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    • 3. 发明授权
    • Particle analyzer
    • 粒子分析仪
    • US5506673A
    • 1996-04-09
    • US332040
    • 1994-11-01
    • Tokihiro KosakaKaoru Takarada
    • Tokihiro KosakaKaoru Takarada
    • G01N15/10G01N15/12G01N15/14
    • G01N15/14G01N15/12G01N15/1012G01N2015/1037
    • A particle analyzer includes a flow cell for enclosing an electrolyte flow containing particles in a sheathed flow, the flow cell including a first and second cells which are interconnected through an orifice, the sheathed flow flowing through the orifice from the first cell to the second cell, a first and second electrodes provided in the first and second cells, respectively and a voltage application device for applying voltage between the first and second electrodes. The particle analyzer further includes a resistance detection device for detecting a variation of electric resistance between the first and second electrodes when the particle passes through the orifice to output the detected variation as a resistance detection signal. A first diameter calculation device is included for calculating each diameter of the particles based on the detected variation of electric resistance. Further a light source device for emitting a light beam to the particles enclosed in the sheathed flow and a light detection device for detecting each intensity of scatter light of the particles irradiated with the light beam to output the detected intensity as a scatter light detection signal are included. Finally, the particle analyzer includes a refractive index calculation device for calculating a refractive index of the particle based on the resistance detection signal and the scatter light detection signal and a second diameter calculation device for calculating each diameter of the particles based on the calculated refractive index and the scatter light detection signal.
    • 颗粒分析仪包括用于封闭在护套流中含有颗粒的电解质流的流动池,所述流动池包括通过孔相互连接的第一和第二电池,所述护套流动通过所述孔从所述第一电池流到所述第二电池 分别设置在第一和第二单元中的第一和第二电极以及用于在第一和第二电极之间施加电压的电压施加装置。 粒子分析仪还包括电阻检测装置,用于当粒子通过孔口时检测第一和第二电极之间的电阻变化,以输出检测到的变化作为电阻检测信号。 包括第一直径计算装置,用于基于检测到的电阻变化来计算颗粒的每个直径。 另外,用于将光束发射到封装在护套流中的颗粒的光源装置和用于检测被光束照射的颗粒的散射光的每个强度的光检测装置,以输出检测的强度作为散射光检测信号, 包括。 最后,粒子分析仪包括用于基于电阻检测信号和散射光检测信号计算粒子的折射率的折射率计算装置和用于基于计算出的折射率计算颗粒的每个直径的第二直径计算装置 和散射光检测信号。
    • 4. 发明授权
    • Particle analyzing apparatus and method wherein an optical deflector
optically tracks a particle
    • 粒子分析装置和方法,其中光学偏转器光学跟踪颗粒
    • US5448349A
    • 1995-09-05
    • US139159
    • 1993-10-21
    • Tokihiro Kosaka
    • Tokihiro Kosaka
    • G01N15/14G01N21/00G01N33/49
    • G01N15/1459G01N15/1463
    • A particle image analyzing apparatus including, a flow cell for enclosing a solution containing a particle to be analyzed in a sheathed flow to form the solution into a sample solution flow, an irradiation optical system for emitting light to irradiate the sample solution flow, a one dimension image sensor for receiving the light transmitted through the particle to scan the particle and output an image signal, an optical deflection device, including a variable deflection angle, for deflecting the emitted light introduced into the sample solution flow, a controller for controlling the deflection angle of the optical deflection device to permit the emitted light to optically track and irradiate the particle, and a signal processor for processing the output image signal of the image sensor to analyze the particle.
    • 一种颗粒图像分析装置,包括:流过池,用于将包含要被分析的颗粒的溶液封装在套管中以形成溶液流入样品溶液流;照射光学系统,用于发射光以照射样品溶液流; 尺寸图像传感器,用于接收透射通过粒子的光以扫描粒子并输出图像信号,包括可变偏转角的光学偏转装置,用于偏转引入样品溶液流的发射光;控制器,用于控制偏转 光学偏转装置的角度,以允许发射的光线光学跟踪和照射颗粒;以及信号处理器,用于处理图像传感器的输出图像信号以分析颗粒。