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1. 发明授权

US5452070A Method for analyzing solid sample 失效
标题翻译：固体样品分析方法
公开(公告)号：US5452070A
公开(公告)日：1995-09-19
申请号：US266239
申请日：1994-06-27
申请人： Tadashi Mochizuki , Yohichi Ishibashi , Takanori Akiyoshi , Yoshihito Iwata , Satoshi Kinoshiro , Akiko Sakashita
发明人： Tadashi Mochizuki , Yohichi Ishibashi , Takanori Akiyoshi , Yoshihito Iwata , Satoshi Kinoshiro , Akiko Sakashita
IPC分类号： G01N1/02 , G01N1/28 , G01N21/31 , G01N21/63 , G01N21/71 , G01N1/04
CPC分类号： G01N21/718
摘要： A method for analyzing solid sample comprises the steps of: introducing an inert carrier gas into a cell; a preliminary treatment step of irradiating laser beam to a sample surface of the solid sample in the inert carrier gas, the laser beam having a pulse half width of 0.001 .mu.sec or more, a pulse energy density of 0.001 GW/cm.sup.2 or more, and a frequency of 100 Hz or more; generating fine particles in the inert carrier gas on a condition that a rate of fine particles generation, V (.mu.g/sec), and selection ratio, S, satisfy the following equations, the selection ratio being a retio of a concentration of a target element for analysis within the fine particles to a concentration of the target element for analysis within the solid sample;S.ltoreq.0.25 log V+1.5,S.gtoreq.-0.2 log V+0.6,0.1.ltoreq.V.ltoreq.100intoducing the generated fine particles to a detector.
摘要翻译：用于分析固体样品的方法包括以下步骤：将惰性载气引入到电池中; 将惰性载气中的固体样品的样品表面照射激光的预处理步骤，脉冲半宽度为0.001μsec以上，脉冲能量密度为0.001GW / cm 2以上的激光，以及频率为100Hz以上; 在微细生成速度V（μg/ sec）和选择比S满足下列等式的条件下，在惰性载气中产生细颗粒，选择比为目标浓度在细颗粒内分析用于在固体样品中分析的目标元素的浓度的元素; S / = -0.2log V + 0.6,0.1

2. 发明授权

US5537206A Method for analyzing steel and apparatus therefor 失效
标题翻译：钢及其设备分析方法
公开(公告)号：US5537206A
公开(公告)日：1996-07-16
申请号：US331792
申请日：1994-10-31
申请人： Takanori Akiyoshi , Tadashi Mochizuki , Akiko Sakashita , Yohichi Ishibashi , Satoshi Kinoshiro , Yoshihito Iwata , Yoshihiko Kawai , Yoichi Nimura , Hiroaki Miyahara
发明人： Takanori Akiyoshi , Tadashi Mochizuki , Akiko Sakashita , Yohichi Ishibashi , Satoshi Kinoshiro , Yoshihito Iwata , Yoshihiko Kawai , Yoichi Nimura , Hiroaki Miyahara
IPC分类号： G01N1/00 , G01N21/71 , G01N33/20 , G01N21/63 , G01N21/72 , G01N21/73
CPC分类号： G01N33/20 , G01N21/718 , G01N1/22
摘要： A method for analyzing steel which comprises: grinding an analysis area of a steel ingot; sealing the analysis area with a sealing section of a cell for generating fine particles; again grinding the analysis area, while an argon gas is introduced into the cell; irradiating a pulsed laser beam of 10.sup.8 W/cm.sup.2 or more onto the analysis area at an irradiating spot of at least 1 mm.sup.2 to generate the fine particles; moving the irradiating spot; and transferring the generated fine particles by the argon gas to a plasma emission analysis for analysis. A further method for analyzing steel comprises: solidifying a molten steel sample, forming a red-hot sample; putting the sample into a sample holding section of a sample chamber under a purified argon gas atmosphere, the sample holding section having an inner curved surface the same as a curved surface of the sample; irradiating a pulsed laser onto the sample to remove a sample surface layer of 25 .mu.m or more of the sample and to generate fine particles from the sample; and exciting the fine particles by a plasma emission analyzer to analyze the composition of the fine particles.
摘要翻译：一种钢的分析方法，包括：研磨钢锭的分析区域; 用用于产生细颗粒的电池的密封部分密封分析区域; 再次研磨分析区，同时将氩气引入电池; 以至少1mm 2的照射点将108W / cm 2以上的脉冲激光照射到分析区域上，生成微粒子; 移动照射点; 并通过氩气将生成的细颗粒转移到等离子体发射分析用于分析。分析钢的另一种方法包括：使钢水样品固化，形成红热样品; 将样品放置在纯化氩气气氛下的样品室的样品保持部分中，样品保持部分具有与样品的曲面相同的内部曲面; 将脉冲激光照射到样品上以除去样品的25μm或更多的样品表面层，并从样品中产生细颗粒; 并通过等离子体发射分析仪激发细颗粒以分析细颗粒的组成。

