命可以比接触型探针装置。

5. 发明授权

US08072600B2 Inspection method of circuit substrate 有权
标题翻译：电路基板检查方法
公开(公告)号：US08072600B2
公开(公告)日：2011-12-06
申请号：US12458183
申请日：2009-07-02
申请人： Tak Eun , Seong Jin Kim , Dong Jun Lee
发明人： Tak Eun , Seong Jin Kim , Dong Jun Lee
IPC分类号： G01B11/00
CPC分类号： G01R31/304 , G01R31/2874
摘要： An inspection method for a circuit substrate is disclosed, which inspects electrical properties of a circuit substrate having a multilayered structure, by controlling inspection environments so that dew forms on a surface of the circuit substrate and detecting change of states of the dew to thereby determining variation of a thermal capacity of a conductor with respect to defective contacts or vias, micro vias and a circuit pattern of an inner layer. According to this, the inspection can be performed with respect to a wide area simultaneously and therefore the inspection productivity can be improved. In addition, since the temperature of the conductive wire can be measured directly through change of the dew, the cost for the temperature measurement can be saved. Moreover, the cost for an area sensor to sense the temperature of a wide area may be reduced while improving the inspection speed.
摘要翻译：公开了一种电路基板的检查方法，其通过控制检查环境来检查具有多层结构的电路基板的电特性，从而在电路基板的表面上形成露点并检测露水状态的变化，从而确定变化相对于缺陷触点或通孔，微通孔和内层的电路图案的导体的热容量。据此，能够同时进行广泛的检查，能够提高检查生产率。此外，由于可以通过露水的变化直接测量导线的温度，因此可以节省温度测量的成本。此外，可以降低用于感测广域的温度的区域传感器的成本，同时提高检查速度。

6. 发明申请

US20100002232A1 Inspection method of circuit substrate 有权
标题翻译：电路基板检查方法
公开(公告)号：US20100002232A1
公开(公告)日：2010-01-07
申请号：US12458183
申请日：2009-07-02
申请人： Tak Eun , Seong Jin Kim , Dong Jun Lee
发明人： Tak Eun , Seong Jin Kim , Dong Jun Lee
IPC分类号： G01N21/00
CPC分类号： G01R31/304 , G01R31/2874
摘要： An inspection method for a circuit substrate is disclosed, which inspects electrical properties of a circuit substrate having a multilayered structure, by controlling inspection environments so that dew forms on a surface of the circuit substrate and detecting change of states of the dew to thereby determining variation of a thermal capacity of a conductor with respect to defective contacts or vias, micro vias and a circuit pattern of an inner layer. According to this, the inspection can be performed with respect to a wide area simultaneously and therefore the inspection productivity can be improved. In addition, since the temperature of the conductive wire can be measured directly through change of the dew, the cost for the temperature measurement can be saved. Moreover, the cost for an area sensor to sense the temperature of a wide area may be reduced while improving the inspection speed.
摘要翻译：公开了一种电路基板的检查方法，其通过控制检查环境来检查具有多层结构的电路基板的电特性，从而在电路基板的表面上形成露点并检测露水状态的变化，从而确定变化相对于缺陷触点或通孔，微通孔和内层的电路图案的导体的热容量。据此，能够同时进行广泛的检查，能够提高检查生产率。此外，由于可以通过露水的变化直接测量导线的温度，因此可以节省温度测量的成本。此外，可以降低用于感测广域的温度的区域传感器的成本，同时提高检查速度。

7. 发明申请

US20080017508A1 Non-contact type single side probe structure 审中-公开
标题翻译：非接触式单侧探头结构
公开(公告)号：US20080017508A1
公开(公告)日：2008-01-24
申请号：US11826143
申请日：2007-07-12
申请人： Tak Eun , Seong Jin Kim
发明人： Tak Eun , Seong Jin Kim
IPC分类号： G01N27/403
CPC分类号： G01R1/06761 , G01R1/07342
摘要： A non-contact type single side probe structure, in which a plurality of insulating films and conductive films are repeatedly stacked, includes probe electrodes formed at an inner conductive film portion of the cross-section of the structure and a guard portion formed at an outer conductive film portion surrounding the probe electrodes. Accordingly, it is possible to form the probe electrodes to have the thickness of the conductive films corresponding to a pitch of a pattern electrode, thereby detecting open and short circuit in a miniaturized pattern electrode. The cross-section used as a probe is spaced at a specified distance or further from contact holes, thereby having a high resistance to noises.
摘要翻译：多个绝缘膜和导电膜重复堆叠的非接触型单面探针结构包括形成在该结构的横截面的内部导电膜部分处的探针电极和形成在外部的防护部分导电膜部分围绕探针电极。因此，可以形成探针电极以使导电膜的厚度对应于图案电极的间距，从而检测小型化图形电极的开路和短路。用作探针的横截面与接触孔间隔一定距离或更远，从而具有高的噪声抵抗能力。

