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    • 1. 发明申请
    • Automated coding system and method
    • 自动编码系统及方法
    • US20070102515A1
    • 2007-05-10
    • US11527720
    • 2006-09-27
    • Steven WindhamAlexander NowakJeff NowlingJames Hughes
    • Steven WindhamAlexander NowakJeff NowlingJames Hughes
    • G06Q30/00G06K15/00
    • G06K1/121
    • The present invention is directed to a method and system for automatic product coding and verification. The system may include a product identification component for identifying a product for coding, a code determination subsystem for automatically determining a product code based on the product identification, and a printing subsystem for printing the determined product code on the product. The system may also include an inspection subsystem for inspecting the printed product code and generating an alarm upon inspection failure. The code determination subsystem may include a controller for receiving the product identification from the product identification component, and a product information database for providing additional product information associated with the identified product to the controller. The code determination subsystem may additionally include a code determination module integrated with the controller for determining a product code based on the additional product information supplied by the product information database.
    • 本发明涉及一种用于自动产品编码和验证的方法和系统。 该系统可以包括用于识别用于编码的产品的产品识别组件,用于基于产品标识自动确定产品代码的代码确定子系统,以及用于在产品上打印确定的产品代码的打印子系统。 该系统还可以包括用于检查打印产品代码并在检查失败时产生报警的检查子系统。 代码确定子系统可以包括用于从产品标识组件接收产品标识的控制器和用于向控制器提供与所识别的产品相关联的附加产品信息的产品信息数据库。 代码确定子系统可以另外包括与控制器集成的代码确定模块,用于基于由产品信息数据库提供的附加产品信息来确定产品代码。
    • 2. 发明授权
    • Waste collection system
    • 废物收集系统
    • US09067245B2
    • 2015-06-30
    • US13999533
    • 2014-03-07
    • Gerald HubbellJames Hughes
    • Gerald HubbellJames Hughes
    • B07C5/00B07C5/34
    • B07C5/3412B07C2501/0054B65F1/0033B65F1/1426B65F1/1473B65F2001/008B65F2210/108B65F2210/148B65F2210/168B65F2210/176
    • A waste collection system to identify and classify waste materials into a plurality of pre-established categories and then to sort into and collect the waste materials by the plurality of the pre-established categories for subsequent disposal comprising a cabinet to house a plurality of collection bins or containers corresponding to the plurality of pre-established categories of waste materials to receive and collect the waste materials by the corresponding pre-established category, a waste sorting assembly to selectively direct the waste materials into the collection bin or container corresponding to the particular category of waste material, a latch mechanism to selectively engage the waste sorting assembly to control access into the cabinet and a system control to identify and classify waste materials into one of the plurality of pre-established categories and to direct the categorized waste material into the appropriate or corresponding collection bin or container for subsequent disposal.
    • 一种废物收集系统,用于识别废物分类并分类成多个预先确定的类别,然后通过多个预先确定的类别分类并收集废料,用于后续处理,包括一个橱柜以容纳多个收集箱 或对应于多个预先建立的废物类型的容器,以通过相应的预先确定的类别接收和收集废物;废物分类组件,用于选择性地将废料引导到与特定类别相对应的收集箱或容器中 的废料,用于选择性地接合废物分类组件以控制进入柜的通道的闭锁机构,以及系统控制,以将废料识别和分类成多个预先确定的类别之一,并将分类的废料引导到适当的 或相应的收集箱或容器用于后续di 孢子
    • 4. 发明授权
    • Circuit reset testing methods
    • 电路复位测试方法
    • US07710105B2
    • 2010-05-04
    • US11375838
    • 2006-03-14
    • Johnny ChanPhilip S. NgJames Hughes
    • Johnny ChanPhilip S. NgJames Hughes
    • G01R7/00H03L7/00
    • G01R31/3181
    • A method of testing power-on reset circuitry in an integrated circuit comprises establishing the a first state of the integrated circuit that is different from a normal reset state of the circuit, lowering the VCC power supply voltage from a normal high operating level VH to a specified lower level VP then raising it back to the normal high level, then determining whether or not the integrated circuit has assumed the reset state. The testing can repeated with a plurality of lower VCC levels VP and under a variety of operating conditions to characterize resetting parameters and to designate pass/fail results for individual chips. If an AC voltage detector is part of the power-on reset circuitry, then it can tested separately, and DC testing occurs with very slow ramp rates for lowering and raising the power supply voltage.
