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1. 发明授权

US07553772B1 Process and apparatus for simultaneous light and radical surface treatment of integrated circuit structure 失效
标题翻译：集成电路结构的同时光和自由基表面处理的工艺和装置
公开(公告)号：US07553772B1
公开(公告)日：2009-06-30
申请号：US11046949
申请日：2005-01-31
申请人： Shiqun Gu , Wai Lo , Hong Lin
发明人： Shiqun Gu , Wai Lo , Hong Lin
IPC分类号： H01L21/302 , H01L21/461
CPC分类号： H01L21/76814 , H01L21/02238 , H01L21/02247 , H01L21/02249 , H01L21/3105 , H01L21/31662 , H01L21/3185
摘要： Process and apparatus provide reactive radicals generated from a remote plasma source which contact a portion of a substrate surface simultaneous with a contact of the same substrate surface with a light source which locally activates the portion of the substrate surface in contact with said radicals.
摘要翻译：工艺和设备提供从远程等离子体源产生的反应性基团，其接触衬底表面的一部分，同时与同一衬底表面的接触与局部激活与所述自由基接触的衬底表面的部分的光源。

2. 发明申请

US20060035455A1 Interconnect dielectric tuning 失效
公开(公告)号：US20060035455A1
公开(公告)日：2006-02-16
申请号：US10915719
申请日：2004-08-10
申请人： Wai Lo , Hong Lin , Shiqun Gu , Wilbur Catabay , Zhihai Wang , Wei-Jen Hsia
发明人： Wai Lo , Hong Lin , Shiqun Gu , Wilbur Catabay , Zhihai Wang , Wei-Jen Hsia
IPC分类号： H01L21/4763
CPC分类号： H01L21/7682 , H01L21/76838 , H01L23/5222 , H01L23/53295 , H01L2924/0002 , H01L2924/00
摘要： An improvement to a method of forming an integrated circuit. An etch stop layer is formed to overlie the front end processing layers of the integrated circuit. Support structures are formed that are disposed so as to support electrically conductive interconnects on various levels of the integrated circuit. Substantially all of the non electrically conductive layers above the etch stop layer that were formed during the fabrication of the interconnects are removed.

3. 发明申请

US20050064716A1 Plasma removal of high k metal oxide 审中-公开
标题翻译：等离子体去除高k金属氧化物
公开(公告)号：US20050064716A1
公开(公告)日：2005-03-24
申请号：US10951646
申请日：2004-09-28
申请人： Hong Lin , Shiqun Gu , Wai Lo , James Elmer
发明人： Hong Lin , Shiqun Gu , Wai Lo , James Elmer
IPC分类号： H01L21/28 , H01L21/311 , H01L29/51 , H01L29/80 , H01L21/302 , H01L21/461 , H01L31/112
CPC分类号： H01L29/518 , H01L21/28185 , H01L21/28202 , H01L21/31111 , H01L29/51 , H01L29/511 , H01L29/513 , H01L29/517
摘要： A method of forming a high k gate insulation layer in an integrated circuit on a substrate. A high k layer is deposited onto the substrate, and patterned with a mask to define the high k gate insulation layer and exposed portions of the high k layer. The exposed portions of the high k layer are subjected to an in-situ plasma species that causes structural damage to the exposed portions of the high k layer. The structurally damaged exposed portions of the high k layer are wet etched to leave the high k gate insulation layer.
摘要翻译：在基板上的集成电路中形成高k栅极绝缘层的方法。将高k层沉积在衬底上，并用掩模图案以限定高k栅极绝缘层和高k层的暴露部分。高k层的暴露部分经受原位等离子体物质，这导致对高k层的暴露部分的结构损伤。高k层的结构损坏的暴露部分被湿蚀刻以留下高k栅极绝缘层。

