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1. 发明申请

US20050159034A1 Connector, electronic component fixing device, and tester 失效
标题翻译：连接器，电子部件固定装置和测试仪
公开(公告)号：US20050159034A1
公开(公告)日：2005-07-21
申请号：US11009261
申请日：2004-12-09
申请人： Shigeru Murayama , Masanori Kaneko , Fumio Kurotori , Shigeru Matsumura
发明人： Shigeru Murayama , Masanori Kaneko , Fumio Kurotori , Shigeru Matsumura
IPC分类号： G01R31/26 , G01R1/04 , G01R1/073 , G01R31/28 , H01R13/629 , H01R13/631 , H01R13/62
CPC分类号： G01R1/0408 , H01R13/62916
摘要： A connector comprising a plug and a socket being fitted with the plug and further provided with a driving section for fitting the plug and the socket by moving in a first direction substantially perpendicular to the fitting direction of the socket and the plug. The driving section has a first groove part provided in the first direction, and a second groove part provided substantially perpendicular to the first direction. The plug has a first protruding portion engaging with the first groove part, and the socket has a second protruding portion engaging with the first groove part. When the driving section moves in the first direction, the driving section depresses the second protruding portion in the fitting direction at the second groove part to move the socket in the fitting direction, thus fitting the plug in the socket.
摘要翻译：一种连接器，包括插头和插座，所述插头和插座配有所述插头，并且还设置有驱动部分，用于通过沿着与所述插座和所述插头的装配方向大致垂直的第一方向移动来插入所述插头和所述插座。驱动部具有沿第一方向设置的第一槽部和与第一方向大致垂直地设置的第二槽部。插头具有与第一槽部接合的第一突出部，插座具有与第一槽部接合的第二突出部。当驱动部沿第一方向移动时，驱动部在第二槽部处按照嵌合方向按压第二突出部，以使插座沿嵌合方向移动，将插头嵌入插座。

2. 发明授权

US07033196B2 Connector, electronic component fixing device, and tester 失效
标题翻译：连接器，电子部件固定装置和测试仪
公开(公告)号：US07033196B2
公开(公告)日：2006-04-25
申请号：US11009261
申请日：2004-12-09
申请人： Shigeru Murayama , Masanori Kaneko , Fumio Kurotori , Shigeru Matsumura
发明人： Shigeru Murayama , Masanori Kaneko , Fumio Kurotori , Shigeru Matsumura
IPC分类号： H01R13/62
CPC分类号： G01R1/0408 , H01R13/62916
摘要： A connector including a plug and a socket and a driving section for fitting the plug and the socket by moving the driving section in a first direction substantially perpendicular to the fitting direction of the socket and the plug. The driving section has a first groove part provided in the first direction, and a second groove part provided substantially perpendicular to the first direction. The plug has a first protruding portion engaging with the first groove part, and the socket has a second protruding portion engaging with the first groove part. When the driving section moves in the first direction, the driving section depresses the second protruding portion in the fitting direction at the second groove part to move the socket in the fitting direction, thus fitting the plug in the socket.
摘要翻译：一种包括插头和插座的连接器，以及用于通过沿与插座和插头的嵌合方向大致垂直的第一方向移动驱动部分来装配插头和插座的驱动部分。驱动部具有沿第一方向设置的第一槽部和与第一方向大致垂直地设置的第二槽部。插头具有与第一槽部接合的第一突出部，插座具有与第一槽部接合的第二突出部。当驱动部沿第一方向移动时，驱动部在第二槽部处按照嵌合方向按压第二突出部，以使插座沿嵌合方向移动，将插头嵌入插座。

3. 发明授权

US07482821B2 Probe card and the production method 有权
标题翻译：探针卡和生产方法
公开(公告)号：US07482821B2
公开(公告)日：2009-01-27
申请号：US11151664
申请日：2005-06-14
申请人： Takaji Ishikawa , Fumio Kurotori , Tadao Saito
发明人： Takaji Ishikawa , Fumio Kurotori , Tadao Saito
IPC分类号： G01R31/02
CPC分类号： G01R1/06722 , G01R31/2886
摘要： A probe card 1 is composed of a plurality of probe pins 50 having wafer-side plungers51 at one end portion and substrate-side plungers52 on the other end side; two probe guides 30 and 40 one above the other for supporting the plurality of probe pins 50, so that the plurality of probe pins 50 are arranged to be corresponding to an arrangement of external terminals of a semiconductor wafer and the wafer-side plungers 51 of the probe pins 50 protrude; a print substrate 10 having pads 13 for the substrate-side plungers 52 of the probe pins 50 supported by the probe guides 30 and 40 to contact; and a stiffener 20 provided on the back surface of the print substrate 10.
摘要翻译：探针卡1由在一端部具有晶片侧柱塞51和另一端侧的基板侧柱塞52的多个探针50构成。两个探针引导件30和40彼此重叠以支撑多个探针50，使得多个探针50被布置成对应于半导体晶片的外部端子和晶片侧柱塞51的布置探针50突出; 印刷基板10，其具有用于由探针引导件30和40支撑的探针30的基板侧柱塞52的垫13接触; 以及设置在印刷基板10的背面上的加强件20。

