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1. 发明申请

US20050182588A1 Test system for integrated circuits with serdes ports 失效
标题翻译：带Serdes端口的集成电路测试系统
公开(公告)号：US20050182588A1
公开(公告)日：2005-08-18
申请号：US10778463
申请日：2004-02-12
申请人： Gordon Chenoweth , Marc Loranger , Steven Payne , James Larson , Patricia Justice
发明人： Gordon Chenoweth , Marc Loranger , Steven Payne , James Larson , Patricia Justice
IPC分类号： G01R31/317 , G01R31/319 , G06F19/00
CPC分类号： G01R31/31907 , G01R31/31713
摘要： A system for testing an integrated circuit device under test (DUT) communicating though synchronous digital signals and through a high speed serialization/de-serialization (serdes) bus includes a serdes interface circuit for communicating with the DUT via the serdes bus and an integrated circuit (IC) tester for communicating with the DUT and with the serdes interface circuit via digital signals. State changes in the digital signals are synchronized to a clock signal within the IC tester. The serdes interface circuit receives instructions from the IC tester via at least one of the digital signals and responds to the instructions by transmitting data to the DUT via the serdes bus using appropriate serdes protocol, by receiving and storing data transmitted by the DUT via the serdes bus, and by thereafter forwarding the stored data to the IC tester via at least one of the digital signals.
摘要翻译：一种用于测试通过同步数字信号进行通信的集成电路设备（DUT）和通过高速串行化/解串行化（serdes）总线）的系统，包括用于经由serdes总线和集成电路与DUT通信的serdes接口电路（IC）测试仪，通过数字信号与DUT和serdes接口电路进行通信。数字信号中的状态变化与IC测试仪内的时钟信号同步。 Serdes接口电路通过至少一个数字信号接收来自IC测试器的指令，并通过使用适当的serdes协议通过serdes总线将数据发送到DUT来响应指令，通过接收和存储由DUT通过serdes发送的数据总线，然后通过至少一个数字信号将所存储的数据转发到IC测试器。

2. 发明申请

US20110156734A1 TEST SYSTEMS AND METHODS FOR TESTING ELECTRONIC DEVICES 有权
标题翻译：用于测试电子设备的测试系统和方法
公开(公告)号：US20110156734A1
公开(公告)日：2011-06-30
申请号：US12979159
申请日：2010-12-27
申请人： Tommie E. Berry , Keith J. Breinlinger , Eric D. Hobbs , Marc Loranger , Alexander H. Slocum , Adrian S. Wilson
发明人： Tommie E. Berry , Keith J. Breinlinger , Eric D. Hobbs , Marc Loranger , Alexander H. Slocum , Adrian S. Wilson
IPC分类号： G01R31/00
CPC分类号： G01R31/2891
摘要： Devices under test (DUTs) can be tested in a test system that includes an aligner and test cells. A DUT can be moved into and clamped in an aligned position on a carrier in the aligner. In the align position, electrically conductive terminals of the DUT can be in a predetermined position with respect to carrier alignment features of the carrier. The DUT/carrier combination can then be moved from the aligner into one of the test cells, where alignment features of the carrier are mechanically coupled with alignment features of a contactor in the test cell. The mechanical coupling automatically aligns terminals of the DUT with probes of the contactor. The probes thus contact and make electrical connections with the terminals of the DUT. The DUT is then tested. The aligner and each of the test cells can be separate and independent devices so that a DUT can be aligned in the aligner while other DUTs, having previously been aligned to a carrier in the aligner, are tested in a test cell.
摘要翻译：被测设备（DUT）可以在包括对准器和测试单元的测试系统中进行测试。 DUT可以被移动并被夹持在对准器中的载体上的对准位置。在对准位置，DUT的导电端子可以相对于载体的载体对准特征处于预定位置。然后可以将DUT /载体组合从对准器移动到测试单元之一中，其中载体的对准特征与测试单元中的接触器的对准特征机械耦合。机械联轴器将DUT的端子自动对准接触器的探头。探头因此与DUT的端子接触并进行电气连接。然后测试DUT。对准器和每个测试单元可以是分离和独立的器件，使得DUT可以在对准器中对准，而在测试单元中测试已经与对准器中的载体对准的其它DUT。

3. 发明授权

US08587331B2 Test systems and methods for testing electronic devices 有权
标题翻译：用于测试电子设备的测试系统和方法
公开(公告)号：US08587331B2
公开(公告)日：2013-11-19
申请号：US12979159
申请日：2010-12-27
申请人： Tommie E. Berry , Keith J. Breinlinger , Eric D. Hobbs , Marc Loranger , Alexander H. Slocum , Adrian S. Wilson
发明人： Tommie E. Berry , Keith J. Breinlinger , Eric D. Hobbs , Marc Loranger , Alexander H. Slocum , Adrian S. Wilson
IPC分类号： G01R31/00
CPC分类号： G01R31/2891
摘要： Devices under test (DUTs) can be tested in a test system that includes an aligner and test cells. A DUT can be moved into and clamped in an aligned position on a carrier in the aligner. In the align position, electrically conductive terminals of the DUT can be in a predetermined position with respect to carrier alignment features of the carrier. The DUT/carrier combination can then be moved from the aligner into one of the test cells, where alignment features of the carrier are mechanically coupled with alignment features of a contactor in the test cell. The mechanical coupling automatically aligns terminals of the DUT with probes of the contactor. The probes thus contact and make electrical connections with the terminals of the DUT. The DUT is then tested. The aligner and each of the test cells can be separate and independent devices so that a DUT can be aligned in the aligner while other DUTs, having previously been aligned to a carrier in the aligner, are tested in a test cell.
摘要翻译：被测设备（DUT）可以在包括对准器和测试单元的测试系统中进行测试。 DUT可以被移动并被夹持在对准器中的载体上的对准位置。在对准位置，DUT的导电端子可以相对于载体的载体对准特征处于预定位置。然后可以将DUT /载体组合从对准器移动到测试单元之一中，其中载体的对准特征与测试单元中的接触器的对准特征机械耦合。机械联轴器将DUT的端子自动对准接触器的探头。探头因此与DUT的端子接触并进行电气连接。然后测试DUT。对准器和每个测试单元可以是分离和独立的器件，使得DUT可以在对准器中对准，而在测试单元中测试已经与对准器中的载体对准的其它DUT。

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