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    • 1. 发明授权
    • Charge transfer device and solid state image sensor using the same
    • 电荷转移装置和使用其的固态图像传感器
    • US5359213A
    • 1994-10-25
    • US40072
    • 1993-03-30
    • Seo K. LeeUya Shinji
    • Seo K. LeeUya Shinji
    • H01L21/339H01L27/148H01L29/10H01L29/762H01L29/796H01L27/14H01L31/00
    • H01L29/1062H01L27/14831
    • A charge transfer device and a solid state image sensor using the same, capable of transferring signal charge at a high signal to noise ratio (S/N ratio) and preventing an occurrence of dark current. They include a double-layered charge transfer path structure provided by forming a surface channel region on a buried channel region formed in a semiconductor substrate, the surface channel region having a conductivity opposite to that of the buried channel region. The surface channel region of the doubled-layered structure is used for accumulating dark current generated from boundary surfaces between the substrate and a gate insulating film, whereas the buried channel region is used for transferring optical signal charge. Where minus and/or plus drive voltages are applied to the transfer electrodes, there is no increase in dark current, in accordance with the present invention. The quantity of transferred signal charge can be greatly increased.
    • 一种电荷转移装置和使用该电荷转移装置的固态图像传感器,能够以高的信噪比(S / N比)传送信号电荷并防止暗电流的发生。 它们包括通过在形成在半导体衬底中的掩埋沟道区上形成表面沟道区而提供的双层电荷转移路径结构,该表面沟道区具有与掩埋沟道区相反的导电性。 双层结构的表面沟道区域用于积聚从衬底和栅极绝缘膜之间的边界面产生的暗电流,而掩埋沟道区用于传送光信号电荷。 在根据本发明的情况下,对传输电极施加负驱动电压和/或加驱动电压,暗电流不增加。 传输信号电荷的量可以大大增加。
    • 3. 发明授权
    • CCD image sensor of interlaced scanning type
    • 隔行扫描型CCD图像传感器
    • US5298777A
    • 1994-03-29
    • US97539
    • 1993-07-27
    • Seo K. Lee
    • Seo K. Lee
    • H01L27/148H01L29/78H01L27/14H01L31/00
    • H01L27/14831
    • A CCD image sensor of an interlaced scanning type comprising a plurality of uniformly spaced photodetectors arranged in series in vertical and horizontal directions, a plurality of VCCD regions arranged between sets of said photodetectors arranged in the vertical directions, a plurality of channel stop regions for electrically isolating said plurality of photodetectors from one another, a plurality of gate electrodes formed on said VCCD regions, each of said plurality of gate electrodes being connected simultaneously to transfer gate electrodes of adjacent ones of said plurality of photodetectors on odd and even horizontal lines, a plurality of barrier layers, each formed at a portion of each of said VCCD regions corresponding to a boundary with each of said gate electrodes on said VCCD regions, for forming a desired potential barrier, and a HCCD region formed under said plurality of VCCD regions, for transferring signal charges from said VCCD regions to an output stage. Therefore, in accordance with the present invention, the gate electrodes can be reduced from four of the prior art to two in number, resulting in simplification in construction and manufacturing process thereof. Also, the reduction in number of the gate electrodes to two allows the driving system to be simple.
    • 一种隔行扫描型的CCD图像传感器,包括在垂直和水平方向上串联布置的多个均匀间隔的光电检测器,布置在垂直方向上布置的所述光电检测器的组之间的多个VCCD区域,多个用于电 将所述多个光电检测器彼此隔离,形成在所述VCCD区上的多个栅极电极,所述多个栅电极中的每一个同时连接以传输奇数和偶数水平线上的所述多个光电检测器中的相邻光电探测器的栅电极, 多个势垒层,每个形成在每个所述VCCD区域的对应于所述VCCD区域上的每个所述栅电极的边界的部分中,用于形成期望的势垒;以及形成在所述多个VCCD区下的HCCD区, 用于将信号电荷从所述VCCD区传送到输出级。 因此,根据本发明,可以将栅电极从现有技术的四个减少到两个,导致其结构和制造过程的简化。 此外,将栅电极数量减少到两个允许驱动系统简单。
    • 5. 发明授权
    • Method of making charge coupled device image sensor
    • 制造电荷耦合器件图像传感器的方法
    • US5371033A
    • 1994-12-06
    • US194498
    • 1994-02-10
    • Seo K. LeeUja Shinji
    • Seo K. LeeUja Shinji
    • H01L27/148H01L21/72H01L21/339
    • H01L27/14887
    • A CCD image sensor comprising: a semiconductor substrate of a first conductivity type connected to a ground; an impurity region of a second conductivity type formed in the surface of the semiconductor substrate of the first conductivity type, to serve as a blooming prevention layer; an impurity region of the first conductivity type formed in the surface of the semiconductor substrate, so that it encloses the impurity region of the second conductivity type serving as a blooming prevention layer, to serve as a potential barrier layer; an impurity region of the second conductivity type formed in the surface of the semiconductor substrate of the first conductivity type so that it encloses the impurity region of the first conductivity type serving as a potential barrier layer, to serve as a light receiving region; an insulation film which is formed on the surface of the semiconductor substrate of the first conductivity type and has contact holes at both edges of the impurity region of the second conductivity type, serving as a blooming prevention layer; silicide films filled in the contact holes; and a light shield conductor film which is formed on the surface of the remaining insulation film, except for a portion between the silicide films and the surfaces of the silicide films, and is connected to a voltage source.