4. 发明授权

US5561325A Mounting structure and fastener for heat sink 失效
标题翻译：用于散热器的安装结构和紧固件
公开(公告)号：US5561325A
公开(公告)日：1996-10-01
申请号：US426894
申请日：1995-04-20
申请人： Mitsuhiro Ueno , Toshihiro Kusagaya , Fumio Kurotori
发明人： Mitsuhiro Ueno , Toshihiro Kusagaya , Fumio Kurotori
IPC分类号： H01L23/40 , H01L23/467 , H01L23/34
CPC分类号： H01L23/467 , H01L23/4093 , H01L2924/0002
摘要： A heat sink mounting structure which can increase a cooling efficiency and easily mount a heat sink. The heat sink mounting structure includes an integrated circuit package, a heat sink mounted on the integrated circuit package, and a fastener for fastening the heat sink to the integrated circuit package so that a lower surface of the heat sink comes into close contact with an upper surface of the integrated circuit package. The fastener includes a strip member, a pair of forked members integrally connected to opposite ends of the strip member, and a pair of engaging members integrally connected to the pair of forked members. The engaging members are adapted to engage diagonal corner portions of the integrated circuit package, and the forked members are adapted to come into pressure contact with side surfaces of the heat sink.
摘要翻译：一种散热器安装结构，可以提高冷却效率并轻松安装散热片。散热器安装结构包括集成电路封装，安装在集成电路封装上的散热器和用于将散热器紧固到集成电路封装的紧固件，使得散热器的下表面与上部集成电路封装的表面。紧固件包括带状构件，一体地连接到带状构件的相对端部的一对叉形构件，以及与该对叉形构件一体地连接的一对接合构件。接合构件适于与集成电路封装的对角线部分接合，并且叉形构件适于与散热器的侧表面进行压力接触。

5. 发明申请

US20080143366A1 Contact Pin Probe Card and Electronic Device Test Apparatus Using Same 失效
标题翻译：接触针探针卡和电子设备测试仪器使用相同
公开(公告)号：US20080143366A1
公开(公告)日：2008-06-19
申请号：US10566463
申请日：2004-12-14
申请人： Fumio Kurotori , Takaji Ishikawa , Tadao Saito
发明人： Fumio Kurotori , Takaji Ishikawa , Tadao Saito
IPC分类号： G01R31/02
CPC分类号： G01R1/07371 , G01R1/06722 , G01R1/06727 , G01R1/06738 , G01R1/06761
摘要： A contact pin (50) for contacting a terminal of a wafer and supplying a signal to that wafer is provided with a first conductive layer (51b) composed of a first conductive material having a relatively higher hardness than the oxide film formed on the terminal of the wafer, a second conductive layer (51c) composed of a second conductive material having a relatively lower hardness than the oxide film, and a base material (51a) with the first conductive layer (51b) and second conductive layer (51c) formed at the outside, the first conductive layer (51b) being formed so as to closely contact the outside of the second conductive layer (51c), the first conductive layer (51b) and second conductive layer (51c) both being exposed at the front end face (50a) of the contact pin (50).
摘要翻译：用于接触晶片的端子并向该晶片提供信号的接触引脚（50）设置有第一导电层（51b），该导电层由具有比形成在端子上的氧化物膜的硬度更高的硬度的第一导电材料构成由具有比氧化物膜低的硬度的第二导电材料构成的第二导电层（51c）以及具有第一导电层（51b）和第二导电层（51b）的基底材料（51a） 51c）形成，第一导电层（51b）形成为紧密接触第二导电层（51c）的外部，第一导电层（51b）和第二导电层（51c））都暴露在接触销（50）的前端面（50a）处。

