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    • 8. 发明申请
    • NAND FLASH MEMORY DEVICE WITH ECC PROTECTED RESERVED AREA FOR NON-VOLATILE STORAGE OF REDUNDANCY DATA
    • 具有ECC保护区域的NAND闪存存储器件,用于非易失存储冗余数据
    • US20080065937A1
    • 2008-03-13
    • US11854685
    • 2007-09-13
    • Rino MicheloniRoberto RavasioAlessia Marelli
    • Rino MicheloniRoberto RavasioAlessia Marelli
    • G11C29/04
    • G11C29/82G06F11/1068G11C29/24G11C2029/0411
    • Basic redundancy information is non-volatily stored in a reserved area of an addressable area of a memory array, and is copied to volatile storage therein at every power-on of the memory device. The unpredictable though statistically inevitable presence of failed array elements in such a reserved area of the memory array corrupts the basic redundancy information established during the test-on wafer (EWS) phase of the fabrication process. This increases the number of rejects, and lowers the yield of the fabrication process. This problem is addressed by writing the basic redundancy data in the reserved area of the array with an ECC technique using a certain error correction code. The error correction code may be chosen among majority codes 3, 5, 7, 15 and the like, or the Hamming code for 1, 2, 3 or more errors, as a function of the fail probability of a memory cell as determined by the EWS phase during fabrication.
    • 基本冗余信息被非挥发地存储在存储器阵列的可寻址区域的保留区域中,并且在存储器件的每次上电时复制到其中的易失性存储器。 在存储器阵列的这种保留区域中,不可预测的,不可避免的存在故障阵列元件会破坏在制造过程的测试晶片(EWS)阶段期间建立的基本冗余信息。 这增加了废品的数量,降低了制造工艺的产量。 通过使用特定的纠错码通过ECC技术将阵列的保留区域中的基本冗余数据写入该问题来解决该问题。 可以在多数代码3,5,7,15等之中选择纠错码,或者对于1,2,3或更多个错误,可以选择Hamming代码作为存储器单元的故障概率的函数,如由 EWS相制造期间。