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    • 5. 发明授权
    • Switching device and method for controlling frame transmission and reception
    • 用于控制帧发送和接收的切换装置和方法
    • US09357407B2
    • 2016-05-31
    • US14124980
    • 2012-05-29
    • Yoshiaki ShiotaHideki TanakaShinya Kurosaki
    • Yoshiaki ShiotaHideki TanakaShinya Kurosaki
    • H04W24/04H04L29/14H04L29/06
    • H04W24/04H04L69/14H04L69/18H04L69/40
    • Wireless line termination units 21 and 22 respectively transmit and receive frames via wireless lines 51 and 52. Line termination units 25 and 26 respectively exchange frames with the wireless line termination units 21 and 22. The wireless lines 51 and 52 are treated as one virtual line. A radio monitoring unit 272 monitors the state of the wireless lines 51 and 52, and in accordance with the redundancy mode, instructs the wireless line termination units 21 and 22 to exchange copy frames with other wireless line termination unit and to abandon received frames. A communication path control unit 273 sets, in accordance with the monitoring result as to the state of the wireless lines by the radio monitoring unit 272, the line termination units 25 and 26 to each be an active system or a standby system. A switch core 271 passes frames to be transmitted to the line termination unit that operates as the active system.
    • 无线线路终端单元21和22分别经由无线线路51和52发送和接收帧。线路终端单元25和26分别与无线线路终端单元21和22交换帧。无线线路51和52被视为一条虚拟线路 。 无线电监视单元272监视无线线路51和52的状态,并且根据冗余模式指示无线线路终端单元21和22与其他无线线路终端单元交换复制帧并放弃接收到的帧。 通信路径控制单元273根据关于无线电监视单元272的无线线路的状态的监视结果,将线路终端单元25和26分别设置为活动系统或备用系统。 交换机核心271将要发送的帧传送到作为活动系统操作的线路终端单元。
    • 7. 发明授权
    • Electron microscope
    • 电子显微镜
    • US09006653B2
    • 2015-04-14
    • US13984329
    • 2012-02-27
    • Hideki TanakaTsuyoshi Wakuda
    • Hideki TanakaTsuyoshi Wakuda
    • H01J37/14H01J37/04H01J37/09H01J37/16
    • H01J37/04H01J37/09H01J37/14H01J37/16H01J2237/0264
    • Provided is an electron microscope capable of enhancing a magnetic shield function even though the structure thereof has an objective tens that projects into a sample chamber space. The electron microscope includes: an objective lens (6) which focuses an electron beam to irradiate a sample (4) with; a sample chamber (5) which forms a sample space to contain the sample (4); a sample chamber magnetic shield (7) provided inside the sample chamber (5); and an objective lens magnetic shield (8) of a tubular shape which surrounds the periphery of the objective lens (6). A first and a second hole, which face to each other in a traveling direction of the electron beam, are provided in an upper plate (10) serving as an upper wall of the sample chamber (5) and in an upper shield (9) of the sample chamber magnetic shield (7). The objective lens (6) is held inside the first hole provided in the upper plate (10). A lower end of the objective lens (6) is disposed at a position lower than a lower end of the upper plate (10), and at a position of the second hole provided in the upper shield (9) or at a position near this position. The objective lens magnetic shield (8) is positioned inside the first hole, and a lower end thereof is connected to the upper shield (9).
    • 提供一种能够增强磁屏蔽功能的电子显微镜,即使其结构具有突出到样品室空间中的目标数十。 电子显微镜包括:聚焦电子束以照射样品(4)的物镜(6); 样品室(5),其形成容纳样品(4)的样品空间; 设置在所述样品室(5)内的样品室磁屏蔽(7); 以及围绕物镜(6)的周边的管状的物镜磁屏蔽(8)。 在电子束的行进方向上彼此面对的第一和第二孔设置在用作样品室(5)的上壁的上板(10)中并在上屏蔽(9)中, 的样品室磁屏蔽(7)。 物镜(6)被保持在设置在上板(10)中的第一孔内。 物镜(6)的下端设置在比上板(10)的下端更低的位置,并且在设置在上罩(9)中的第二孔的位置或靠近该上罩 位置。 物镜磁屏蔽(8)位于第一孔内,其下端连接到上屏蔽(9)。
    • 9. 发明申请
    • ELECTRON MICROSCOPE
    • 电子显微镜
    • US20130313431A1
    • 2013-11-28
    • US13984329
    • 2012-02-27
    • Hideki TanakaTsuyoshi Wakuda
    • Hideki TanakaTsuyoshi Wakuda
    • H01J37/04
    • H01J37/04H01J37/09H01J37/14H01J37/16H01J2237/0264
    • Provided is an electron microscope capable of enhancing a magnetic shield function even though the structure thereof has an objective tens that projects into a sample chamber space. The electron microscope includes: an objective lens (6) which focuses an electron beam to irradiate a sample (4) with; a sample chamber (5) which forms a sample space to contain the sample (4); a sample chamber magnetic shield (7) provided inside the sample chamber (5); and an objective lens magnetic shield (8) of a tubular shape which surrounds the periphery of the objective lens (6). A first and a second hole, which face to each other in a traveling direction of the electron beam, are provided in an upper plate (10) serving as an upper wall of the sample chamber (5) and in an upper shield (9) of the sample chamber magnetic shield (7). The objective lens (6) is held inside the first hole provided in the upper plate (10). A lower end of the objective lens (6) is disposed at a position lower than a lower end of the upper plate (10), and at a position of the second hole provided in the upper shield (9) or at a position near this position. The objective lens magnetic shield (8) is positioned inside the first hole, and a lower end thereof is connected to the upper shield (9).
    • 提供一种能够增强磁屏蔽功能的电子显微镜,即使其结构具有突出到样品室空间中的目标数十。 电子显微镜包括:聚焦电子束以照射样品(4)的物镜(6); 样品室(5),其形成容纳样品(4)的样品空间; 设置在所述样品室(5)内的样品室磁屏蔽(7); 以及围绕物镜(6)的周边的管状的物镜磁屏蔽(8)。 在电子束的行进方向上彼此面对的第一和第二孔设置在用作样品室(5)的上壁的上板(10)中并在上屏蔽(9)中, 的样品室磁屏蔽(7)。 物镜(6)保持在设置在上板(10)中的第一孔内。 物镜(6)的下端设置在比上板(10)的下端更低的位置,并且在设置在上罩(9)中的第二孔的位置或靠近该上罩 位置。 物镜磁屏蔽(8)位于第一孔内,其下端连接到上屏蔽(9)。