会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 9. 发明授权
    • Bolometer having absorber with pillar structure for thermal shorting
    • 热分解器具有用于热短路的柱结构的吸收器
    • US09130081B2
    • 2015-09-08
    • US14109936
    • 2013-12-17
    • Robert Bosch GmbH
    • Gary YamaFabian PurklAndo Lars Feyh
    • G01J5/20H01L31/0248H01L31/18G01J5/02H01L31/09
    • H01L31/0248G01J5/024G01J5/0245G01J5/20H01L31/09H01L31/18
    • A semiconductor device includes a substrate having an electrode structure. An absorber structure is suspended over the electrode structure and spaced a first distance apart from the first electrode structure. The absorber structure includes i) suspension structures extending upwardly from the substrate and being electrically connected to readout conductors, and ii) a pillar structure extending downwardly from the absorber structure toward the first electrode structure. The pillar structure has a contact portion located a second distance apart from the first electrode structure, the second distance being less than the first distance. The absorber structure is configured to flex toward the substrate under a test condition. The second distance is selected such that the contact portion of the pillar structure is positioned in contact with the first electrode structure when the absorber structure is flexed in response to the test condition.
    • 半导体器件包括具有电极结构的衬底。 吸收体结构悬挂在电极结构上并与第一电极结构隔开第一距离。 所述吸收体结构包括:i)从所述衬底向上延伸并与读出导体电连接的悬挂结构,以及ii)从所述吸收体结构朝向所述第一电极结构向下延伸的柱结构。 柱结构具有位于距离第一电极结构第二距离的接触部分,第二距离小于第一距离。 吸收体结构被配置成在测试条件下朝向衬底弯曲。 选择第二距离,使得当吸收体结构根据测试条件弯曲时,柱结构的接触部分定位成与第一电极结构接触。