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    • 3. 发明授权
    • Nitride semiconductor device with a vertical channel and method for producing the nitride semiconductor device
    • 具有垂直沟道的氮化物半导体器件和用于制造氮化物半导体器件的方法
    • US08134180B2
    • 2012-03-13
    • US12222462
    • 2008-08-08
    • Hirotaka OtakeShigefusa Chichibu
    • Hirotaka OtakeShigefusa Chichibu
    • H01L29/66H01L21/02H01L21/338
    • H01L29/7787H01L29/045H01L29/0649H01L29/2003H01L29/66462H01L29/7788H01L29/7789
    • A nitride semiconductor device includes: a semiconductor base layer made of a conductive group III nitride semiconductor having a principal plane defined by a nonpolar plane or a semipolar plane; an insulating layer formed on the principal plane of the semiconductor base layer with an aperture partially exposing the principal plane; a nitride semiconductor multilayer structure portion, formed on a region extending onto the insulating layer from the aperture, having a parallel surface parallel to the principal plane of the semiconductor base layer as well as a +c-axis side first inclined surface and a −c-axis side second inclined surface inclined with respect to the principal plane of the semiconductor base layer and including two types of group III nitride semiconductor layers at least having different lattice constants; a gate electrode formed to be opposed to the second inclined surface; a source electrode arranged to be electrically connected with the group III nitride semiconductor layers; and a drain electrode formed on a back surface of the semiconductor base layer opposite to the principal plane.
    • 氮化物半导体器件包括:由具有由非极性平面或半极性面限定的主面的导电III族氮化物半导体制成的半导体基底层; 绝缘层,形成在所述半导体基底层的主平面上,所述绝缘层具有部分地暴露所述主平面的孔; 氮化物半导体多层结构部分,形成在从所述孔延伸到绝缘层上的区域上,具有平行于半导体基底层的主平面的平行表面以及+ c轴侧第一倾斜面和-c 轴侧第二倾斜面相对于半导体基底层的主面倾斜,并且包括至少具有不同晶格常数的两种III族氮化物半导体层; 形成为与所述第二倾斜面相对的栅电极; 源极,被配置为与所述III族氮化物半导体层电连接; 以及形成在与主平面相反的半导体基底层的背面上的漏电极。
    • 4. 发明申请
    • Nitride semiconductor device and method for producing nitride semiconductor device
    • 氮化物半导体器件及其制造方法
    • US20090057684A1
    • 2009-03-05
    • US12222462
    • 2008-08-08
    • Hirotaka OtakeShigefusa Chichibu
    • Hirotaka OtakeShigefusa Chichibu
    • H01L29/778H01L21/338
    • H01L29/7787H01L29/045H01L29/0649H01L29/2003H01L29/66462H01L29/7788H01L29/7789
    • A nitride semiconductor device includes: a semiconductor base layer made of a conductive group III nitride semiconductor having a principal plane defined by a nonpolar plane or a semipolar plane; an insulating layer formed on the principal plane of the semiconductor base layer with an aperture partially exposing the principal plane; a nitride semiconductor multilayer structure portion, formed on a region extending onto the insulating layer from the aperture, having a parallel surface parallel to the principal plane of the semiconductor base layer as well as a +c-axis side first inclined surface and a −c-axis side second inclined surface inclined with respect to the principal plane of the semiconductor base layer and including two types of group III nitride semiconductor layers at least having different lattice constants; a gate electrode formed to be opposed to the second inclined surface; a source electrode arranged to be electrically connected with the group III nitride semiconductor layers; and a drain electrode formed on a back surface of the semiconductor base layer opposite to the principal plane.
    • 氮化物半导体器件包括:由具有由非极性平面或半极性面限定的主面的导电III族氮化物半导体制成的半导体基底层; 绝缘层,形成在所述半导体基底层的主平面上,所述绝缘层具有部分地暴露所述主平面的孔; 氮化物半导体多层结构部分,形成在从所述孔延伸到绝缘层上的区域上,具有平行于半导体基底层的主平面的平行表面以及+ c轴侧第一倾斜面和-c 轴侧第二倾斜面相对于半导体基底层的主面倾斜,并且包括至少具有不同晶格常数的两种III族氮化物半导体层; 形成为与所述第二倾斜面相对的栅电极; 源极,被配置为与所述III族氮化物半导体层电连接; 以及形成在与主平面相反的半导体基底层的背面上的漏电极。