专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US06184535B2 Method of microscopic observation 有权
标题翻译：显微镜观察方法
公开(公告)号：US06184535B2
公开(公告)日：2001-02-06
申请号：US09156775
申请日：1998-09-18
申请人： Shingo Kashima , Yoshinori Iketaki
发明人： Shingo Kashima , Yoshinori Iketaki
IPC分类号： G01N2164
CPC分类号： G01N21/6458 , G01N21/6428 , G01N2021/6419 , G02B21/002 , G02B21/16
摘要： In a method of observing a specimen through a fluorescence microscope, molecules that could cause double-resonance absorption process in an appropriate manner are used to dye the specimen, and the specimen is irradiated with a plurality of light beams of different wavelengths in a good timing, so that a microscopic image with high spatial resolution is obtained. In the microscope to be used in the method of observation, the specimen is irradiated with two light beams of different wavelength bands via an aperture with an annular-zonal structure and an optical system that has different in-focus positions for these two wavelength bands, so that one of the two light beam is focused on a surface of the specimen and the other light beam is defocused thereon. Consequently, the microscope achieves improvement of the spatial resolution as to overcome the diffraction limit determined by the wavelengths in use.
摘要翻译：在通过荧光显微镜观察样品的方法中，使用可以以适当的方式引起双共振吸收过程的分子染色样品，并且以良好的时间用多个不同波长的光束照射样品，从而获得具有高空间分辨率的显微图像。在用于观察方法的显微镜中，通过具有环形区域结构和光学系统的孔径，用两个不同波长带的光束照射样品对于这两个波长带具有不同的对焦位置，使得两个光束中的一个被聚焦在样本的表面上，并且另一个光束在其上散焦。因此，显微镜实现空间分辨率的提高，以克服由使用的波长确定的衍射极限。

2. 发明授权

US08947658B2 Nonlinear optical microscope and nonlinear optical microscopy 有权
标题翻译：非线性光学显微镜和非线性光学显微镜
公开(公告)号：US08947658B2
公开(公告)日：2015-02-03
申请号：US13610563
申请日：2012-09-11
申请人： Yoshinori Iketaki , Hideaki Kano
发明人： Yoshinori Iketaki , Hideaki Kano
IPC分类号： G01J3/44 , G01N21/65 , G01J3/10 , G02B21/00 , G02B21/08 , G02B21/14 , G02B27/44
CPC分类号： G01N21/65 , G01J3/10 , G01J3/44 , G01N2021/653 , G02B21/0004 , G02B21/082 , G02B21/14 , G02B27/425 , G02B27/44
摘要： Provided is a nonlinear optical microscope capable of improving the spatial resolution. The nonlinear optical microscope includes: an illuminating part for irradiating, through an objective lens, a sample with at least two colors of illumination light beams spatially and temporally overlapping each other; and a detecting part for detecting signal light generated from the sample due to nonlinear optical effect, the signal light resulting from the irradiation of the sample with the at least two colors of illumination light beams, in which the illuminating part irradiates the sample with the two colors of illumination light beams in which at least one of the illumination light beams has a wavefront distribution different from a wavefront distribution of the other one of the illumination light beams.
摘要翻译：提供了能够提高空间分辨率的非线性光学显微镜。非线性光学显微镜包括：照明部，其通过物镜照射具有空间和时间上彼此重叠的至少两种照明光束的样品; 以及检测部，其用于检测由于非线性光学效应而从样本产生的信号光，所述信号光由具有所述至少两种颜色的照明光束的所述样本的照射而产生，所述照明部分照射所述样本与所述两个其中至少一个照明光束具有与另一个照明光束的波前分布不同的波前分布的照明光束的颜色。

3. 发明授权

US5650616A Apparatus and method for analyzing surface 失效
标题翻译：用于分析表面的装置和方法
公开(公告)号：US5650616A
公开(公告)日：1997-07-22
申请号：US390352
申请日：1995-02-16
申请人： Yoshinori Iketaki
发明人： Yoshinori Iketaki
IPC分类号： G01N23/22 , B01D59/44 , H01J49/00
CPC分类号： H01J49/061 , G01N23/22 , H01J49/142
摘要： A surface analyzing apparatus includes a laser plasma radiation source, an optical condensing system for converging ultraviolet light, vacuum ultraviolet light, or X rays emitted from the laser plasma radiation source on the surface of a sample, and a mass spectrometer or a time-of-flight spectrometer for detecting the secondary ions emitted from the sample. Thus, the surface analyzing apparatus is capable of analyzing two-dimensionally adsorbed substances on the sample surface with a high resolving power.
摘要翻译：表面分析装置包括激光等离子体辐射源，用于会聚紫外光的聚光系统，真空紫外光或从激光等离子体辐射源在样品表面发射的X射线，以及质谱仪或时间 - 用于检测从样品发射的二次离子的光谱仪。因此，表面分析装置能够以高分辨能力分析样品表面上的二维吸附物质。