8. 发明授权

US07104549B2 Steerable inline skate 失效
标题翻译：可转向的直排轮滑
公开(公告)号：US07104549B2
公开(公告)日：2006-09-12
申请号：US10456603
申请日：2003-06-06
申请人： Tak Eun , Sun-kyu Yang
发明人： Tak Eun , Sun-kyu Yang
IPC分类号： A63C1/34
CPC分类号： A63C17/062 , A63C17/006 , A63C17/0073 , A63C17/064 , A63C2203/42
摘要： A steerable inline skate which allows user to change direction more easily and reduce the abrasion of wheels to thus lengthen the life of the wheels by allowing front and rear wheels 30 and 50 among a plurality of wheels arranged in a line to be steered within a predetermined angle utilizing the structure of a trapezoidal linkage.
摘要翻译：一种可转向的直排轮滑，使用户可以更容易地改变方向，减少车轮的磨损，从而延长车轮的使用寿命，方法是使排列在一条直线上的多个车轮中的前后轮30和50能够在预定的范围内转向角度利用梯形连杆的结构。

9. 发明授权

US07447784B2 Authentication method using cellular phone in internet 失效
标题翻译：在互联网中使用手机的认证方法
公开(公告)号：US07447784B2
公开(公告)日：2008-11-04
申请号：US10181159
申请日：2001-01-18
申请人： Tak Eun
发明人： Tak Eun
IPC分类号： G06F15/16 , G06F15/177 , G06F15/173
CPC分类号： H04W12/06 , G06F21/43 , G06Q20/32 , G06Q20/3224 , G06Q20/3255 , G06Q20/425 , G06Q30/0601 , H04L63/0853 , H04L63/18 , H04W4/14
摘要： The present invention discloses an authentication method using a cellular phone in internet. According to the present invention, when connecting to internet or performing electronic commerce, the authentication is performed through the cellular phone in parallel with a personal information stored when user's joining the cellular phone service, a number particular to the cellular phone, a secret number in an authentication required for the connection or the settlement of accounts. Specifically, in authentication process for making up accounts, besides the line connected to internet, a separate cellular phone line is used and if the authentication data of the internet site server is identical to that of the cellular phone service company, the authentication process is completed, thereby eliminating the danger of hacking basically.
摘要翻译：本发明公开了一种使用互联网中的蜂窝电话的认证方法。根据本发明，当连接到互联网或执行电子商务时，通过蜂窝电话与用户加入蜂窝电话服务时存储的个人信息，蜂窝电话特有的号码，秘密号码帐户连接或结算所需的身份验证。具体来说，在构成帐户的认证处理中，除了连接到互联网的线路之外，还使用单独的蜂窝电话线路，并且如果互联网站点服务器的认证数据与蜂窝电话服务公司的认证数据相同，则认证处理完成，从而基本消除了黑客的危险。

10. 发明授权

US06753684B2 Inspection apparatus and method adapted to a scanning technique employing a rolling wire probe 失效
标题翻译：适用于使用滚丝探头的扫描技术的检查装置和方法
公开(公告)号：US06753684B2
公开(公告)日：2004-06-22
申请号：US10030370
申请日：2002-04-29
申请人： Tak Eun
发明人： Tak Eun
IPC分类号： G01R3108
CPC分类号： G01R1/067
摘要： An inspection apparatus and method of electrode patterns using rolling wire probes, which includes a rolling wire rotating for performing a rolling contact sliplessly across the electrode patterns, and a control unit for controlling operations of the inspection apparatus wholly and for discriminating the electrical characteristics according to the electrical signal sensed through the rolling wire provided to the rolling wire probe. The inspection method is used flexibly with electrode patterns having various forms regardless of the change of model or design of the product, unlike the inspection method of the conventional art by the test pin block. Upon inspecting a pixel portion of the electrode pattern, a scratch is not generated by the rolling contact operation, thereby increasing yield of the finished goods.
摘要翻译：一种使用滚丝探针的电极图案的检查装置和方法，其包括在电极图案之间无滑动地进行滚动接触的滚动丝线，以及用于全面控制检查装置的操作并根据以下方式区分电特性的控制单元通过提供给滚丝探针的滚丝检测到的电信号。与通过测试针块的传统技术的检查方法不同，检查方法与具有各种形式的电极图案灵活地使用，而不管产品的型号或设计的变化。在检查电极图案的像素部分时，通过滚动接触操作不产生划痕，从而提高成品的产量。

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