4. 发明授权

US07259462B1 Interconnect dielectric tuning 有权
标题翻译：互连电介质调谐
公开(公告)号：US07259462B1
公开(公告)日：2007-08-21
申请号：US11419548
申请日：2006-05-22
申请人： Wai Lo , Hong Lin , Shiqun Gu , Wilbur G. Catabay , Zhihai Wang , Wei-Jen Hsia
发明人： Wai Lo , Hong Lin , Shiqun Gu , Wilbur G. Catabay , Zhihai Wang , Wei-Jen Hsia
IPC分类号： H01L23/48 , H01L23/52 , H01L29/40
CPC分类号： H01L21/7682 , H01L21/76838 , H01L23/5222 , H01L23/53295 , H01L2924/0002 , H01L2924/00
摘要： An improvement to a method of forming an integrated circuit. An etch stop layer is formed to overlie the front end processing layers of the integrated circuit. Support structures are formed that are disposed so as to support electrically conductive interconnects on various levels of the integrated circuit. Substantially all of the non electrically conductive layers above the etch stop layer that were formed during the fabrication of the interconnects are removed.
摘要翻译：对形成集成电路的方法的改进。形成蚀刻停止层以覆盖集成电路的前端处理层。形成支撑结构，其被布置为支撑集成电路的各个级别上的导电互连。基本上去除了在制造互连期间形成的蚀刻停止层上方的所有非导电层。

5. 发明授权

US06818516B1 Selective high k dielectrics removal 失效
标题翻译：选择性高k电介质去除
公开(公告)号：US06818516B1
公开(公告)日：2004-11-16
申请号：US10629496
申请日：2003-07-29
申请人： Wai Lo , Hong Lin , Shiqun Gu , James R. B. Elmer
发明人： Wai Lo , Hong Lin , Shiqun Gu , James R. B. Elmer
IPC分类号： H01L21336
CPC分类号： H01L29/6659 , H01L21/31111
摘要： A method of forming a gate structure in an integrated circuit on a substrate. A high k layer is formed on the substrate, and a gate electrode layer is formed on the high k layer. The gate electrode layer is the patterned. LDD regions are formed using an ion implantation process, thereby creating damaged portions of the high k layer. A first portion of the damaged portions of the high k layer are removed, thereby defining a gate structure, and leaving remaining portions of the damaged portions of the high k layer. Sidewall spacers are formed adjacent the gate structure. Source/drain regions are formed using an ion implantation process, thereby further damaging the remaining portions of the damaged portions of the high k layer. The remaining portions of the damaged portions of the high k layer are then removed.
摘要翻译：在基板上的集成电路中形成栅极结构的方法。在基板上形成高k层，在高k层上形成栅电极层。栅极电极层是图案化的。使用离子注入工艺形成LDD区域，从而产生高k层的损坏部分。去除高k层的损坏部分的第一部分，从而限定栅极结构，并留下高k层的损坏部分的剩余部分。侧壁间隔件形成在栅极结构附近。使用离子注入工艺形成源极/漏极区，从而进一步损坏高k层的损伤部分的剩余部分。然后去除高k层的损坏部分的剩余部分。