4. 发明授权

US07095556B2 Microscope with wavelength compensation 有权
标题翻译：具有波长补偿的显微镜
公开(公告)号：US07095556B2
公开(公告)日：2006-08-22
申请号：US10771729
申请日：2004-02-04
申请人： Yoshinori Iketaki , Takeshi Watanabe , Masaaki Fujii , Yasunori Igasaki , Toshio Suzuki
发明人： Yoshinori Iketaki , Takeshi Watanabe , Masaaki Fujii , Yasunori Igasaki , Toshio Suzuki
IPC分类号： G02B21/06 , G01J3/30
CPC分类号： G02B26/08
摘要： A microscope capable of being shaped into a beam with complete hollow shape by removing the disorder of the wavefront to the erase light, particularly, and capable of improving the spatial resolution by inducing a super-resolution near the limit, is provided. In the microscope, wherein a first light to excite a molecule from a ground-state to first electron excited state or a second light to excite the molecule from the first electron excited state to the second electron excited state with higher energy level, for a sample 56 including the molecule with three electronic states including at least a ground-state, are spatial phase-modulated into the prescribed beam shape, and parts of these first light and the second light are overlapped and focused to detect luminescence from the sample 56, a wavefront compensation means 61 is provided in the optical path of the first light and/or in the optical path of the second light, and the wavefront aberration caused in the first light and/or in the second light, is removed by the wavefront compensation means 61.
摘要翻译：提供了能够通过将擦除光的波阵面除去特别是并且能够通过在接近极限附近引起超分辨率来改善空间分辨率而将具有完全中空形状的光束成形为显微镜的显微镜。在显微镜中，其中将分子从基态激发到第一电子激发态的第一光或第二光以将分子从第一电子激发态激发至具有较高能级的第二电子激发态，对于样品包括具有至少包括基态的三种电子状态的分子被空间相位调制成规定的波束形状，并且这些第一光和第二光的一部分被重叠和聚焦以检测来自样品56的发光，波前补偿装置61设置在第一光的光路和/或第二光的光路中，并且在第一光和/或第二光中引起的波前像差被波前补偿装置除去 61。

5. 发明授权

US5835262A Multi-wavelength optical microscope 失效
标题翻译：多波长光学显微镜
公开(公告)号：US5835262A
公开(公告)日：1998-11-10
申请号：US580196
申请日：1995-12-28
申请人： Yoshinori Iketaki , Masaaki Fujii
发明人： Yoshinori Iketaki , Masaaki Fujii
IPC分类号： G02B21/06 , G02B5/30 , F21V9/16 , G02B13/14
CPC分类号： G02B21/06
摘要： A high-accuracy multi-wavelength optical microscope for providing a satisfactory contrast of image and much information about a sample. The microscope includes a plurality of light sources, a wavelength varietor independently varying the wavelength of the individual light sources, and polarization plane rotators on the optical path for each light source.
摘要翻译：一种高精度多波长光学显微镜，用于提供令人满意的图像对比度和关于样品的大量信息。显微镜包括多个光源，独立地改变各个光源的波长的波长变换器和用于每个光源的光路上的偏振面旋转器。

6. 发明授权

US5432831A Vacuum optical system 失效
标题翻译：真空光学系统
公开(公告)号：US5432831A
公开(公告)日：1995-07-11
申请号：US118246
申请日：1993-09-09
申请人： Komei Nagai , Yoshinori Iketaki , Yoshiaki Horikawa
发明人： Komei Nagai , Yoshinori Iketaki , Yoshiaki Horikawa
IPC分类号： G02B21/26 , G03F7/20 , G21K7/00
CPC分类号： B82Y10/00 , G02B21/26 , G03F7/70033 , G03F7/70233 , G03F7/70841 , G03F7/70916 , G21K7/00
摘要： A vacuum optical system has a vacuum chamber for housing an optical system used in a vacuum. The vacuum chamber is equipped with a member, on which the optical system is at least mounted, supported by such parts that when a pressure in the vacuum chamber changes to deform the vacuum chamber, the amount of displacement transmitted to the optical system is smaller than a predetermined tolerance depending on an accuracy necessary for the optical system. Thus, the vacuum optical system can be obtained which does away with the need for readjustment of optical alignment and is compact.
摘要翻译：真空光学系统具有用于容纳在真空中使用的光学系统的真空室。真空室配备有一个部件，光学系统至少安装在该部件上，由这些部件支撑，当真空室中的压力变化使真空室发生变形时，传递到光学系统的位移量小于取决于光学系统所需的精度的预定公差。因此，可以获得不需要重新调整光学对准的真空光学系统，并且紧凑。

