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    • 3. 发明申请
    • Nitride semiconductor light emitting device and method of manufacturing the same
    • 氮化物半导体发光器件及其制造方法
    • US20100283070A1
    • 2010-11-11
    • US12007497
    • 2008-01-11
    • Sun Woon KimDong Joon KimDong Ju Lee
    • Sun Woon KimDong Joon KimDong Ju Lee
    • H01L33/10H01L33/26
    • H01L33/382H01L33/08
    • There are provided a nitride semiconductor light emitting device having improved light extraction efficiency and a method of manufacturing the same. A nitride semiconductor light emitting device according to an aspect of the invention includes a light emitting lamination including first and second conductivity type nitride semiconductors and an active layer formed therebetween, first and second electrode pads electrically connected to the first and second conductivity nitride semiconductor layers, respectively, a plurality of patterns formed below the second electrode pad and having a depth reaching at least part of the first conductivity type nitride semiconductor layer, and an insulating film formed at an internal surface of the plurality of patterns to electrically insulate a region of a light emitting lamination, which is exposed through the plurality of patterns, from the second electrode pad.
    • 提供了具有改进的光提取效率的氮化物半导体发光器件及其制造方法。 根据本发明的一个方面的氮化物半导体发光器件包括包括第一和第二导电型氮化物半导体的发光层压体和在其间形成的有源层,与第一和第二导电氮化物半导体层电连接的第一和第二电极焊盘, 分别形成在第二电极焊盘下方并且具有到达第一导电型氮化物半导体层的至少一部分的深度的多个图案,以及形成在多个图案的内表面处的绝缘膜,以使 通过多个图案曝光的发光层压从第二电极焊盘。
    • 9. 发明授权
    • Nitride-based semiconductor device
    • 氮化物半导体器件
    • US06936838B2
    • 2005-08-30
    • US10776270
    • 2004-02-12
    • Sun Woon Kim
    • Sun Woon Kim
    • H01S5/20H01L29/15H01L29/20H01L33/06H01L33/32H01L33/36H01L29/06H01L31/0328H01L31/0336
    • H01L33/06B82Y20/00H01L29/155H01L29/2003H01L33/32
    • Disclosed is a nitride-based semiconductor device including a first nitride semiconductor layer doped with an n type impurity, an active layer formed on the first nitride semiconductor layer, the active layer including a plurality of quantum well layers and a plurality of quantum barrier layers alternately laminated over one another, at least one of the quantum layers being doped with the n type impurity, and a nitride semiconductor layer formed over the active layer, and doped with a p type impurity. The quantum barrier layer doped with the n type impurity includes an internal layer portion doped with the n type impurity, and an anti-diffusion film arranged at an interface of the quantum barrier layer with an adjacent one of the quantum well layers, the anti-diffusion film having an n type impurity concentration lower than that of the internal layer portion.
    • 公开了一种氮化物基半导体器件,其包括掺杂有n型杂质的第一氮化物半导体层,在第一氮化物半导体层上形成的有源层,包含多个量子阱层的活性层和多个量子势垒层 层叠在一起,至少一个量子层掺杂有n型杂质,以及氮化物半导体层,形成在有源层上并掺杂有p型杂质。 掺杂有n型杂质的量子势垒层包括掺杂有n型杂质的内层部分和设置在量子势垒层与相邻量子阱层的界面处的抗扩散膜, 扩散膜的n型杂质浓度低于内层部分的浓度。