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1. 发明授权

US12057844B2 Digital droop detector, semiconductor device including the same, and calibration method thereof 有权
公开(公告)号：US12057844B2
公开(公告)日：2024-08-06
申请号：US18176371
申请日：2023-02-28
申请人： Samsung Electronics Co., Ltd.
发明人： Sangheon Lee , Heewook Shin , Heejune Lee , Jungho Lee , Youngjae Cho , Michael Choi
IPC分类号： H03K5/135 , G01R19/25 , H03K5/00
CPC分类号： H03K5/135 , G01R19/2513 , H03K2005/00052
摘要： A digital droop detector for detecting whether a droop occurs in a power supply voltage, may include processing circuitry configured to, detect a voltage level change of a power supply voltage in response to a clock signal, the detecting the voltage level change including converting the detected voltage level change into a first code, correct at least one nonlinearity included in the first code, the correcting including converting the first code into a second code and a target range, and adjust a delay magnitude of the clock signal based on the second code.

2. 发明申请

US20210226643A1 ANALOG-TO-DIGITAL CONVERTER 有权
公开(公告)号：US20210226643A1
公开(公告)日：2021-07-22
申请号：US17000665
申请日：2020-08-24
申请人： SAMSUNG ELECTRONICS CO., LTD.
发明人： KYOUNGJUN MOON , Dongryeol Oh , Youngjae Cho , Michael Choi
IPC分类号： H03M1/10
摘要： An analog-to-digital converter includes: a voltage-current converter receiving an analog input voltage, generating a first digital signal from the analog input voltage, and outputting a residual current remaining after the first digital signal; a current-time converter converting the residual current into a current time in a time domain; and a time-digital converter receiving the residual time, and generating a second digital signal from the residual time, wherein the first digital signal and the second digital signal are sequences of digital codes representing respective signal levels of the analog input voltage.

3. 发明申请

US20210199719A1 BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCLUDING THE SAME 有权
公开(公告)号：US20210199719A1
公开(公告)日：2021-07-01
申请号：US16940809
申请日：2020-07-28
申请人： Samsung Electronics Co., Ltd.
发明人： Junhee Shin , Jooseong Kim , Yongjin Lee , Michael Choi , Kwangho Kim , Sangho Kim
IPC分类号： G01R31/317 , G01R31/28 , G01R31/3167 , G01R31/319 , G01R31/30 , G01R31/327 , H03K19/017
摘要： A temperature measurement circuit includes a band-gap reference circuit configured to generate a band-gap reference voltage that is fixed regardless of an operation temperature, a reference voltage generator circuit configured to generate a measurement reference voltage by adjusting the band-gap reference voltage, a sensing circuit configured to generate a temperature-variant voltage based on a bias current, where the temperature-variant voltage is varied depending on the operation temperature, an analog-digital converter circuit configured to generate a first digital code indicating the operation temperature based on the measurement reference voltage and the temperature-variant voltage, and an analog built-in self-test (BIST) circuit configured to generate a plurality of flag signals indicating whether each of the band-gap reference voltage, the measurement reference voltage, and a bias voltage corresponding to the bias current is included in a predetermined range.

4. 发明授权

US10992290B2 Level shifter and semiconductor device including the same and operation method thereof 有权
公开(公告)号：US10992290B2
公开(公告)日：2021-04-27
申请号：US16734721
申请日：2020-01-06
申请人： Samsung Electronics Co., Ltd.
发明人： Yong-min Kim , Kyung-hoon Lee , Eun-seok Shin , Michael Choi
IPC分类号： H03K19/0175 , H03K3/037 , G09G3/3258 , H03K19/0185
摘要： A level shifter for outputting an output voltage having a voltage level range different from a voltage level range of a received input voltage is disclosed. The level shifter includes: a current mirror configured to copy a reference current flowing through a first mirror transistor to a second mirror transistor; a current mirror control circuit electrically connected to the current mirror by a sink node and including a plurality of control transistors configured to control the current mirror; and an output circuit configured to output an output voltage based on a voltage level of the sink node, wherein a first control transistor of the plurality of control transistors receives the output voltage fed back to a gate terminal of the first control transistor, and a second control transistor of the plurality of control transistors receives an inverted output voltage fed back to a gate terminal of the second control transistor.