7. 发明申请

US20100067102A1 OPTICAL MICROSCOPE 有权
标题翻译：光学显微镜
公开(公告)号：US20100067102A1
公开(公告)日：2010-03-18
申请号：US12553357
申请日：2009-09-03
申请人： Eiji YOKOI , Yoshinori Iketaki
发明人： Eiji YOKOI , Yoshinori Iketaki
IPC分类号： G02B21/06
CPC分类号： G02B21/16 , G01N21/636 , G01N21/6458 , G01N21/65 , G01N2021/1736 , G01N2021/6493
摘要： The present invention provides an optical microscope capable of suppressing unnecessary response light as a background and detecting desired response light in nonlinear optical response process with a good S/N ratio. The optical microscope for collecting, on a sample 8, stimulation light emitted from a stimulation light source 1 and having a single wavelength or a plurality of different wavelengths, and detecting response light emitted from the sample 8 in nonlinear optical response process, comprises: an erase light source 2 for emitting erase light having a wavelength different from that of the stimulation light and inducing an effect of suppressing secondary response light which appears due to irradiation of the stimulation light on the sample 8, wherein the erase light and the stimulation light are simultaneously irradiated on the sample 8 such that the erase light does not suppress response light emitted from a light-collecting area of the stimulation light but suppresses the secondary response light other than the response light emitted from a light-collecting area of the stimulation light.
摘要翻译：本发明提供一种能够抑制不必要的响应光作为背景的光学显微镜，并以良好的S / N比检测非线性光学响应处理中的期望的响应光。用于在样品8上收集从刺激光源1发射并具有单一波长或多个不同波长的刺激光并且在非线性光学响应过程中检测从样品8发射的响应光的光学显微镜包括：擦除光源2，用于发射具有与刺激光的波长不同的波长的擦除光，并且引起抑制由于刺激光照射在样品8上而出现的二次响应光的效果，其中擦除光和刺激光是同时对样品8照射，使得擦除光不抑制从刺激光的聚光区域发出的响应光，而是抑制除了从刺激光的聚光区域发出的响应光之外的二次响应光。

8. 发明申请

US20100014156A1 MICROSCOPE 审中-公开
标题翻译：显微镜
公开(公告)号：US20100014156A1
公开(公告)日：2010-01-21
申请号：US12438994
申请日：2007-08-08
申请人： Yoshinori Iketaki
发明人： Yoshinori Iketaki
IPC分类号： G02B21/06
CPC分类号： G02B21/16 , G01N21/6458 , G01N2021/6415 , G01N2201/06113 , G01N2201/104 , G01N2201/1053 , G02B5/20 , G02B5/3083 , G02B21/002 , G02B26/06 , G02B2207/113
摘要： A microscope for observing a sample containing a substance having at least two excited quantum states includes a pump light source 21 for emitting pump light, an erase light source 22 for emitting erase light, a light combining section 23 to 26 for coaxially combining the pump light and the erase light, a light collecting section 62 for collecting the combined lights, a scanning section 44 and 45 for scanning the sample with the combined lights, a detecting section 50 for detecting photoresponsive signals generated from the sample, a wavelength selecting element 42 arranged in the light path of the combined lights and provided with an erase light selecting region having a high wavelength selectivity for the erase light and with a pump light selecting region having a high wavelength selectivity for the pump light, and a space modulating element 43 arranged in the light path of the combined lights for spatially modulating the erase light corresponding to the erase light selecting region of the wavelength selecting element.
摘要翻译：用于观察含有具有至少两个激发量子态的物质的样品的显微镜包括用于发射泵浦光的泵浦光源21，用于发射擦除光的擦除光源22，用于同时组合泵浦光的光合成部23至26 擦除光，用于收集组合光的光收集部分62，用于组合光扫描样本的扫描部分44和45;检测部分50，用于检测从样本产生的光响应信号;波长选择元件42，被布置在组合光的光路中设置有对于擦除光具有高波长选择性的擦除光选择区域和对泵浦光具有高波长选择性的泵浦光选择区域，以及空间调制元件43，其布置在用于空间调制对应于擦除光选择区域的擦除光的组合光的光路的波长选择元件。

