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    • 2. 发明申请
    • SEMICONDUCTOR MANUFACTURE PERFORMANCE ANALYSIS
    • 半导体制造性能分析
    • US20090171606A1
    • 2009-07-02
    • US11968132
    • 2007-12-31
    • Takahiro MurataKedar DongreYiqing ZhouMark Armstrong
    • Takahiro MurataKedar DongreYiqing ZhouMark Armstrong
    • G06F19/00G01R31/26
    • G01R31/2894G01R31/2601G05B2219/31318G05B2219/37224H01L22/14
    • A software architecture, design and implementation that enables efficient transistor performance analysis across multiple levels of parameter granularity with interactive drill-down, drill-across capability, for use during semiconductor technology development. The software may include several features, such as highly modular, robust architecture to enable analysis across the multiple granularity of transistor performance data, i.e., per die, material group, and aggregate, GUI-based template configuration to specify the analysis across the multiple levels in a uniform set of operations, subsystems to execute the template specified with the GUI, integration of pass-fail analysis analytics, interactive drill-down on particular data points of user interest in automatically generated charts, and drill-across capability allowing linking of data points highlighted on a single chart to those that are correlated in all other charts. Other embodiments are described.
    • 一种软件架构,设计和实现,可通过交互式深入钻取功能实现多级参数粒度的高效晶体管性能分析,以便在半导体技术开发过程中使用。 该软件可以包括几个特征,例如高度模块化,稳健的架构,以实现跨晶体管性能数据的多个粒度分析,即每个芯片,材料组和聚合,基于GUI的模板配置,以指定跨多层次的分析 在统一的操作集合中,执行使用GUI指定的模板的子系统,整合失败分析分析,对用户对自动生成的图表感兴趣的特定数据点的交互式深度挖掘以及允许连接数据的钻取功能 在单个图表上突出显示的点与在所有其他图表中相关的点。 描述其他实施例。
    • 3. 发明授权
    • Transistor performance analysis system
    • 晶体管性能分析系统
    • US07062410B2
    • 2006-06-13
    • US10874395
    • 2004-06-23
    • Charles H. WinsteadYiqing ZhouCarrie Auyeung
    • Charles H. WinsteadYiqing ZhouCarrie Auyeung
    • G06F11/30G06F17/50
    • G01R31/2837G01R31/2601
    • A system for conducting transistor performance analysis is disclosed, in which automatic graph plotting is interactively enhanced with human judgment. The system includes executing transistor performance analysis software, which receives templates specifying parameters, graph charting options, and algorithms, as well as a database of transistor values, as its inputs. The software produces an output document with linked graphs and a summary report. The software extracts, filters and applies statistical regression to large quantities of data. The software also applies statistical filtering to the data and automatically plots hundreds of charts and graphs based on the data. Graphs are color-coded to highlight relationships that suffer from unusually high noise in the data. Users can manually adjust lines on the graphs, which are automatically reflected in dependent graphs and the summary report. Changes to program methodology can be achieved by changing the template rather than by modifying the software.
    • 公开了一种用于进行晶体管性能分析的系统,其中通过人的判断来交互地增强自动图形绘图。 该系统包括执行晶体管性能分析软件,其接收指定参数的模板,图表图表选项和算法,以及晶体管值的数据库作为其输入。 该软件生成带有链接图形和汇总报告的输出文档。 该软件提取,过滤和应用统计回归大量的数据。 该软件还对数据应用统计过滤,并根据数据自动绘制数百个图表。 图形进行了颜色编码,以突出显示数据中异常高噪声的关系。 用户可以手动调整图形上的线,这些线自动反映在从属图形和摘要报告中。 可以通过更改模板而不是修改软件来实现对程序方法的更改。
    • 4. 发明授权
    • System and method for time synchronization of OFDM-based communications
    • 基于OFDM的通信时间同步的系统和方法
    • US08451957B2
    • 2013-05-28
    • US12421536
    • 2009-04-09
    • Pan ZhengangTao LiYiqing ZhouMan Wai Kwan
    • Pan ZhengangTao LiYiqing ZhouMan Wai Kwan
    • H04L27/06
    • H04L27/2671H04L27/2663H04L27/2678H04L27/2688
    • Systems and methods for time synchronization of orthogonal frequency-division multiplexing (OFDM)-based communications are disclosed. A cyclic prefix (CP) correlation-based timing synchronization method is disclosed for early path (e.g. first-received path) detection for OFDM-based communication. Systems and methods are disclosed for performing double peak value detection in an OFDM-based system for reliably detecting an early (e.g., first-received) path in a received OFDM symbol for use in timing synchronization. In the double peak value detection method, a first peak value detection is performed to detect the path with the largest power, and a second peak value detection is then performed to detect a desired early (e.g., first-received) path. A compensation linear curve is used to facilitate the second peak value detection.
    • 公开了用于基于正交频分复用(OFDM)的通信的时间同步的系统和方法。 针对基于OFDM的通信的早期路径(例如,第一接收路径)检测公开了一种基于循环前缀(CP)相关的定时同步方法。 公开了用于在基于OFDM的系统中执行双峰值检测的系统和方法,用于可靠地检测用于定时同步的接收的OFDM符号中的早期(例如,第一接收)路径。 在双峰值检测方法中,执行第一峰值检测以检测具有最大功率的路径,然后执行第二峰值检测以检测期望的早(例如,第一接收)路径。 使用补偿线性曲线来促进第二峰值检测。
    • 6. 发明申请
    • Transistor performance analysis system
    • 晶体管性能分析系统
    • US20050288899A1
    • 2005-12-29
    • US10874395
    • 2004-06-23
    • Charles WinsteadYiqing ZhouCarrie Auyeung
    • Charles WinsteadYiqing ZhouCarrie Auyeung
    • G06F11/30
    • G01R31/2837G01R31/2601
    • A system for conducting transistor performance analysis is disclosed, in which automatic graph plotting is interactively enhanced with human judgment. The system includes executing transistor performance analysis software, which receives templates specifying parameters, graph charting options, and algorithms, as well as a database of transistor values, as its inputs. The software produces an output document with linked graphs and a summary report. The software extracts, filters and applies statistical regression to large quantities of data. The software also applies statistical filtering to the data and automatically plots hundreds of charts and graphs based on the data. Graphs are color-coded to highlight relationships that suffer from unusually high noise in the data. Users can manually adjust lines on the graphs, which are automatically reflected in dependent graphs and the summary report. Changes to program methodology can be achieved by changing the template rather than by modifying the software.
    • 公开了一种用于进行晶体管性能分析的系统,其中通过人的判断来交互地增强自动图形绘图。 该系统包括执行晶体管性能分析软件,其接收指定参数的模板,图表图表选项和算法,以及晶体管值的数据库作为其输入。 该软件生成带有链接图形和汇总报告的输出文档。 该软件提取,过滤和应用统计回归大量的数据。 该软件还对数据应用统计过滤,并根据数据自动绘制数百个图表。 图形进行了颜色编码,以突出显示数据中异常高噪声的关系。 用户可以手动调整图形上的线,这些线自动反映在从属图形和摘要报告中。 可以通过更改模板而不是修改软件来实现对程序方法的更改。