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1. 发明授权

US11471119B2 Analysis device and analysis method 有权
公开(公告)号：US11471119B2
公开(公告)日：2022-10-18
申请号：US17175936
申请日：2021-02-15
申请人： Shimadzu Corporation
发明人： Kenji Sato
IPC分类号： G01N23/207 , A61B6/00
摘要： A valence of a target element of a sample and crystallinity of a sample can be detected with a small device. The analysis device 100 includes: a placement holder 110 for placing a sample S; an X-ray source 11 for irradiating the sample S with X-rays; a first detector 141 for detecting characteristic X-rays generated from the sample S by the irradiation of the X-rays; a second detector 142 for detecting X-rays diffracted by the sample; and a signal processing device 20. The signal processing device 20 detects the valence of the target element of the sample based on the characteristic X-rays detected by the first detector 141, and detects the crystallographic data of the sample based on the X-rays detected by the second detector 142.

2. 发明授权

US11137360B2 X-ray spectrometer and chemical state analysis method using the same 有权
公开(公告)号：US11137360B2
公开(公告)日：2021-10-05
申请号：US16651115
申请日：2018-07-25
申请人： SHIMADZU CORPORATION
发明人： Kenji Sato , Tetsuya Yoneda , Susumu Adachi , Satoshi Tokuda
IPC分类号： G01N23/207 , G01N23/2209 , G01N23/223
摘要： An X-ray spectrometer includes: an excitation source that irradiates a predetermined irradiation region on a surface of a sample with an excitation ray generating a characteristic X-ray; a flat plate analyzing crystal facing the irradiation region; a slit provided between the irradiation region and the analyzing crystal, the slit being parallel to a predetermined crystal plane of the analyzing crystal; a linear sensor including linear detection elements having a length in a direction parallel to the slit are arranged in a direction perpendicular to the slit; and an energy calibration unit that measures two characteristic X-rays in which energy is known by irradiating a surface of a standard sample generating the two characteristic X-rays with the excitation ray from the excitation source, and calibrates the energy of the characteristic X-ray detected by each detection element of the X-ray linear sensor based on the measured energies of the two characteristic X-rays.

3. 发明授权

US11796491B2 X-ray spectroscopic analysis apparatus and elemental analysis method 有权
公开(公告)号：US11796491B2
公开(公告)日：2023-10-24
申请号：US17554415
申请日：2021-12-17
申请人： SHIMADZU CORPORATION
发明人： Shinji Miyauchi , Susumu Adachi , Asaka Kohiyama , Takuro Izumi , Takashi Omori , Kenji Sato
IPC分类号： G01N23/207 , G01N23/223
CPC分类号： G01N23/2076 , G01N23/223 , G01N2223/076 , G01N2223/1016 , G01N2223/316 , G01N2223/3306
摘要： A spectroscopic element and a detector are disposed along a circumference of one Rowland circle. The spectroscopic element has a spectral surface whose length, measured along the Rowland circle, is shorter than a length in the Rowland circle plane, of an irradiation surface irradiated with excitation beams emitted to a sample holder. The spectroscopic element and the sample holder are disposed to separate a group of characteristic X-rays within a common spectral range of the spectroscopic element.

4. 发明授权

US11740190B2 X-ray analysis device including a spectrometer to detect characteristic X-rays and related X-ray analysis method 有权
公开(公告)号：US11740190B2
公开(公告)日：2023-08-29
申请号：US17188619
申请日：2021-03-01
申请人： Shimadzu Corporation
发明人： Kenji Sato
IPC分类号： G01N23/22 , G01N23/2204 , G01N23/2209 , G01N23/223 , G01N23/207
CPC分类号： G01N23/223 , G01N23/2076 , G01N23/22 , G01N23/2209 , G01N2223/0563 , G01N2223/076 , G01N2223/102 , G01N2223/1016
摘要： Provided is an X-ray analysis device and an X-ray analysis method capable of easily analyzing a valence of a target element in a sample. A controller 22 of a signal processing device of the X-ray analysis device is provided with: a storage unit 360 for storing a calibration curve generated based on a peak energy of Kα1 X-ray and a peak energy of Kα2 X-ray emitted from a metal simple substance, a peak energy of Kα1 X-ray and a peak energy of Kα2 X-ray emitted from each of two or more types of compounds each containing the metal simple substance, and a valence of the metal in each of the two or more types of compounds; a processing unit 302 configured to acquire a peak energy of Kα1 X-ray and a peak energy of Kα2 X-ray of the metal emitted from the metal contained in an unknown sample; and a calculation unit 308 configured to calculate a mean valence of the metal contained in the unknown sample by applying the obtained peak energy of Kα1 X-ray and peak energy of Kα2 X-ray to the calibration curve.