9. 发明申请

US20090261271A1 SAMPLE OBSERVING METHOD AND MICROSCOPE 审中-公开
标题翻译：样品观察方法和显微镜
公开(公告)号：US20090261271A1
公开(公告)日：2009-10-22
申请号：US12309440
申请日：2007-07-02
申请人： Yoshinori Iketaki
发明人： Yoshinori Iketaki
IPC分类号： G01N21/00 , G02B21/06 , G01J3/46
CPC分类号： G02B21/16 , G01N21/6458 , G01N2021/6432
摘要： A method for observing a sample containing photochromic molecules having a quantum state of at least a first stable state S0 and a second stable state S3. Used are first light for exciting the photochromic molecules from the first stable state S0 to a first excited state S1 enabling optical response, and second light for exciting the photochromic molecules from the first excited state S1 to a second excited state S2 of another energy level. The sample is irradiated with the first light and the second light partly overlapping each other so that the photochromic molecules in the region irradiated with the overlapping first and second lights are transformed through the second excited state S2 to the second stable state S3, and the photochromic molecules in the region irradiated with the first light only are transformed to the first excited state S1, thereby observing the sample.
摘要翻译：一种用于观察含有具有至少第一稳定状态S0和第二稳定状态S3的量子态的光致变色分子的样品的方法。使用的是用于激发从第一稳定状态S0到能够进行光响应的第一激发态S1的光致变色分子的第一光，以及用于将光致变色分子从第一激发态S1激励到另一能级的第二激发态S2的第二光。用第一光照射样品，第二光部分地彼此重叠，使得被重叠的第一和第二光照射的区域中的光致变色分子通过第二激发态S2转变为第二稳定状态S3，并且光致变色将仅用第一光照射的区域中的分子转变为第一激发态S1，从而观察样品。

10. 发明申请

US20070291353A1 Super-Resolution Microscope 有权
标题翻译：超分辨率显微镜
公开(公告)号：US20070291353A1
公开(公告)日：2007-12-20
申请号：US11659525
申请日：2005-07-25
申请人： Yoshinori Iketaki , Takeshi Watanabe , Masaaki Fujii
发明人： Yoshinori Iketaki , Takeshi Watanabe , Masaaki Fujii
IPC分类号： G02B21/06 , H01S3/00
CPC分类号： G01N21/6458 , G01N2021/6419 , G01N2021/6439 , G02B21/002 , G02B21/16 , G02B27/58
摘要： [Task] To provide a super-resolution microscope whereby the light source of pump light and erase light can be selected easily and a super-resolution can be reliably achieved through a simple and inexpensive arrangement. [Solution of the Task] A super-resolution microscope includes an optical system (3, 4, 9) for combining a part of a first coherent light from a first light source (2) and a part of a second coherent light from a second light source (1) and focusing the coherent lights onto a sample (10), scanning means (6, 7) for scanning the coherent lights, and detecting means (16) for detecting an optical response signal from the sample (10). The microscope is configured so as to satisfy the following conditions: σ01Ipτ≦1, and 0.65(λe/λp)≦τσdipIe where λp is the wavelength of the first coherent light, λe is the wavelength of the second coherent light, τ is the excited lifetime in which the molecule is excited by the first coherent light from the ground state to the first electron-excited state, Ip is the maximum photon flux on the sample surface of the first coherent light, Ie is the maximum photon flux on the sample surface of the second coherent light, σ01, is the absorption cross-sectional area when the molecule is exited from the ground state to the first electron-excited state, and σdip is the fluorescence suppression cross-sectional area.
摘要翻译： [任务]提供一种能够容易地选择泵浦光和擦除光的光源的超分辨率显微镜，并且通过简单且廉价的布置可以可靠地实现超分辨率。 [任务的解决方案]超分辨率显微镜包括用于组合来自第一光源（2）的第一相干光的一部分和来自第二光源的第二相干光的一部分的光学系统（3,4,9）光源（1），并将相干光聚焦到样品（10）上，用于扫描相干光的扫描装置（6,7）以及用于检测来自样品（10）的光响应信号的检测装置（16）。显微镜被配置为满足以下条件：<？in-line-formula description =“In-line Formulas”end =“lead”？> sigma Iptau <= 1，？in-line-formula description =“In-line Formulas”end =“tail”？> <？in-line-formula description =“In-line formula”end =“lead”？> 0.65（lambdae / lambdap） = tausigma Ie <？in-line-formula description =“In-line Formulas”end =“tail”？>其中lambdap是第一个相干光的波长，lambdae是第二相干光，tau是分子被从基态到第一电子激发态的第一相干光激发的激发寿命，Ip是第一相干光的样品表面上的最大光子通量，Ie是第二相干光的样品表面上的最大光子通量σσ是当分子从基态退出到第一电子激发态时的吸收横截面积，而西格玛浸渍是荧光抑制截面积。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式