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1. 发明授权

US07076761B2 Method for creating charged-particle-beam exposure data, method for manufacturing semiconductor device, and program 失效
标题翻译：用于产生带电粒子束曝光数据的方法，用于制造半导体器件的方法和程序
公开(公告)号：US07076761B2
公开(公告)日：2006-07-11
申请号：US10642680
申请日：2003-08-19
申请人： Ryouichi Inanami , Atsushi Ando , Kazuhiro Nakai , Yoshikazu Ichioka
发明人： Ryouichi Inanami , Atsushi Ando , Kazuhiro Nakai , Yoshikazu Ichioka
IPC分类号： G06F17/50
CPC分类号： B82Y10/00 , B82Y40/00 , G03F1/20 , H01J37/3174
摘要： A method for creating charged-particle-beam exposure data containing a description of an exposure sequence of character patterns to perform exposure of a charged-particle-beam according to a character projection technique, comprising selecting first or second values as a parameter to transfer one character pattern and then transferring a subsequent character pattern, the first value regarding performance of a shaping deflector which deflects the charged particle beam so that the charged particle beam is applied to an arbitrarily character aperture formed in a CP aperture mask and a character beam having the shape of the character aperture is thereby created, and the second value regarding performance of an objective deflector which deflects the character beam so that the character beam is applied to an arbitrarily position of the deflection region of the specimen, and determining the exposure sequence of the character patterns in the deflection region in accordance with the selected parameter.
摘要翻译：一种用于产生包含字符图案的曝光序列的描述的带电粒子束曝光数据的方法，用于根据字符投影技术执行带电粒子束的曝光，包括选择第一或第二值作为参数以传送一个字符图案，然后传送后续字符图案，关于使带电粒子束偏转的成形偏转器的性能的第一值，使得带电粒子束被施加到形成在CP孔径掩模中的任意字符孔径和具有由此产生字符孔径的形状，以及关于使字符光束偏转的目标偏转器的性能的第二值，使得字符光束被施加到样本的偏转区域的任意位置，并且确定根据所选择的偏转区域中的字符图案直径

2. 发明授权

US5373377A Liquid crystal device with shorting ring and transistors for electrostatic discharge protection 失效
标题翻译：带短路环的液晶装置和用于静电放电保护的晶体管
公开(公告)号：US5373377A
公开(公告)日：1994-12-13
申请号：US14162
申请日：1993-02-05
申请人： Meiko Ogawa , Kouhei Suzuki , Hiroaki Kitahara , Shinichi Kimura , Yoshikazu Ichioka
发明人： Meiko Ogawa , Kouhei Suzuki , Hiroaki Kitahara , Shinichi Kimura , Yoshikazu Ichioka
IPC分类号： G02F1/1335 , G02F1/1362 , G02F1/343
CPC分类号： G02F1/136204 , G02F1/133512
摘要： An active matrix type liquid crystal display device with a short-circuiting wire for mutually short-circuiting address wires and data wires through the medium of resistors made of a thin-film transistor is formed along the periphery of a display region on an insulating substrate. The short-circuiting wire is electrically connected inside a region in which the resistors made of a thin-film transistor are formed. In one embodiment, the transistors are surrounded by a portion of the shod circuiting wire. In another embodiment, they are partially surrounded by the wire with a gate electrode which is not protruding out. In another embodiment they are formed with two source and drain regions, one which has a lower breakdown voltage than the other.
摘要翻译：在绝缘基板上的显示区域的周围形成有通过薄膜晶体管制成的电阻体的介质，通过短路线将地址线与数据线相互短路的有源矩阵型液晶显示装置。短路线电连接在形成由薄膜晶体管构成的电阻器的区域内。在一个实施例中，晶体管被一部分短路电线围绕。在另一个实施例中，它们被不被突出的栅极电极部分地围绕。在另一个实施例中，它们形成有两个源极和漏极区域，一个具有比另一个更低的击穿电压。

3. 发明授权

US5524989A Print element assignment in printing apparatus 失效
标题翻译：打印设备中的打印元素分配
公开(公告)号：US5524989A
公开(公告)日：1996-06-11
申请号：US219426
申请日：1994-03-28
申请人： Yoshikazu Ichioka , Hirobumi Katoh , Hiroshi Ohmichi
发明人： Yoshikazu Ichioka , Hirobumi Katoh , Hiroshi Ohmichi
IPC分类号： B41J2/51 , B41J2/255 , B41J2/30
CPC分类号： B41J2/255 , B41J2/30
摘要： The invention relates to a printing apparatus in which at least two printing elements are arranged a predetermined distance apart in a line parallel to the print direction. When two dots to be printed are the same predetermined distance apart as the print elements, only one of those print elements is used to print those dots.
摘要翻译：本发明涉及一种打印设备，其中至少两个打印元件以平行于打印方向的直线布置成预定距离。当要打印的两个点与打印元件隔开相同的预定距离时，仅使用这些打印元素中的一个来打印这些点。

4. 发明授权

US5546013A Array tester for determining contact quality and line integrity in a TFT/LCD 失效
标题翻译：用于确定TFT / LCD中的接触质量和线路完整性的阵列测试仪
公开(公告)号：US5546013A
公开(公告)日：1996-08-13
申请号：US26897
申请日：1993-03-05
申请人： Yoshikazu Ichioka , Leslie C. Jenkins , Shinichi Kimura , Robert J. Polastre , Ronald R. Troutman , Robert L. Wisnieff
发明人： Yoshikazu Ichioka , Leslie C. Jenkins , Shinichi Kimura , Robert J. Polastre , Ronald R. Troutman , Robert L. Wisnieff
IPC分类号： G01R31/02 , G02F1/13 , G02F1/136 , G02F1/1362 , G02F1/1368 , G09G3/00 , G06F7/02
CPC分类号： G09G3/006 , G02F2001/136254
摘要： An apparatus for testing for and classifying defects in a TFT/LCD array having gate lines and data lines. Devices are provided for activating cells of the array by applying gate pulses to the gate lines and pulses to the data lines. Devices are also provided for acquiring waveforms from data lines of the array. Additional devices sample the waveforms at selected points in time. A computer may be used to classify the waveforms to indicate whether defects are present and if present, the nature of the defects by comparing voltages of the waveform at the selected points in time.
摘要翻译：一种用于测试和分类具有栅极线和数据线的TFT / LCD阵列中的缺陷的装置。提供了用于通过向栅极线施加栅极脉冲并将脉冲施加到数据线来激活阵列的单元的装置。还提供了用于从阵列的数据线获取波形的装置。附加设备在选定的时间点对波形进行采样。可以使用计算机对波形进行分类，以指示是否存在缺陷，如果存在缺陷，则通过比较所选择的时间点上的波形的电压来确定缺陷的性质。

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