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    • 3. 发明申请
    • Magnetic memory device
    • 磁存储器件
    • US20070258281A1
    • 2007-11-08
    • US11606187
    • 2006-11-30
    • Kenchi ItoHiromasa TakahashiTakayuki KawaharaRiichiro Takemura
    • Kenchi ItoHiromasa TakahashiTakayuki KawaharaRiichiro Takemura
    • G11C11/02
    • G11C11/15
    • A magnetic memory device comprises a magnetic tunnel junction (MTJ) having a ferromagnetic free layer, and exhibits a first, relatively high resistance state, and a second, relatively low resistance state. To write to the magnetic memory device a current IMTJ is driven through the MTJ. For a first duration, the current is equal to a DC threshold current, being the DC current required to switch the multilayer structure between the first state and the second state. This induces a C-like domain structure in the free layer. For a second duration, the current IMTJ is larger than the DC threshold current. This causes the MTJ to switch states. The current requited to cause switching is less than that required using a uniform current pulse.
    • 磁存储器件包括具有铁磁性自由层的磁性隧道结(MTJ),并且呈现出第一相对高电阻状态和第二较低电阻状态。 为了写入磁存储器件,通过MTJ驱动电流I MTJ 。 对于第一持续时间,电流等于DC阈值电流,即在第一状态和第二状态之间切换多层结构所需的DC电流。 这在自由层中引起C样结构域结构。 在第二持续时间内,当前的电流电流大于直流阈值电流。 这导致MTJ切换状态。 导致切换的电流小于使用均匀电流脉冲所需的电流。
    • 8. 发明授权
    • Magnetic memory device
    • 磁存储器件
    • US07443718B2
    • 2008-10-28
    • US11606187
    • 2006-11-30
    • Kenchi ItoHiromasa TakahashiTakayuki KawaharaRiichiro Takemura
    • Kenchi ItoHiromasa TakahashiTakayuki KawaharaRiichiro Takemura
    • G11C11/00
    • G11C11/15
    • A magnetic memory device comprises a magnetic tunnel junction (MTJ) having a ferromagnetic free layer, and exhibits a first, relatively high resistance state, and a second, relatively low resistance state. To write to the magnetic memory device a current IMTJ is driven through the MTJ. For a first duration, the current is equal to a DC threshold current, being the DC current required to switch the multilayer structure between the first state and the second state. This induces a C-like domain structure in the free layer. For a second duration, the current IMTJ is larger than the DC threshold current. This causes the MTJ to switch states. The current requited to cause switching is less than that required using a uniform current pulse.
    • 磁存储器件包括具有铁磁性自由层的磁性隧道结(MTJ),并且呈现出第一相对高电阻状态和第二较低电阻状态。 为了写入磁存储器件,通过MTJ驱动电流I MTJ 。 对于第一持续时间,电流等于DC阈值电流,即在第一状态和第二状态之间切换多层结构所需的DC电流。 这在自由层中引起C样结构域结构。 在第二持续时间内,当前的电流电流大于直流阈值电流。 这导致MTJ切换状态。 导致切换的电流小于使用均匀电流脉冲所需的电流。