6. 发明申请

US20060197193A1 Superconductor wires for back end interconnects 有权
标题翻译：用于后端互连的超导线
公开(公告)号：US20060197193A1
公开(公告)日：2006-09-07
申请号：US11072158
申请日：2005-03-04
申请人： Shiqun Gu , Wai Lo , Hong Lin
发明人： Shiqun Gu , Wai Lo , Hong Lin
IPC分类号： H01L39/00
CPC分类号： H01L21/76838 , H01L21/76834 , H01L23/53285 , H01L2924/0002 , H01L2924/00
摘要： An improvement to an integrated circuit, of electrically conductive interconnects formed of a superconducting material. In this manner, the electrically conductive interconnects can be made very small, and yet still have adequate conductively. In various embodiments, all of the electrically conductive interconnects are formed of the superconducting material. In some embodiments, the electrically conductive interconnects are formed of a variety of different superconducting materials. In one embodiment, only the backend electrically conductive interconnects are formed of the superconducting material. In some embodiments no vias are formed of the superconducting material. The interconductor dielectric layers are preferably formed of silicon oxide, and sometimes all of the interconductor dielectric layers are formed of silicon oxide. The superconducting material is in some embodiments at least one of an organic compound such as a potassium doped buckminsterfullerene, a cesium doped buckminsterfullerene, and other carbon containing compounds, a metallic material such as an inter-metallic material like Nb—Ti alloys and other substances formed by alloying metals, and an inorganic compound such as YBa2Cu3O7-x, (Pb,Bi)2Sr2Ca2Cu3O10-x and its derivatives, HgBaCaCuO and its derivatives, and TI—Ba—Ca—Cu—O and its derivatives.
摘要翻译：对由超导材料形成的导电互连的集成电路的改进。以这种方式，可以使导电互连非常小，但仍然具有足够的导电性。在各种实施例中，所有导电互连由超导材料形成。在一些实施例中，导电互连由各种不同的超导材料形成。在一个实施例中，只有后端导电互连由超导材料形成。在一些实施例中，没有由超导材料形成通孔。互导体电介质层优选由氧化硅形成，并且有时所有的互导电介质层均由氧化硅形成。在一些实施方案中，超导材料是有机化合物，例如掺杂钾的巴克敏斯特富勒烯，掺杂铯的德克敏斯特富勒烯和其它含碳化合物中的至少一种，金属材料如诸如Nb-Ti合金的金属间材料和其它物质由金属合金化而形成的无机化合物，例如YBa 2 N 3 O 7-x X，（Pb，Bi）2 Sr 2 O 2和其衍生物HgBaCaCuO及其衍生物和TI-Ba-Ca-Cu-O及其衍生物。

7. 发明授权

US06746925B1 High-k dielectric bird's beak optimizations using in-situ O2 plasma oxidation 有权
标题翻译：使用原位O2等离子体氧化的高k电介质鸟的喙优化
公开(公告)号：US06746925B1
公开(公告)日：2004-06-08
申请号：US10397451
申请日：2003-03-25
申请人： Hong Lin , Shiqun Gu , Wai Lo , Jim Elmer
发明人： Hong Lin , Shiqun Gu , Wai Lo , Jim Elmer
IPC分类号： H01L21336
CPC分类号： H01L21/28247 , H01L21/32105
摘要： In a method of forming an integrated circuit device, sidewall oxides are formed by plasma oxidation on the patterned gate. This controls encroachment beneath a dielectric layer underlying the patterned gate. The patterned gate is oxidized using in-situ O2 plasma oxidation. The presence of the sidewall oxides minimizes encroachment under the gate edge.
摘要翻译：在形成集成电路器件的方法中，通过等离子体氧化在图案化的栅极上形成侧壁氧化物。这控制在图案化栅极下面的介电层下方的侵入。图案化栅极使用原位氧等离子体氧化进行氧化。侧壁氧化物的存在使栅极边缘下的侵蚀最小化。

8. 发明授权

US07341978B2 Superconductor wires for back end interconnects 有权
标题翻译：用于后端互连的超导线
公开(公告)号：US07341978B2
公开(公告)日：2008-03-11
申请号：US11072158
申请日：2005-03-04
申请人： Shiqun Gu , Wai Lo , Hong Lin
发明人： Shiqun Gu , Wai Lo , Hong Lin
IPC分类号： H01L33/00
CPC分类号： H01L21/76838 , H01L21/76834 , H01L23/53285 , H01L2924/0002 , H01L2924/00
摘要： An improvement to an integrated circuit, of electrically conductive interconnects formed of a superconducting material. In this manner, the electrically conductive interconnects can be made very small, and yet still have adequate conductively. In various embodiments, all of the electrically conductive interconnects are formed of the superconducting material. In some embodiments, the electrically conductive interconnects are formed of a variety of different superconducting materials. In one embodiment, only the backend electrically conductive interconnects are formed of the superconducting material. In some embodiments no vias are formed of the superconducting material. The interconductor dielectric layers are preferably formed of silicon oxide, and sometimes all of the interconductor dielectric layers are formed of silicon oxide. The superconducting material is in some embodiments at least one of an organic compound such as a potassium doped buckminsterfullerene, a cesium doped buckminsterfullerene, and other carbon containing compounds, a metallic material such as an inter-metallic material like Nb—Ti alloys and other substances formed by alloying metals, and an inorganic compound such as YBa2Cu3O7-x, (Pb,Bi)2Sr2Ca2Cu3O10-x and its derivatives, HgBaCaCuO and its derivatives, and TI—Ba—Ca—Cu—O and its derivatives.
摘要翻译：对由超导材料形成的导电互连的集成电路的改进。以这种方式，可以使导电互连非常小，但仍然具有足够的导电性。在各种实施例中，所有导电互连由超导材料形成。在一些实施例中，导电互连由各种不同的超导材料形成。在一个实施例中，只有后端导电互连由超导材料形成。在一些实施例中，没有由超导材料形成通孔。互导体电介质层优选由氧化硅形成，并且有时所有的互导电介质层均由氧化硅形成。在一些实施方案中，超导材料是有机化合物，例如掺杂钾的巴克敏斯特富勒烯，掺杂铯的德克敏斯特富勒烯和其它含碳化合物中的至少一种，金属材料如诸如Nb-Ti合金的金属间材料和其它物质由金属合金化而形成的无机化合物，例如YBa 2 N 3 O 7-x X，（Pb，Bi）2 Sr 2 O 2和其衍生物HgBaCaCuO及其衍生物和TI-Ba-Ca-Cu-O及其衍生物。

