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    • 2. 发明授权
    • Non-volatile memory with improved sensing and method therefor
    • 具有改进感测的非易失性存储器及其方法
    • US06282120B1
    • 2001-08-28
    • US09536930
    • 2000-03-27
    • Raul-Adrian CerneaRushyah TangDouglas LeeChi-Ming WangDaniel Guterman
    • Raul-Adrian CerneaRushyah TangDouglas LeeChi-Ming WangDaniel Guterman
    • G11C1606
    • G11C11/5642G11C7/06G11C8/04G11C11/5621G11C16/28G11C16/32G11C19/00G11C2211/5644G11C2211/5645
    • Floating gate memories such as EEPROM and flash EEPROM have the memory state of a memory cell thereof determined by sensing the conduction current of the cell Inherent noise fluctuations in the conduction current during sensing are canceled out by averaging the sensing over a predetermined period of time. In one embodiment, as an integral part of the averaging process, the averaged conduction current is obtained directly as a digital memory state. Accuracy in sensing is therefore greatly improved by avoiding sensing noise with the current and avoiding having to resolve its memory state in the analog domain by comparison with another noisy reference current. In another embodiment, conventional sensing techniques are improved when sensing is made by comparison with a reference current by means of a symmetric, switched or non-switched capacitor differential amplifier. The improved sensing accuracy allows higher resolution of conduction states, thereby allowing a cell to store substantially more than one bit of information.
    • 诸如EEPROM和闪存EEPROM的浮动存储器存储器通过感测单元的传导电流来确定其存储单元的存储状态。通过在预定时间段内平均感测来抵消感测期间传导电流的固有噪声波动。 在一个实施例中,作为平均处理的组成部分,平均的导通电流被直接获得作为数字存储器状态。 因此,通过避免使用电流感测噪声并避免必须通过与其他噪声参考电流进行比较来解决模拟域中的存储状态,从而大大提高了感测精度。 在另一个实施例中,当通过对称,开关或非开关电容器差分放大器与参考电流进行比较来进行感测时,常规感测技术得到改进。 改进的感测精度允许更高的导通状态分辨率,从而允许单元存储大致多于一位的信息。
    • 6. 发明申请
    • Method of Reducing Disturbs in Non-Volatile Memory
    • 减少非易失性存储器中的干扰的方法
    • US20070076510A1
    • 2007-04-05
    • US11538521
    • 2006-10-04
    • John ManganDaniel GutermanGeorge SamachisaBrian MurphyChi-Ming WangKhandker Quader
    • John ManganDaniel GutermanGeorge SamachisaBrian MurphyChi-Ming WangKhandker Quader
    • G11C8/00
    • G11C7/12G11C16/12G11C16/3427G11C29/02G11C29/021G11C29/028G11C29/50012G11C2029/1204
    • In a non-volatile memory, the displacement current generated in non-selected word lines that results when the voltage levels on an array's bit lines are changed can result in disturbs. Techniques for reducing these currents are presented. In a first aspect, the number of cells being simultaneously programmed on a word line is reduced. In a non-volatile memory where an array of memory cells is composed of a number of units, and the units are combined into planes that share common word lines, the simultaneous programming of units within the same plane is avoided. Multiple units may be programmed in parallel, but these are arranged to be in separate planes. This is done by selecting the number of units to be programmed in parallel and their order such that all the units programmed together are from distinct planes, by comparing the units to be programmed to see if any are from the same plane, or a combination of these. In a second, complementary aspect, the rate at which the voltage levels on the bit lines are changed is adjustable. By monitoring the frequency of disturbs, or based upon the device's application, the rate at which the bit line drivers change the bit line voltage can be adjusted. This can be implemented by setting the rate externally, or by the controller based upon device performance and the amount of data error being generated.
    • 在非易失性存储器中,在阵列位线上的电压电平改变时产生的未选择字线中产生的位移电流可能导致干扰。 提出了减少这些电流的技术。 在第一方面,减少了在字线上同时编程的单元的数量。 在非易失性存储器中,存储器单元阵列由多个单元组成,并且单元被组合成共享公共字线的平面,避免同一平面内的单元的同时编程。 多个单元可以并行编程,但是它们被布置成处于分开的平面中。 这是通过选择并行编程的单元数量及其顺序,使得所有编程在一起的单元都来自不同的平面,通过比较要编程的单元以查看是否来自同一平面,或者组合 这些。 在第二个互补方面,位线上的电压电平改变的速率是可调节的。 通过监视干扰的频率,或者基于设备的应用,可以调整位线驱动器改变位线电压的速率。 这可以通过外部设置速率或由控制器基于设备性能和产生的数据错误量来实现。
    • 9. 发明申请
    • Alternate row-based reading and writing for non-volatile memory
    • 用于非易失性存储器的替代行读和写
    • US20070153583A1
    • 2007-07-05
    • US11321259
    • 2005-12-29
    • Daniel Guterman
    • Daniel Guterman
    • G11C11/34
    • G11C16/3418G11C16/3427
    • A set of storage elements is programmed beginning with a word line WLn adjacent a select gate line for the set. After programming the first word line, the next word line WLn+1 adjacent to the first word line is skipped and the next word line WLn+2 adjacent to WLn+1 is programmed. WLn+1 is then programmed. Programming continues according to the sequence {WLn+4, WLn+3, WLn+6, WLn+5, . . . } until all but the last word line for the set have been programmed. The last word line is then programmed. By programming in this manner, some of the word lines of the set (WLn+1, WLn+3, etc.) have no subsequently programmed neighboring word lines. The memory cells of these word lines will not experience any floating gate to floating gate coupling threshold voltage shift impact due to subsequently programmed neighboring memory cells. The word lines having no subsequently programmed neighbors are read without using offsets or compensations based on neighboring memory cells. The other word lines are read using compensations based on data states within both subsequently programmed neighboring word lines.
    • 一组存储元件从与集合的选择栅极线相邻的字线WLn开始被编程。 在对第一字线进行编程之后,跳过与第一字线相邻的下一个字线WLn + 1,并对与WLn + 1相邻的下一个字线WLn + 2进行编程。 然后编程WLn + 1。 根据序列{WLn + 4,WLn + 3,WLn + 6,WLn + 5,..., 。 。 }直到所有集合的最后一个字线都被编程为止。 然后编程最后一个字线。 通过以这种方式进行编程,组(WLn + 1,WLn + 3等)的一些字线没有随后编程的相邻字线。 这些字线的存储单元将不会经历由于随后编程的相邻存储单元而产生的任何漂浮栅极与浮栅耦合阈值电压偏移的影响。 在不使用基于相邻存储器单元的偏移或补偿的情况下读取没有随后编程的邻居的字线。 使用基于随后编程的相邻字线内的数据状态的补偿来读取其他字线。