    • 一种CCD图像传感器,包括:连接到地面的第一导电类型的半导体衬底; 形成在第一导电类型的半导体衬底的表面中的第二导电类型的杂质区域用作防起霜层; 形成在半导体衬底的表面中的第一导电类型的杂质区,使得其包围用作防止遮光层的第二导电类型的杂质区,用作势垒层; 形成在第一导电类型的半导体衬底的表面中的第二导电类型的杂质区域,使得其包围用作势垒层的第一导电类型的杂质区域用作光接收区域; 绝缘膜,其形成在第一导电类型的半导体衬底的表面上,并且在第二导电类型的杂质区的两个边缘处具有接触孔,用作防起霜层; 填充在接触孔中的硅化物膜; 以及形成在剩余绝缘膜的表面上的除了硅化物膜与硅化物膜的表面之间的部分之外的光屏蔽导体膜,并且连接到电压源。
    • 6. 发明授权
    • CCD type solid-state image sensor
    • CCD型固态图像传感器
    • US5446297A
    • 1995-08-29
    • US193294
    • 1994-02-08
    • Seo K. Lee
    • Seo K. Lee
    • H01L27/148H01L29/796H01L27/14H01L31/00
    • H01L27/14887
    • A CCD type solid-state image sensor a n type silicon substrate, a first p type well formed over the substrate, photodiode regions deeply and widely formed in the first well, second p type wells formed in the first well, each of the second well being overlapped with each corresponding photodiode region and each photodiode region preceding to the corresponding photodiode region, n type VCCD channel regions respectively formed in the second wells, p type transfer gate channel regions each formed in each one of the second p type wells between each photodiode region and each corresponding VCCD channel region, p type channel stop regions respectively formed in the second wells, each of the channel stop regions being adapted to isolate each corresponding VCCD channel region from each corresponding preceding photodiode region, p type impurity regions respectively formed beneath surfaces of the photodiode regions, a thin insulating film formed over the entire exposed surface of the resulting structure, transfer gates formed on the thin insulating film to be respectively disposed over the second wells, an interlayer insulating film formed on the thin insulating film to cover the transfer gate electrodes, and a photoshield film formed over the entire exposed surface of the resulting structure except for portions respectively disposed over the photodiode regions.
    • 一种CCD型固态图像传感器,一种类型的硅衬底,在该衬底上形成的第一p型阱,在第一阱中深入并广泛形成的光电二极管区域,形成在第一阱中的第二p型阱,第二阱中的每一个均为 与对应的光电二极管区域之前的每个对应的光电二极管区域和每个光电二极管区域重叠,分别形成在第二阱中的n型VCCD沟道区域,每个形成在每个光电二极管区域的每个第二p型阱中的p型传输栅极沟道区域 以及分别形成在第二阱中的每个对应的VCCD沟道区,p型沟道截止区,每个沟道截止区适于将每个相应的VCCD沟道区与每个对应的先前的光电二极管区隔开,p型杂质区分别形成在 光电二极管区域,形成在所得到的st的整个暴露表面上的薄绝缘膜 形成在薄绝缘膜上的转移门分别设置在第二阱上,形成在薄绝缘膜上以覆盖传输栅电极的层间绝缘膜,以及形成在所得结构的整个暴露表面上的光罩膜 除了分别设置在光电二极管区域上的部分。
    • 7. 发明授权
    • Charge coupled device image sensor
    • 电荷耦合器件图像传感器
    • US5349216A
    • 1994-09-20
    • US76336
    • 1993-06-11
    • Seo K. LeeUja Shinji
    • Seo K. LeeUja Shinji
    • H01L27/148H01L29/78H01L27/14H01L31/00
    • H01L27/14887
    • A CCD image sensor comprising: a semiconductor substrate of a first conductivity type connected to a ground; an impurity region of a second conductivity type formed in the surface of the semiconductor substrate of the first conductivity type, to serve as a blooming prevention layer; an impurity region of the first conductivity type formed in the surface of the semiconductor substrate, so that it encloses the impurity region of the second conductivity type serving as a blooming prevention layer, to serve as a potential barrier layer; an impurity region of the second conductivity type formed in the surface of the semiconductor substrate of the first conductivity type so that it encloses the impurity region of the first conductivity type serving as a potential barrier layer, to serve as a light receiving region; an insulation film which is formed on the surface of the semiconductor substrate of the first conductivity type and has contact holes at both edges of the impurity region of the second conductivity type, serving as a blooming prevention layer; silicide films filled in the contact holes; and a light shield conductor film which is formed on the surface of the remaining insulation film, except for a portion between the silicide films and the surfaces of the silicide films, and is connected to a voltage source.
    • 一种CCD图像传感器,包括:连接到地面的第一导电类型的半导体衬底; 形成在第一导电类型的半导体衬底的表面中的第二导电类型的杂质区域用作防起霜层; 形成在半导体衬底的表面中的第一导电类型的杂质区,使得其包围用作防止遮光层的第二导电类型的杂质区,用作势垒层; 形成在第一导电类型的半导体衬底的表面中的第二导电类型的杂质区域,使得其包围用作势垒层的第一导电类型的杂质区域用作光接收区域; 绝缘膜,其形成在第一导电类型的半导体衬底的表面上,并且在第二导电类型的杂质区的两个边缘处具有接触孔,用作防起霜层; 填充在接触孔中的硅化物膜; 以及形成在剩余绝缘膜的表面上的除了硅化物膜与硅化物膜的表面之间的部分之外的光屏蔽导体膜,并且连接到电压源。