5. 发明授权

US09712773B2 Image sensor and stacked structure thereof 有权
公开(公告)号：US09712773B2
公开(公告)日：2017-07-18
申请号：US14615679
申请日：2015-02-06
申请人： Samsung Electronics Co., Ltd.
发明人： Sin-hwan Lim , Jung-ho Lee , Hae-sick Sul , Jae-cheol Yun , Michael Choi
IPC分类号： H04N5/378 , H01L27/146
CPC分类号： H04N5/378 , H01L27/14636
摘要： There are provided an image sensor and a stacked structure thereof. The image sensor includes a pixel array in which a plurality of unit pixels for generating an output signal in accordance with incident light are arranged, a first amplifier having a first input dynamic range, and a second amplifier having a second input dynamic range that is larger than the first input dynamic range. One of the first and second amplifiers amplifies the output signal in accordance with the intensity of light.

6. 发明授权

US09035694B2 Circuit for generating reference voltage 有权
标题翻译：产生参考电压的电路
公开(公告)号：US09035694B2
公开(公告)日：2015-05-19
申请号：US14159670
申请日：2014-01-21
申请人： SAMSUNG ELECTRONICS CO., LTD.
发明人： Michael Choi , Marutha Muthu Muthuveeran
IPC分类号： G05F1/10 , G05F3/16
CPC分类号： G05F3/16 , G05F3/30
摘要： Provided is a circuit for generating a reference voltage. The circuit includes a band gap circuit generating a first current having a size that increases in proportion to an absolute temperature and a second current having a size that decreases in proportion to the absolute temperature, and outputting a reference voltage based on the first current and the second current; a mirroring circuit mirroring a sum of the first current and the second current and outputting a mirroring voltage that is in proportion to the sum of the first current and the second current; and a start-up circuit receiving the mirroring voltage from the mirroring circuit and providing a driving current for generating the first current or the second current to the band gap circuit until a time when the first current starts to be generated in the band gap circuit.
摘要翻译：提供了用于产生参考电压的电路。电路包括带隙电路，其产生具有与绝对温度成比例地增加的尺寸的第一电流和具有与绝对温度成比例地减小的尺寸的第二电流，并且基于第一电流和第二电流镜像电路，其反映第一电流和第二电流的和，并输出与第一电流和第二电流的和成比例的镜像电压; 以及起动电路，其从所述镜像电路接收所述镜像电压，并且向所述带隙电路提供用于产生所述第一电流或第二电流的驱动电流，直到在所述带隙电路中开始产生所述第一电流的时刻为止。

7. 发明申请

US20130335245A1 SUCCESSIVE APPROXIMATION ANALOG TO DIGITAL CONVERTER AND METHOD OF ANALOG TO DIGITAL CONVERSION 审中-公开
标题翻译：数字转换器的仿真近似模拟和数字转换的模拟方法
公开(公告)号：US20130335245A1
公开(公告)日：2013-12-19
申请号：US13934569
申请日：2013-07-03
申请人： Samsung Electronics Co., Ltd.
发明人： Jung-Ho LEE , Sung-Sang Lim , Yong-Woo Kim , Michael Choi
IPC分类号： H03M1/00
CPC分类号： H03M1/001 , H03M1/1215 , H03M1/468
摘要： An analog to digital converter includes a digital to analog converting circuit, a comparator and a signal processing circuit. The digital to analog converting circuit samples and holds an analog input signal, and converts digital output data to an analog signal to generate a hold voltage signal. The comparator compares the hold voltage signal with a reference voltage signal in response to a rising edge and a falling edge of a clock signal to generate a comparison output voltage signal. The signal processing circuit performs successive approximation based on the comparison output voltage signal to generate the digital output data.
摘要翻译：模数转换器包括数模转换电路，比较器和信号处理电路。数模转换电路采样并保持模拟输入信号，并将数字输出数据转换为模拟信号以产生保持电压信号。比较器根据时钟信号的上升沿和下降沿比较保持电压信号和参考电压信号，以产生比较输出电压信号。信号处理电路基于比较输出电压信号进行逐次逼近以产生数字输出数据。

