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    • 5. 发明申请
    • Method and apparatus for a searchable data service
    • 用于可搜索数据服务的方法和装置
    • US20070168336A1
    • 2007-07-19
    • US11392482
    • 2006-03-29
    • Patrick RansilAleksey MartynovJames LarsonJames ColletteRobert ChuPartha Saha
    • Patrick RansilAleksey MartynovJames LarsonJames ColletteRobert ChuPartha Saha
    • G06F17/30
    • G06F17/3089
    • Method and apparatus for a searchable data service are described. The searchable data service may be implemented as a Web service with a Web service interface that allows the storage of locators and other attributes associated with entities stored in a data store in a searchable index. The attributes may be expressed as {name, value} pairs. The interface may allow client applications to query the searchable index to retrieve locators for entities in the backend data store according to the attributes associated with each locator. Search speed may be automatically optimized using, for example, indexes, query planning, and parallelism. The searchable data service provides a searchable index and is not a data store per se. The searchable data service separates searching and indexing of data from the actual storage of the data.
    • 描述可搜索数据服务的方法和装置。 可搜索数据服务可以被实现为具有Web服务接口的Web服务,该Web服务接口允许定位器和与存储在数据存储器中的实体相关联的其他属性存储在可搜索的索引中。 属性可以表示为{name,value}对。 接口可以允许客户端应用程序根据与每个定位器相关联的属性来查询可搜索索引以检索后端数据存储中的实体的定位符。 可以使用例如索引,查询规划和并行性来自动优化搜索速度。 可搜索的数据服务提供可搜索的索引,而不是数据存储本身。 可搜索数据服务将数据的搜索和索引与数据的实际存储分开。
    • 8. 发明申请
    • Test system for integrated circuits with serdes ports
    • 带Serdes端口的集成电路测试系统
    • US20050182588A1
    • 2005-08-18
    • US10778463
    • 2004-02-12
    • Gordon ChenowethMarc LorangerSteven PayneJames LarsonPatricia Justice
    • Gordon ChenowethMarc LorangerSteven PayneJames LarsonPatricia Justice
    • G01R31/317G01R31/319G06F19/00
    • G01R31/31907G01R31/31713
    • A system for testing an integrated circuit device under test (DUT) communicating though synchronous digital signals and through a high speed serialization/de-serialization (serdes) bus includes a serdes interface circuit for communicating with the DUT via the serdes bus and an integrated circuit (IC) tester for communicating with the DUT and with the serdes interface circuit via digital signals. State changes in the digital signals are synchronized to a clock signal within the IC tester. The serdes interface circuit receives instructions from the IC tester via at least one of the digital signals and responds to the instructions by transmitting data to the DUT via the serdes bus using appropriate serdes protocol, by receiving and storing data transmitted by the DUT via the serdes bus, and by thereafter forwarding the stored data to the IC tester via at least one of the digital signals.
    • 一种用于测试通过同步数字信号进行通信的集成电路设备(DUT)和通过高速串行化/解串行化(serdes)总线)的系统,包括用于经由serdes总线和集成电路与DUT通信的serdes接口电路 (IC)测试仪,通过数字信号与DUT和serdes接口电路进行通信。 数字信号中的状态变化与IC测试仪内的时钟信号同步。 Serdes接口电路通过至少一个数字信号接收来自IC测试器的指令,并通过使用适当的serdes协议通过serdes总线将数据发送到DUT来响应指令,通过接收和存储由DUT通过serdes发送的数据 总线,然后通过至少一个数字信号将所存储的数据转发到IC测试器。