会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 4. 发明申请
    • Fuel cell and electronic device equipped with the same
    • 燃料电池和电子设备配备相同
    • US20060003196A1
    • 2006-01-05
    • US11171218
    • 2005-07-01
    • Ryuji KohnoTatsuya NagataMakoto Kitano
    • Ryuji KohnoTatsuya NagataMakoto Kitano
    • H01M8/00
    • H01M8/04201H01M8/04186H01M8/04208H01M8/1011Y02E60/523
    • It is an object of the present invention to provide a fuel cell which can supply a liquid fuel, without changing its composition, to every corner of the membrane electrode assemblies arranged two- dimensionally over a wide area, to generate power at a high efficiency. The fuel cell 10A comprises the membrane electrode assembly modules 20 which consume the liquid fuel 40 to generate power, and the fuel chamber 30 which holds the liquid fuel 40 inside and has the principal plane on which the membrane electrode assembly modules 20 are arranged, wherein the fuel chamber 30 is provided with the fuel injection hole 33 inside, through which the liquid fuel 40 is supplied under pressure from the outside, and the fuel supply gear 42 inside, which is located to come close to the membrane electrode assembly modules 20, the fuel supply gear 42 being provided, on the surface, with the fine pores 43 through which the liquid fuel 40 can pass.
    • 本发明的一个目的是提供一种燃料电池,其可以在不改变其组成的情况下将液体燃料供应到在广泛区域上二维布置的膜电极组件的每个角部,以高效率发电。 燃料电池10A包括消耗液体燃料40以产生动力的膜电极组件模块20和将液体燃料40保持在内部并且具有其上布置有膜电极组件模块20的主平面的燃料室30, 其中燃料室30内设有燃料喷射孔33,液体燃料40通过该燃料喷射孔33从外部受到压力供给,燃料供给齿轮42位于靠近膜电极组件模块20的位置 燃料供给齿轮42在表面上设置有液体燃料40可以通过的细孔43。
    • 7. 发明授权
    • Probe structure
    • 探头结构
    • US06614246B1
    • 2003-09-02
    • US09648452
    • 2000-08-28
    • Ryuji KohnoTatsuya NagataHiroya ShimizuToshio MiyatakeHideo Miura
    • Ryuji KohnoTatsuya NagataHiroya ShimizuToshio MiyatakeHideo Miura
    • G01R1073
    • G01R1/07378
    • The invention provides a probe structure in which secondary electrodes of a main base material in which probes are formed can be electrically connected to electrodes in a substrate side even when a lot of probes are formed in a large area, so that a lot of LSIs within a wafer can be tested in one lot in a wafer test process, whereby an efficiency of the test process can be improved. In the probe structure, an interposer constituted by a high rigid material is arranged between the main base material having the probes formed therein and the substrate side, and the secondary electrodes of the main base material having the probes formed therein are electrically connected to the electrodes in the substrate side via the interposer.
    • 本发明提供了一种探针结构,其中形成探针的主要基底材料的二次电极即使在大面积形成大量探针的情况下也可以与衬底侧的电极电连接,从而使大量的LSIs 可以在晶片测试过程中一次性地测试晶片,从而可以提高测试过程的效率。 在探针结构中,由具有高刚性材料的插入体配置在其中形成有探针的主基材和基板侧之间,并且其中形成有探针的主基材的二次电极电连接到电极 在基板侧经由插入件。
    • 9. 发明申请
    • Measuring method and apparatus of thin film thickness
    • 薄膜厚度的测量方法和装置
    • US20050073323A1
    • 2005-04-07
    • US10902132
    • 2004-07-30
    • Ryuji KohnoTatsuya NagataNaoki WataseMichihiro Watanabe
    • Ryuji KohnoTatsuya NagataNaoki WataseMichihiro Watanabe
    • G01B7/06G01R27/26H01L21/66
    • G01R27/2605
    • In an apparatus for measuring thickness of a thin film, which is formed through a conductor, preventing the measurement from an error due to the curve or bend on a substrate surface or a moving surface of a stage, but without necessity of a large-scaled facility, an electric filed is applied between a probe 10 and a stage 8, so as to obtain an electrostatic capacitance of the substrate 3, an electrostatic capacitance of an insulating film, which is formed between the substrate 3, and an electrostatic capacitance defined starting from the substrate 3 to the thin film 4. The electrostatic capacitance between the substrate 3 and the thin film 4 is measured at plural numbers of places covering over the entire surface of the thin film 4. The probe 10 is so supported that the contact load “P” comes to be constant, by the probe 10 onto the thin film 4. A contact area of the probe 10 between the thin film 4 is calculated out through a predetermined equation, assuming the load “P” is constant. From respective electrostatic capacitances and the contact area measured, a distribution of thickness of the thin film 4 over the entire area thereof.
    • 在用于测量通过导体形成的薄膜厚度的装置中,防止测量由于基板表面或台的移动表面上的曲线或弯曲引起的误差,而不需要大尺寸 在探针10和载物台8之间施加电场,以获得基板3的静电电容,形成在基板3之间的绝缘膜的静电电容与开始定义的静电电容 从基板3到薄膜4.在覆盖在薄膜4的整个表面上的多个位置处测量基板3和薄膜4之间的静电电容。探针10被支撑为接触负载 假定负载“P”是恒定的,则通过探针10将薄膜4固定在薄膜4上的探针10的接触区域。 从相应的静电电容和测量的接触面积,薄膜4的整个面积的厚度分布。