专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

US20050288899A1 Transistor performance analysis system 失效
标题翻译：晶体管性能分析系统
公开(公告)号：US20050288899A1
公开(公告)日：2005-12-29
申请号：US10874395
申请日：2004-06-23
申请人： Charles Winstead , Yiqing Zhou , Carrie Auyeung
发明人： Charles Winstead , Yiqing Zhou , Carrie Auyeung
IPC分类号： G06F11/30
CPC分类号： G01R31/2837 , G01R31/2601
摘要： A system for conducting transistor performance analysis is disclosed, in which automatic graph plotting is interactively enhanced with human judgment. The system includes executing transistor performance analysis software, which receives templates specifying parameters, graph charting options, and algorithms, as well as a database of transistor values, as its inputs. The software produces an output document with linked graphs and a summary report. The software extracts, filters and applies statistical regression to large quantities of data. The software also applies statistical filtering to the data and automatically plots hundreds of charts and graphs based on the data. Graphs are color-coded to highlight relationships that suffer from unusually high noise in the data. Users can manually adjust lines on the graphs, which are automatically reflected in dependent graphs and the summary report. Changes to program methodology can be achieved by changing the template rather than by modifying the software.
摘要翻译：公开了一种用于进行晶体管性能分析的系统，其中通过人的判断来交互地增强自动图形绘图。该系统包括执行晶体管性能分析软件，其接收指定参数的模板，图表图表选项和算法，以及晶体管值的数据库作为其输入。该软件生成带有链接图形和汇总报告的输出文档。该软件提取，过滤和应用统计回归大量的数据。该软件还对数据应用统计过滤，并根据数据自动绘制数百个图表。图形进行了颜色编码，以突出显示数据中异常高噪声的关系。用户可以手动调整图形上的线，这些线自动反映在从属图形和摘要报告中。可以通过更改模板而不是修改软件来实现对程序方法的更改。

2. 发明授权

US07062410B2 Transistor performance analysis system 失效
标题翻译：晶体管性能分析系统
公开(公告)号：US07062410B2
公开(公告)日：2006-06-13
申请号：US10874395
申请日：2004-06-23
申请人： Charles H. Winstead , Yiqing Zhou , Carrie Auyeung
发明人： Charles H. Winstead , Yiqing Zhou , Carrie Auyeung
IPC分类号： G06F11/30 , G06F17/50
CPC分类号： G01R31/2837 , G01R31/2601
摘要： A system for conducting transistor performance analysis is disclosed, in which automatic graph plotting is interactively enhanced with human judgment. The system includes executing transistor performance analysis software, which receives templates specifying parameters, graph charting options, and algorithms, as well as a database of transistor values, as its inputs. The software produces an output document with linked graphs and a summary report. The software extracts, filters and applies statistical regression to large quantities of data. The software also applies statistical filtering to the data and automatically plots hundreds of charts and graphs based on the data. Graphs are color-coded to highlight relationships that suffer from unusually high noise in the data. Users can manually adjust lines on the graphs, which are automatically reflected in dependent graphs and the summary report. Changes to program methodology can be achieved by changing the template rather than by modifying the software.
摘要翻译：公开了一种用于进行晶体管性能分析的系统，其中通过人的判断来交互地增强自动图形绘图。该系统包括执行晶体管性能分析软件，其接收指定参数的模板，图表图表选项和算法，以及晶体管值的数据库作为其输入。该软件生成带有链接图形和汇总报告的输出文档。该软件提取，过滤和应用统计回归大量的数据。该软件还对数据应用统计过滤，并根据数据自动绘制数百个图表。图形进行了颜色编码，以突出显示数据中异常高噪声的关系。用户可以手动调整图形上的线，这些线自动反映在从属图形和摘要报告中。可以通过更改模板而不是修改软件来实现对程序方法的更改。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式