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1. 发明申请

US20210166829A1 AIRTIGHT BOX FOR MEASUREMENT, AIRTIGHT APPARATUS, MEASUREMENT SYSTEM AND MEASUREMENT APPARATUS 有权
公开(公告)号：US20210166829A1
公开(公告)日：2021-06-03
申请号：US16950081
申请日：2020-11-17
申请人： RIGAKU CORPORATION
发明人： Koichiro Ito , Tetsuya Ozawa , Takeshi Ozawa
IPC分类号： G21F7/053 , G21F7/047
摘要： An airtight apparatus in which an airtight box (30) for measurement is combined with a glove box (20) is provided. The airtight box (30) for measurement includes a hollow housing (31), and a sample stage (34) having a sample loading portion. The sample stage (34) is transported by a transport stage (35) installed in the housing (31). The housing (31) is provided with a measurement window (40) for measuring a sample loaded on the sample stage (34) from the outside by a measurement apparatus (10).

2. 发明授权

US09618461B2 X-ray analysis apparatus 有权
公开(公告)号：US09618461B2
公开(公告)日：2017-04-11
申请号：US14050676
申请日：2013-10-10
申请人： Rigaku Corporation
发明人： Takao Ohara , Kenji Wakasaya , Tetsuya Ozawa , Kunio Nishi
IPC分类号： G01N23/20 , G01T7/00
CPC分类号： G01N23/20008 , G01N2223/30 , G01N2223/308 , G01T7/00
摘要： An X-ray analysis apparatus for detecting, using an X-ray detector, X-rays given off by a sample when the sample is irradiated with X-rays, the X-ray analysis apparatus having replaceable components. The X-ray analysis apparatus comprises labels attached to the replaceable components and including symbols indicating the types of replaceable components, a camera for photographing the replaceable components and the labels, and CPU and image recognition software for specifying the types of replaceable components by calculation based on the symbols in the labels.

3. 发明授权

US11942231B2 Airtight box for measurement, airtight apparatus, measurement system and measurement apparatus 有权
公开(公告)号：US11942231B2
公开(公告)日：2024-03-26
申请号：US16950081
申请日：2020-11-17
申请人： RIGAKU CORPORATION
发明人： Koichiro Ito , Tetsuya Ozawa , Takeshi Ozawa
IPC分类号： G21F7/04 , G01N23/20016 , G01N23/20025 , G21F7/047 , G01N35/00
CPC分类号： G21F7/04 , G21F7/047 , G01N23/20016 , G01N23/20025 , G01N35/00 , G01N2035/00277
摘要： An airtight apparatus in which an airtight box (30) for measurement is combined with a glove box (20) is provided. The airtight box (30) for measurement includes a hollow housing (31), and a sample stage (34) having a sample loading portion. The sample stage (34) is transported by a transport stage (35) installed in the housing (31). The housing (31) is provided with a measurement window (40) for measuring a sample loaded on the sample stage (34) from the outside by a measurement apparatus (10).

4. 发明申请

US20180052121A1 X-RAY DIFFRACTION APPARATUS 审中-公开
公开(公告)号：US20180052121A1
公开(公告)日：2018-02-22
申请号：US15668746
申请日：2017-08-04
申请人： Rigaku Corporation
发明人： Takeshi Osakabe , Tetsuya Ozawa
IPC分类号： G01N23/20 , G01N23/201 , G01N23/207
CPC分类号： G01N23/20075 , G01N23/04 , G01N23/20008 , G01N23/20025 , G01N23/201 , G01N23/207 , G01N2223/33
摘要： An X-ray diffraction apparatus including an X-ray detector that is configured to detect diffracted X-rays diffracted from a sample when a surface of the sample is irradiated with X-rays, a counter arm which rotates around a rotation center axis set within the surface of the sample while the X-ray detector is installed on the counter arm, and a plate-like X-ray shielding member that is installed on the counter arm and rotated together with the X-ray detector.

5. 发明授权

US10900913B2 X-ray diffraction apparatus 有权
$X-ray diffraction apparatus$
公开(公告)号：US10900913B2
公开(公告)日：2021-01-26
申请号：US15668746
申请日：2017-08-04
申请人： Rigaku Corporation
发明人： Takeshi Osakabe , Tetsuya Ozawa
IPC分类号： G01N23/20 , G01N23/04 , G01N23/20008 , G01N23/20025 , G01N23/201 , G01N23/207
摘要： An X-ray diffraction apparatus including an X-ray detector that is configured to detect diffracted X-rays diffracted from a sample when a surface of the sample is irradiated with X-rays, a counter arm which rotates around a rotation center axis set within the surface of the sample while the X-ray detector is installed on the counter arm, and a plate-like X-ray shielding member that is installed on the counter arm and rotated together with the X-ray detector.

6. 发明申请

US20190272929A1 X-RAY GENERATOR AND X-RAY ANALYSIS DEVICE 审中-公开
公开(公告)号：US20190272929A1
公开(公告)日：2019-09-05
申请号：US16284777
申请日：2019-02-25
申请人： Rigaku Corporation
发明人： Kazuhiko Omote , Takeshi Osakabe , Tetsuya Ozawa , Licai Jiang , Boris Verman
IPC分类号： G21K1/06 , G21K1/02 , G01N23/201
摘要： An X-ray generator includes: a line X-ray source; a multilayer film mirror; and a side-by-side reflecting mirror including two concave mirrors joined together so as to share a join line. A cross section of a reflecting surface of the multilayer film mirror has a parabolic shape, and a focus of the parabolic shape is located at the line X-ray source. Cross sections of reflecting surfaces of the two concave mirrors of the side-by-side reflecting mirror each have a parabolic shape, and each of focuses of the parabolic shapes is located on a side opposite to the multilayer film mirror. An extended line of the join line of the side-by-side reflecting mirror passes through the multilayer film mirror and the line X-ray source as viewed in a plan view.