    • 一种测试集成电路中的上电复位电路的方法包括建立与电路的正常复位状态不同的集成电路的第一状态,将VCC电源电压从正常的高操作电平VH降低到 指定的下级VP然后将其提高回正常的高电平,然后确定集成电路是否已经承担复位状态。 测试可以用多个较低VCC电平VP重复并且在各种操作条件下重复以表征复位参数并且指定单个芯片的通过/失败结果。 如果交流电压检测器是上电复位电路的一部分,则可以单独测试,并且以非常缓慢的斜坡速率进行直流测试,以降低和提高电源电压。
    • 8. 发明申请
    • Current reduction by dynamic receiver adjustment in a communication device
    • 在通信设备中通过动态接收器调整的电流减少
    • US20060040617A1
    • 2006-02-23
    • US11240398
    • 2005-09-30
    • David HaubJames Hughes
    • David HaubJames Hughes
    • H04B17/00H04B1/06
    • H04B1/71H04B1/109H04B2201/70707
    • A method for reducing current drain in a communication device includes detecting (602, 604) interferers outside of a receiver passband of the communication device, measuring power levels and frequency offsets (608, 808) of the interferers and a transmitter of the communication device, and determining (609, 809) whether crossmodulation products exceed a noise spectrum threshold within the receiver passband. If the crossmodulation products exceed the threshold, the method includes calculating (605, 805) a receiver linearity required to achieve a desired signal-to-interference ratio and adjusting the receiver linearity calculated in the calculating step to achieve the desired signal-to-interference ratio.
    • 一种用于减少通信设备中的电流消耗的方法,包括在通信设备的接收机通带之外检测(602,604)干扰源,测量干扰源的功率电平和频率偏移(608,808)以及通信设备的发射机, 以及确定(609,809)交叉调制产物是否超过接收机通带内的噪声频谱阈值。 如果交叉调制产物超过阈值,则该方法包括计算(605,805)接收器线性度以获得期望的信号干扰比并且调整在计算步骤中计算的接收机线性度以实现期望的信号干扰 比。
    • 9. 发明申请
    • Methods of fabricating complex blade geometries from silicon wafers and strengthening blade geometries
    • 从硅晶片制造复杂刀片几何形状和加强刀片几何形状的方法
    • US20050266680A1
    • 2005-12-01
    • US11117730
    • 2005-04-29
    • Vadim DaskalJoseph KeenanJames HughesAttila KissSusan Chavez
    • Vadim DaskalJoseph KeenanJames HughesAttila KissSusan Chavez
    • A61B17/32H01L21/4763
    • A61B17/3211
    • Ophthalmic surgical blades are manufactured from either a single crystal or poly-crystalline material, preferably in the form of a wafer. The method comprises preparing the single crystal or poly-crystalline wafers by mounting them and etching trenches into the wafers using one of several processes. Methods for machining the trenches, which form the bevel blade surfaces, include a diamond blade saw, laser system, ultrasonic machine, a hot forge press and a router. Other processes include wet etching (isotropic and anisotropic) and dry etching (isotropic and anisotropic, including reactive ion etching), and combinations of these etching steps. The wafers are then placed in an etchant solution which isotropically etches the wafers in a uniform manner, such that layers of crystalline or poly-crystalline material are removed uniformly, producing single, double or multiple bevel blades. Nearly any angle can be machined into the wafer, and the machined angle remains after etching. The resulting radii of the blade edges is 5-500 nm, which is the same caliber as a diamond edged blade, but manufactured at a fraction of the cost. A range of radii may be 30 to 60 nm, with a specific implementation being about 40 nm. The blade profile may have an angle of, for example, about 60°. The ophthalmic surgical blades can be used for cataract and refractive surgical procedures, as well as microsurgical, biological and non-medical, non-biological purposes. Surgical and non-surgical blades and mechanical devices manufactured as described herein can also exhibit substantially smoother surfaces than metal blades.
    • 眼科手术刀片由单晶或多晶材料制成,优选为晶片形式。 该方法包括通过使用几种方法之一安装它们并将沟槽蚀刻到晶片中来准备单晶或多晶晶片。 用于加工形成斜面刀片表面的沟槽的方法包括金刚石锯片锯,激光系统,超声波机器,热锻压机和路由器。 其他工艺包括湿蚀刻(各向同性和各向异性)和干蚀刻(各向同性和各向异性,包括反应离子蚀刻)以及这些蚀刻步骤的组合。 然后将晶片放置在蚀刻剂溶液中,其均匀地蚀刻晶片,使得均匀地去除晶体或多晶材料层,产生单个,双重或多个斜面叶片。 几乎任何角度可以加工到晶片中,并且在蚀刻之后保留加工角度。 叶片边缘的最终半径为5-500nm,其与金刚石边缘刀片相同的口径,但是以成本的一小部分制造。 半径范围可以为30至60nm,具体实施方案为约40nm。 刀片轮廓可以具有例如约60°的角度。 眼科手术刀片可用于白内障和屈光手术,以及显微手术,生物和非医学,非生物学目的。 如本文所述制造的手术和非手术刀片和机械装置也可以表现出比金属刀片更基本平滑的表面。