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    • 5. 发明申请
    • SEMICONDUCTOR APPARATUS AND DUTY CYCLE CORRECTION METHOD THEREOF
    • 半导体装置及其周期校正方法
    • US20140152358A1
    • 2014-06-05
    • US13846756
    • 2013-03-18
    • SK HYNIX INC.
    • Young Suk SEO
    • H03K3/017
    • H03K5/1565
    • A semiconductor apparatus includes a duty cycle correction block and a delay locked loop. The duty cycle correction block generates a duty corrected clock by correcting a duty cycle of an internal clock, adjusts a phase of a rising edge of the duty corrected clock when a delay locked loop is reset, and adjusts a phase of a falling edge of the duty corrected clock when the delay locked loop is locked. The delay locked loop receives an external clock to output the internal clock, and delays the external clock by a variable delay amount to output the internal clock when the adjustment of the phase of the rising edge of the duty corrected clock by the duty cycle correction block is completed.
    • 半导体装置包括占空比校正块和延迟锁定环。 占空比校正块通过校正内部时钟的占空比来产生占空比校正时钟,当延迟锁定环被复位时,调整占空比校正时钟的上升沿的相位,并且调整下降沿的相位 延迟锁定环被锁定时的占空比校正时钟。 延迟锁定环接收外部时钟以输出内部时钟,并且通过占空比校正块调整占空比校正时钟的上升沿的相位来调节外部时钟一个可变延迟量以输出内部时钟 完成了。