7. 发明授权

US11215571B2 X-ray analysis apparatus 有权
公开(公告)号：US11215571B2
公开(公告)日：2022-01-04
申请号：US16823929
申请日：2020-03-19
申请人： Rigaku Corporation
发明人： Takeshi Osakabe , Tetsuya Ozawa , Kazuki Omoto
IPC分类号： G01N23/20016 , G01N23/20025 , G01N23/207 , G01N23/20008 , G21K1/04 , G21K1/06
摘要： Provided is an X-ray analysis apparatus including: a goniometer including an incident-side arm extending in a first direction, a fixing portion, and a receiving-side arm; an X-ray source portion, which is arranged on the incident-side arm and generates an X-ray source extending in a second direction, which crosses the first direction; a support base, which is arranged on the fixing portion, and is configured to support a sample; a parallel slit, which is arranged on the fixing portion, and is configured to limit a line width along the second direction of the X-ray source generated by the X-ray source portion; and a detector, which is arranged on the receiving-side arm, and is configured to detect a scattered X-ray generated by the sample.

8. 发明授权

US10436723B2 X-ray diffractometer with multilayer reflection-type monochromator 有权
$X-ray diffractometer with multilayer reflection-type monochromator$
公开(公告)号：US10436723B2
公开(公告)日：2019-10-08
申请号：US15312881
申请日：2015-01-14
申请人： RIGAKU CORPORATION
发明人： Takeshi Osakabe , Tetsuya Ozawa , Kazuhiko Omote , Licai Jiang , Boris Verman , Yuriy Platonov
IPC分类号： G01N23/20008 , G21K1/04 , G21K1/06 , G02B7/00 , G02B27/42 , G02B27/09 , G01N23/207
摘要： Only X-rays having a specific wavelength, selected from a group of focusing X-rays diffracted from a sample, are reflected from a monochromator based on a Bragg's condition, passed through a receiving slit and detected by an X-ray detector. The monochromator is configured to be freely removable, and arranged between the sample and a focal point at which the wavelength-selected focusing X-rays diffracted from the sample are directly focused. At this time, the monochromator is moved so as to position the monochromator as close to the focal point as possible. The monochromator comprises a multilayer mirror having an internal interplanar spacing, wherein said internal interplanar spacing varies continuously from one end of the monochromator to the other end.

9. 发明授权

US09490038B2 X-ray optical component device and X-ray analyzer 有权
标题翻译： X射线光学元件及X射线分析仪
公开(公告)号：US09490038B2
公开(公告)日：2016-11-08
申请号：US14381267
申请日：2013-12-12
申请人： RIGAKU CORPORATION
发明人： Kenji Wakasaya , Tetsuya Ozawa
IPC分类号： G21K1/06 , G21K1/00 , G01N23/083
CPC分类号： G21K1/00 , G01N23/083 , G21K1/06
摘要： An X-ray optical component device having an X-ray optical component unit, a motor controller, and a connector. The connector has motor pins and motor terminals electrically connected to a motor when engaged with each other, and a signal pin and signal terminal for sensing detachment of the connector, the signal pin and signal terminal being capable of engaging with each other. A pin-side connector and a terminal-side connector are detachable. When the pin-side connector is detached from the terminal-side connector, the time that the signal pin is removed from the signal terminal is earlier than the time that the motor pins are removed from the motor terminals. During replacement of an X-ray optical component unit equipped with a motor for adjusting the position of an X-ray optical component, unwanted movement of the position of the X-ray optical component provided in the unit is prevented.
摘要翻译：一种具有X射线光学部件单元，马达控制器和连接器的X射线光学部件装置。连接器具有电动机引脚和电动机端子，它们彼此接合时电连接到电动机，以及信号引脚和信号端子，用于感测连接器的脱离，信号引脚和信号端子能够彼此接合。引脚侧连接器和端子侧连接器是可拆卸的。当端子侧连接器从端子侧连接器拆下时，从信号端子移除信号引脚的时间要早于电机端子从电机端子移除的时间。在更换配备有用于调整X射线光学部件的位置的电动机的X射线光学部件单元时，防止了设置在该单元中的X射线光学部件的位置的不期望的移动。

10. 发明授权

US10854348B2 X-ray generator and x-ray analysis device 有权
公开(公告)号：US10854348B2
公开(公告)日：2020-12-01
申请号：US16284777
申请日：2019-02-25
申请人： Rigaku Corporation
发明人： Kazuhiko Omote , Takeshi Osakabe , Tetsuya Ozawa , Licai Jiang , Boris Verman
IPC分类号： G21K1/00 , G21K1/06 , G01N23/201 , G21K1/02 , H05G1/02
摘要： An X-ray generator includes: a line X-ray source; a multilayer film mirror; and a side-by-side reflecting mirror including two concave mirrors joined together so as to share a join line. A cross section of a reflecting surface of the multilayer film mirror has a parabolic shape, and a focus of the parabolic shape is located at the line X-ray source. Cross sections of reflecting surfaces of the two concave mirrors of the side-by-side reflecting mirror each have a parabolic shape, and each of focuses of the parabolic shapes is located on a side opposite to the multilayer film mirror. An extended line of the join line of the side-by-side reflecting mirror passes through the multilayer film mirror and the line X-ray source as viewed in a plan view.

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