6. 发明授权

US06981898B2 Connector 有权
标题翻译：连接器
公开(公告)号：US06981898B2
公开(公告)日：2006-01-03
申请号：US10613028
申请日：2003-07-07
申请人： Junichi Akama , Masahiro Hamazaki , Tadashi Kumamoto , Manabu Shimizu , Hideo Miyazawa , Fumio Kurotori , Moriyuki Ueno
发明人： Junichi Akama , Masahiro Hamazaki , Tadashi Kumamoto , Manabu Shimizu , Hideo Miyazawa , Fumio Kurotori , Moriyuki Ueno
IPC分类号： H01R13/648
CPC分类号： H01R12/716 , H01R13/6585 , H01R13/6594 , Y10S439/931 , Y10S439/941
摘要： A connector includes multiple pairs of signal contacts arranged in a housing, and facilitates the wiring design and the wiring operation for substrates. The two signal contacts in each of the multiple pairs are arranged at a distance in the longitudinal direction of the housing. With this arrangement, excellent coupling can be established between the two signal contacts, and signals can be balanced-transmitted without causing a phase difference. Also, the lengths of each pair of wires of a wiring substrate to be connected to the multiple pairs of signal contacts can be easily made uniform. Accordingly, there is no need to prepare excessive wiring areas, and the substrate wiring design and the wiring operation can be simplified.
摘要翻译：连接器包括布置在壳体中的多对信号触点，并且有助于基板的布线设计和布线操作。多对中的每一对中的两个信号触点沿壳体的纵向方向布置成一定距离。通过这种布置，可以在两个信号触点之间建立良好的耦合，并且信号可以平衡传输而不引起相位差。而且，可以容易地使要连接到多对信号触点的布线基板的每对导线的长度均匀。因此，不需要制备过多的布线区域，并且可以简化基板布线设计和布线操作。

7. 发明授权

US06056590A Connector having internal switch and fabrication method thereof 失效
标题翻译：具有内部开关的连接器及其制造方法
公开(公告)号：US06056590A
公开(公告)日：2000-05-02
申请号：US822715
申请日：1997-03-24
申请人： Norihiro Takahashi , Fumio Kurotori , Hideo Miyazawa , Osamu Daikuhara , Kazuyuki Futaki , Hiroyuki Suzuki , Takahiro Yoshiike , Kazuhiko Ikeda
发明人： Norihiro Takahashi , Fumio Kurotori , Hideo Miyazawa , Osamu Daikuhara , Kazuyuki Futaki , Hiroyuki Suzuki , Takahiro Yoshiike , Kazuhiko Ikeda
IPC分类号： H01R13/641 , H01R43/24 , H01R4/24
CPC分类号： H01R13/641 , H01R12/7094 , H01R12/727 , Y10T29/49172 , Y10T29/49204 , Y10T29/49208 , Y10T29/4922
摘要： A connector is moveable between a coupled state and an uncoupled state with respect to a counter connector. Plural contact members of the connector individually contact respective, plural contacts of the counter connector when coupled together. A contact module of the connector has a pair of contacts individually contacting and short circuiting a corresponding pair of respective contacts of the counter connector, in a selected one of the coupled and uncoupled states thereof. The contact module may include a pair of output terminals corresponding to the pair of contacts and a switch, actuated between first and second states in accordance with the coupled and uncoupled states of the connector, a selected one of the coupled and uncoupled states producing short circuiting of the pair of output terminals.
摘要翻译：连接器可相对于对接连接器在耦合状态和非耦合状态之间移动。当连接在一起时，连接器的多个接触构件分别接触对应连接器的相应的多个触点。连接器的接触模块具有一对触点，其以所选择的一个耦合和非耦合状态单独地接触和短路对应连接器的相应的一对相应的触点。接触模块可以包括对应于一对触点的一对输出端子和根据连接器的耦合和非耦合状态在第一和第二状态之间致动的开关，所选择的一个耦合和非耦合状态产生短路的一对输出端子。