8. 发明授权

US11757462B2 Analog-to-digital conversion circuit and receiver including same 有权
公开(公告)号：US11757462B2
公开(公告)日：2023-09-12
申请号：US17675342
申请日：2022-02-18
申请人： SAMSUNG ELECTRONICS CO., LTD.
发明人： Hyochul Shin , Seungyeob Baek , Sungno Lee , Heechang Hwang , Michael Choi
IPC分类号： H03M1/10 , H03L7/081 , H04B1/16 , H04L25/03 , H04L1/00
CPC分类号： H03M1/1014 , H03L7/0812 , H04B1/16 , H04L1/0071 , H04L25/03012
摘要： An analog-to-digital conversion circuit includes; a first analog-to-digital converter (ADC), a second ADC and a third ADC collectively configured to perform conversion operations according to a time-interleaving technique, and a timing calibration circuit configured to calculate correlation values and determine differences between the correlation values using first samples generated by the first ADC, second samples generated by the second ADC, and third samples generated by the third ADC during sampling periods, wherein the timing calibration circuit is further configured to control a phase of a clock signal applied to the second ADC in response to a change in absolute value related to the differences generated during the sampling periods.

9. 发明公开

US20230280398A1 BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCLUDING THE SAME 审中-公开
公开(公告)号：US20230280398A1
公开(公告)日：2023-09-07
申请号：US18318464
申请日：2023-05-16
申请人： Samsung Electronics Co., Ltd.
发明人： Junhee Shin , Jooseong Kim , Yongjin Lee , Michael Choi , Kwangho Kim , Sangho Kim
IPC分类号： G01R31/317 , G01R31/28 , G01R31/3167 , H03K19/017 , G01R31/30 , G01R31/327 , G01R31/319
CPC分类号： G01R31/31724 , G01R31/2874 , G01R31/3167 , H03K19/01721 , G01R31/3004 , G01R31/3274 , G01R31/31924
摘要： A temperature measurement circuit includes a band-gap reference circuit configured to generate a band-gap reference voltage that is fixed regardless of an operation temperature, a reference voltage generator circuit configured to generate a measurement reference voltage by adjusting the band-gap reference voltage, a sensing circuit configured to generate a temperature-variant voltage based on a bias current, where the temperature-variant voltage is varied depending on the operation temperature, an analog-digital converter circuit configured to generate a first digital code indicating the operation temperature based on the measurement reference voltage and the temperature-variant voltage, and an analog built-in self-test (BIST) circuit configured to generate a plurality of flag signals indicating whether each of the band-gap reference voltage, the measurement reference voltage, and a bias voltage corresponding to the bias current is included in a predetermined range.

10. 发明授权

US11606101B2 Analog-to-digital converter 有权
公开(公告)号：US11606101B2
公开(公告)日：2023-03-14
申请号：US17406193
申请日：2021-08-19
申请人： SAMSUNG ELECTRONICS CO., LTD.
发明人： Kyoungjun Moon , Dongryeol Oh , Younghyo Park , Youngjae Cho , Michael Choi
IPC分类号： H03M1/06 , H03M1/46 , H03M1/12
摘要： An analog-to-digital converter (ADC) includes a coarse ADC that receives an analog input voltage, generates a first digital signal based on the analog input voltage using a successive approximation register (SAR) method, and outputs a residual voltage remaining after the first digital signal is generated. The ADC further includes an amplifier that receives the residual voltage and a test voltage, generates a residual current by amplifying the residual voltage by a predetermined gain, and generates a test current by amplifying the test voltage by the gain. The ADC further includes a fine ADC that receives the residual current and generates a second digital signal based on the residual current using the SAR method, and an auxiliary path that receives the test current and generates a gain correction signal based on the test current. The gain of the amplifier is adjusted based on the gain correction signal.

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