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    • 1. 发明授权
    • X-ray analysis apparatus
    • X射线分析仪
    • US5406608A
    • 1995-04-11
    • US150440
    • 1993-11-10
    • Ravisekhar YellepeddiAlexandre BapstPierre-Yves Negro
    • Ravisekhar YellepeddiAlexandre BapstPierre-Yves Negro
    • G01N23/207G01N23/22G01N23/223
    • G01N23/2206G01N2223/056G01N2223/076G01N2223/1016
    • A device for performing both elemental and structural analysis of a crystalline sample, comprising a polychromatic x-ray source (11); a mounting means (15) for mounting the sample so that it is illuminated with x-rays; one or more fluorescence channels (17), able to select x-rays of a particular wavelength and energy and having means (20) for detecting said selected x-ray; a diffraction channel (28) able to select a characteristic x-ray wavelength at said source (11) following diffraction of the x-rays by said sample (14) and having means (33) for detecting a selected characteristic x-ray; and an actuating means (32) for controlling arcuate movement of said diffraction channel (28) relative to said sample (14) so as to detect x-rays leaving the sample at different diffraction angles.
    • 一种用于执行结晶样品的元素和结构分析的装置,包括多色x射线源(11); 用于安装样品以使其被x射线照射的安装装置(15); 一个或多个荧光通道(17),其能够选择特定波长和能量的x射线,并具有用于检测所述选择的X射线的装置(20); 衍射通道(28),其能够在由所述样品(14)的X射线衍射之后选择所述源极(11)处的特征X射线波长,并且具有用于检测所选择的特征x射线的装置(33); 以及用于控制所述衍射通道(28)相对于所述样品(14)的弓形运动的致动装置(32),以便检测离开所述样品的不同衍射角的x射线。