9. 发明授权

US07081406B2 Interconnect dielectric tuning 失效
标题翻译：互连电介质调谐
公开(公告)号：US07081406B2
公开(公告)日：2006-07-25
申请号：US10915719
申请日：2004-08-10
申请人： Wai Lo , Hong Lin , Shiqun Gu , Wilbur G. Catabay , Zhihai Wang , Wei-Jen Hsia
发明人： Wai Lo , Hong Lin , Shiqun Gu , Wilbur G. Catabay , Zhihai Wang , Wei-Jen Hsia
IPC分类号： H01L21/4763
CPC分类号： H01L21/7682 , H01L21/76838 , H01L23/5222 , H01L23/53295 , H01L2924/0002 , H01L2924/00
摘要： An improvement to a method of forming an integrated circuit. An etch stop layer is formed to overlie the front end processing layers of the integrated circuit. Support structures are formed that are disposed so as to support electrically conductive interconnects on various levels of the integrated circuit. Substantially all of the non electrically conductive layers above the etch stop layer that were formed during the fabrication of the interconnects are removed.
摘要翻译：对形成集成电路的方法的改进。形成蚀刻停止层以覆盖集成电路的前端处理层。形成支撑结构，其被布置为支撑集成电路的各个级别上的导电互连。基本上去除了在制造互连期间形成的蚀刻停止层上方的所有非导电层。

10. 发明授权

US06743669B1 Method of reducing leakage using Si3N4 or SiON block dielectric films 有权
标题翻译：使用Si3N4或SiON嵌段电介质薄膜减少泄漏的方法
公开(公告)号：US06743669B1
公开(公告)日：2004-06-01
申请号：US10164227
申请日：2002-06-05
申请人： Hong Lin , Shiqun Gu , Peter McGrath
发明人： Hong Lin , Shiqun Gu , Peter McGrath
IPC分类号： H01L218234
CPC分类号： H01L21/823481 , H01L21/3144 , H01L21/3185 , H01L27/0629
摘要： A dielectric film block is used in semiconductor processing to protect selected areas of the wafer from silicidation. The selected areas may include resistors. A first layer of oxide is formed on the resistor and a second layer comprising SiON or Si3N4 is disposed on the oxide. A mask is patterned to allow etching to take place in the areas where silicide formation is desired. The oxide layer serves as an etch stop layer during etching of the second layer.
摘要翻译：在半导体处理中使用介电膜块来保护晶片的选定区域免受硅化。所选择的区域可以包括电阻器。在电阻器上形成第一层氧化物，并且在氧化物上设置包含SiON或Si3N4的第二层。对掩模进行图案化以允许在需要硅化物形成的区域进行蚀刻。氧化物层在蚀刻第二层期间用作蚀刻停止层。

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