5. 发明授权

US11112371B2 X-ray spectrometer 有权
公开(公告)号：US11112371B2
公开(公告)日：2021-09-07
申请号：US16612092
申请日：2017-05-18
申请人： Shimadzu Corporation
发明人： Kenji Sato , Takuro Izumi
IPC分类号： G01N23/207 , G01N23/223
摘要： An X-ray spectrometer is provided with: an excitation source configured to irradiate excitation rays onto an irradiation area of a sample, a diffraction member provided to face the irradiation area; a slit member provided between the irradiation area and the diffraction member, the slit member having a slit extending parallel to the irradiation area and a prescribed surface of the diffraction member; an X-ray linear sensor having a light-incident surface in which a plurality of detection elements are arranged in a direction perpendicular to a longitudinal direction of the slit; a first moving mechanism configured to change an angle between the sample surface and the prescribed surface, and/or a distance between the sample surface and the prescribed surface by moving the diffraction member within a plane perpendicular to the longitudinal direction; and a second moving mechanism configured to position the X-ray linear sensor on a path of characteristic X-rays passed through the slit and diffracted by the prescribed surface by moving the X-ray linear sensor within a plane perpendicular to the longitudinal direction.

6. 发明授权

US10948434B2 X-ray spectroscopic analysis apparatus and elementary analysis method 有权
公开(公告)号：US10948434B2
公开(公告)日：2021-03-16
申请号：US15370010
申请日：2016-12-06
申请人： SHIMADZU CORPORATION
发明人： Kenji Sato , Akihiro Nishimura
IPC分类号： G01N23/223 , G01N23/207
摘要： An X-ray spectroscopic analysis apparatus includes: a radiation source configured to irradiate a predetermined irradiation area in the surface of a sample with an excitation beam for generating a characteristic X-ray; an analyzing crystal provided facing the irradiation area; a slit provided between the irradiation area and the analyzing crystal, the slit being parallel to the irradiation area and a predetermined crystal plane of the analyzing crystal; and an X-ray linear sensor including linear detection elements arranged in a direction perpendicular to the slit, the detection elements each having a length in a direction parallel to the slit. By detecting characteristic X-rays from different linear portions of the irradiation area for each wavelength, it is possible to perform analysis with sensitivity higher than the sensitivity of a conventional X-ray spectroscopic analysis apparatus that irradiates a point-like irradiation area with an excitation beam.

7. 发明授权

US11378530B2 Apparatus and method for analyzing chemical state of battery material 有权
公开(公告)号：US11378530B2
公开(公告)日：2022-07-05
申请号：US16971518
申请日：2018-02-21
申请人： Shimadzu Corporation
发明人： Kenji Sato , Satoshi Tokuda , Takuro Izumi , Tetsuya Yoneda , Susumu Adachi
IPC分类号： G01N23/223 , G01N23/207 , G01N23/2209 , G01N23/2252
摘要： A chemical state analysis apparatus 10 includes: an excitation source 11 configured to irradiate an irradiation region A of a predetermined surface in a sample S containing a battery material with an excitation rays for generating characteristic X-rays of the battery material; an analyzing crystal 13 of a flat plate arranged so as to face the irradiation region A; a slit 12 arranged between the irradiation region A and the analyzing crystal 13, the slit being arranged in parallel to the irradiation region A and a predetermined crystal plane of the analyzing crystal 13; an X-ray linear sensor 15 in which linear detecting elements 151 each having a length in a direction parallel to the slit 12 are arranged in a direction perpendicular to the slit; a wavelength spectrum generation unit 161 configured to generate a wavelength spectrum based on intensity of the characteristic X-rays detected by the X-ray linear sensor 15; a peak wavelength determination unit 162 configured to determine a peak wavelength which is a wavelength in a peak of the wavelength spectrum; and a chemical state specification unit 163 configured to specify a value for specifying a chemical state of the battery material in the sample S from the peak wavelength determined by the peak wavelength determination unit 162 and a standard curve representing a relation between a value representing the chemical state and the peak wavelength.

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