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    • 6. 发明授权
    • Systems and methods for sense FET calibration
    • 用于感测FET校准的系统和方法
    • US07116113B1
    • 2006-10-03
    • US11122464
    • 2005-05-04
    • Brett J. ThompsenJohn H. Carpenter, Jr.Amer H. Atrash
    • Brett J. ThompsenJohn H. Carpenter, Jr.Amer H. Atrash
    • G01R35/00
    • G01R35/005G01R15/146
    • Systems, methods and circuits for sense circuit calibration. In one particular case, a system is provided that includes a sense circuit, a calibration circuit, and a sample and hold circuit. The sense circuit provides a sense current that is derived from either a reference current or a load current depending upon the operational state. The calibration circuit includes a calibration amplifier electrically coupled to the reference current and to the sense current. The calibration amplifier outputs a calibration signal representing a difference between the reference current and the sense current. The sample and hold circuit is operable to store a value representative of the calibration signal, and useful in forming a calibration offset current applied to the sense current.
    • 用于感测电路校准的系统,方法和电路。 在一个特定情况下,提供了包括感测电路,校准电路和采样和保持电路的系统。 感测电路提供根据操作状态从参考电流或负载电流导出的感测电流。 校准电路包括电耦合到参考电流和感测电流的校准放大器。 校准放大器输出表示参考电流和感测电流之间的差的校准信号。 采样和保持电路可操作以存储代表校准信号的值,并且可用于形成施加到感测电流的校准偏移电流。