8. 发明授权

US07667471B2 Contact pin probe card and electronic device test apparatus using same 失效
标题翻译：接触针探针卡和电子设备测试仪使用相同
公开(公告)号：US07667471B2
公开(公告)日：2010-02-23
申请号：US10566463
申请日：2004-12-14
申请人： Fumio Kurotori , Takaji Ishikawa , Tadao Saito
发明人： Fumio Kurotori , Takaji Ishikawa , Tadao Saito
IPC分类号： G01R31/02
CPC分类号： G01R1/07371 , G01R1/06722 , G01R1/06727 , G01R1/06738 , G01R1/06761
摘要： A contact pin (50) for contacting a terminal of a wafer and supplying a signal to that wafer is provided with a first conductive layer (51b) composed of a first conductive material having a relatively higher hardness than the oxide film formed on the terminal of the wafer, a second conductive layer (51c) composed of a second conductive material having a relatively lower hardness than the oxide film, and a base material (51a) with the first conductive layer (51b) and second conductive layer (51c) formed at the outside, the first conductive layer (51b) being formed so as to closely contact the outside of the second conductive layer (51c), the first conductive layer (51b) and second conductive layer (51c) both being exposed at the front end face (50a) of the contact pin (50).
摘要翻译：用于接触晶片的端子并向该晶片提供信号的接触引脚（50）设置有第一导电层（51b），第一导电层（51b）由具有比形成在晶片的端子上的氧化物膜的相对较高的硬度的第一导电材料晶片，具有比氧化膜低的硬度的第二导电材料构成的第二导电层（51c）和形成有第一导电层（51b）的基材（51a）和第二导电层外部，第一导电层（51b）形成为紧密接触第二导电层（51c）的外部，第一导电层（51b）和第二导电层（51c）都在前端面（50）的（50a）。

9. 发明申请

US20050280428A1 Probe card and the production method 有权
标题翻译：探针卡和生产方法
公开(公告)号：US20050280428A1
公开(公告)日：2005-12-22
申请号：US11151664
申请日：2005-06-14
申请人： Takaji Ishikawa , Fumio Kurotori , Tadao Saito
发明人： Takaji Ishikawa , Fumio Kurotori , Tadao Saito
IPC分类号： G01R1/067 , G01R31/02 , G01R31/28 , H01L21/66
CPC分类号： G01R1/06722 , G01R31/2886
摘要： A probe card 1 is composed of a plurality of probe pins 50 having wafer-side plungers 51 at one end portion and substrate-side plungers 52 on the other end side; two probe guides 30 and 40 one above the other for supporting the plurality of probe pins 50, so that the plurality of probe pins 50 are arranged to be corresponding to an arrangement of external terminals of a semiconductor wafer and the wafer-side plungers 51 of the probe pins 50 protrude; a print substrate 10 having pads 13 for the substrate-side plungers 52 of the probe pins 50 supported by the probe guides 30 and 40 to contact; and a stiffener 20 provided on the back surface of the print substrate 10. The probe guides 30 and 40 are produced by a material having substantially the same thermal expansion coefficient as that of the semiconductor wafer, and fixed to the print substrate 10 and the stiffener 20 at the circumferential portion and the center portion. The probe card 1 configured as above is capable of maintaining high precision in needle positions of the probe pins 50 with respect to the external terminals of the semiconductor wafer and the pads 13 of the print substrate 10.
摘要翻译：探针卡1由在一端部具有晶片侧柱塞51和另一端侧的基板侧柱塞52的多个探针50构成。两个探针引导件30和40彼此重叠以支撑多个探针50，使得多个探针50被布置成对应于半导体晶片的外部端子和晶片侧柱塞51的布置探针50突出; 印刷基板10，其具有用于由探针引导件30和40支撑的探针30的基板侧柱塞52的垫13接触; 以及设置在印刷基板10的后表面上的加强件20.探针引导件30和40由具有与半导体晶片基本相同的热膨胀系数的材料制成，并且固定到印刷基板10和加强件 20在圆周部分和中心部分。如上构造的探针卡1能够相对于半导体晶片的外部端子和印刷基板10的焊盘13保持探针30的针位置的高精度。

10. 发明授权

US6106331A Connector assembly 失效
标题翻译：连接器组件
公开(公告)号：US6106331A
公开(公告)日：2000-08-22
申请号：US181910
申请日：1998-10-29
申请人： Fumio Kurotori , Kazuyuki Futaki , Hiroyuki Suzuki
发明人： Fumio Kurotori , Kazuyuki Futaki , Hiroyuki Suzuki
IPC分类号： H01R13/514 , H01R13/73 , H01R13/60 , H01R13/648
CPC分类号： H01R12/727 , H01R12/7029 , H01R12/7047 , H01R13/514
摘要： A connector assembly for receiving a cable with a plurality of wires includes a body including a plurality of contacts provided on the front face of the body; a plurality of leads for connecting the contacts to a plurality of contact points provided on a circuit board to which the connector assembly is attached; a pair of brackets provided on the either ends of the body; and a pair of board locks, provided on the brackets, for fastening the connector assembly to the circuit board.
摘要翻译：用于接收具有多条电线的电缆的连接器组件包括：主体，其包括设置在主体前表面上的多个触点; 多个引线，用于将触点连接到设置在连接器组件所连接的电路板上的多个接触点; 在身体的两端设置一对支架; 以及设置在支架上的一对板锁，用于将连接器组件紧固到电路板。

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