3. 发明授权

US5784153A Method for detecting cause of abnormal portion present on surface of steel product 失效
标题翻译：钢产品表面存在异常部位原因的检测方法
公开(公告)号：US5784153A
公开(公告)日：1998-07-21
申请号：US722276
申请日：1996-10-09
申请人： Tadashi Mochizuki , Shigeomi Sato , Takanori Akiyoshi , Akiko Sakashita , Yohichi Ishibashi
发明人： Tadashi Mochizuki , Shigeomi Sato , Takanori Akiyoshi , Akiko Sakashita , Yohichi Ishibashi
IPC分类号： G01N21/62 , G01N1/00 , G01N1/04 , G01N1/22 , G01N1/28 , G01N33/20 , G01N21/63 , G01N21/72 , G01N21/73
CPC分类号： G01N33/20 , G01N1/04 , G01N2001/045
摘要： A method for detecting a cause of an abnormal portion present on a surface of a steel product, which comprises the steps of: condensing a pulsed laser beam, irradiating the pulsed laser beam thus condensed onto an abnormal portion present on a surface of a steel product and a vicinity thereof, limiting pulse energy density of the pulsed laser beam at an irradiation point of the pulsed laser beam on the surface of the steel product within a range of from 10 kW/mm.sup.2 to 100 MW/mm.sup.2 ; causing the irradiation point of the pulsed laser beam to zigzag-move throughout the entire region containing the abnormal portion and the vicinity thereof, to vaporize a surface portion of the steel product in the zigzag-moving region of the irradiation point, and converting the resultant vapor into fine particles, so as to collect samples of the abnormal portion and the vicinity thereof on the surface of the steel product in the form of fine particles; and continuously analyzing chemical compositions of the thus collected samples in the form of fine particles to detect a cause of an abnormal portion present on the surface of the steel product.
摘要翻译： PCT No.PCT / JP96 / 01585 Sec。 371日期1996年10月9日第 102（e）1996年10月9日PCT PCT 1996年6月12日PCT公布。出版物WO96 / 42005 日期：1996年12月27日一种用于检测存在于钢产品表面的异常部分的原因的方法，包括以下步骤：将脉冲激光束进行冷凝，将由此冷凝的脉冲激光束照射到存在于钢产品的表面及其附近，将脉冲激光束的照射点的脉冲激光束的脉冲能量密度限制在钢制品的表面上在10kW / mm 2至100MW / mm 2的范围内; 使脉冲激光束的照射点在含有异常部分及其附近的整个区域中进行曲折移动，以使照射点的之字形移动区域中的钢制品的表面部分气化，并将所得到的将其蒸发成细颗粒，从而以细颗粒的形式收集在钢制品表面上的异常部分及其附近的样品; 并且以细颗粒的形式连续分析如此收集的样品的化学成分，以检测存在于钢产品表面上的异常部分的原因。

4. 发明授权

US5844149A Method for analyzing solid specimen and apparatus therefor 失效
标题翻译：分析固体样品及其设备的方法
公开(公告)号：US5844149A
公开(公告)日：1998-12-01
申请号：US764141
申请日：1996-12-12
申请人： Takanori Akiyoshi , Akiko Sakashita , Yohichi Ishibashi , Tadashi Mochizuki , Shigeomi Sato , Toshiya Maekawa
发明人： Takanori Akiyoshi , Akiko Sakashita , Yohichi Ishibashi , Tadashi Mochizuki , Shigeomi Sato , Toshiya Maekawa
IPC分类号： G01N1/00 , G01N21/71 , G01N1/04
CPC分类号： G01N21/718 , G01N1/22
摘要： A method for analyzing a solid specimen comprises the steps of: preparing a pulsed laser beam having a frequency of at least 100 Hz and a half width of 1 .mu.sec or less; determining a laser irradiation region; irradiating the pulsed laser beam in an inert gas stream and vaporizing a part of the solid specimen to generate fine particles; transferring said fine particles to a detector; and performing elemental analysis in the detector. An apparatus comprises: laser oscillating device including a semiconductor laser; converging device for converging a laser beam; irradiating device for irradiating the converged laser beam to generate fine particles; an analyzer for performing elemental analysis; and transfer device for transferring the fine particles to said analyzer.
摘要翻译：用于分析固体试样的方法包括以下步骤：制备具有至少100Hz的频率和1μsec或更小的半值的脉冲激光束; 确定激光照射区域; 将脉冲激光束照射在惰性气流中，并蒸发固体样品的一部分以产生细颗粒; 将所述细颗粒转移到检测器; 并在检测器中进行元素分析。一种装置包括：包括半导体激光器的激光振荡装置; 用于会聚激光束的会聚装置; 用于照射会聚的激光束以产生细颗粒的照射装置; 用于进行元素分析的分析仪; 以及用于将细颗粒转移到所述分析器的转印装置。

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